Related papers: Calibrated Microwave Reflectance in Low-Temperatur…
The characteristic frequencies of a system provide important information on the phenomena that govern its physical properties. In this framework, there has recently been renewed interest in cryogenic microwave characterization for condensed…
We present the technical details of a broadband microwave spectrometer for measuring the complex conductance of thin films covering the range from 50 MHz up to 16 GHz in the temperature range 300 mK to 6 K and at applied magnetic fields up…
We present a high-resolution microwave spectrometer to measure the frequency-dependent complex conductivity of a superconducting thin film near the critical temperature. The instrument is based on a broadband measurement of the complex…
Reflection measurements give access to the complex impedance of a material on a wide frequency range. This is of interest to study the dynamical properties of various materials, for instance disordered superconductors. However reflection…
We introduce an improved microwave calibration method for use in a cryogenic environment, based on a traditional three-standard calibration, the Thru-Reflect-Line (TRL) calibration. The modified calibration method takes advantage of…
We present a design for a tunneling-current-assisted scanning near-field microwave microscope. For stable operation at cryogenic temperatures, making a small and rigid microwave probe is important. Our coaxial resonator probe has a length…
Superconducting circuit testing and materials loss characterization requires robust and reliable methods for the extraction of internal and coupling quality factors of microwave resonators. A common method, imposed by limitations on the…
Microwave impedance microscopy (MIM) is a near-field imaging technique that has been used to visualize the local conductivity of materials with nanoscale resolution across the GHz regime. In recent years, MIM has shown great promise for the…
We present a detailed modeling and characterization of our scalable microwave nanoprobe, which is a micro-fabricated cantilever-based scanning microwave probe with separated excitation and sensing electrodes. Using finite-element analysis,…
A localized and strong RF magnetic field, created by a magnetic write head, is used to examine the linear electrodynamic properties of a Nb superconducting film. The complex reflection coefficient of the write head held in close proximity…
A method is proposed and experimentally explored for in-situ calibration of complex transmission data for superconducting microwave resonators. This cryogenic calibration method accounts for the instrumental transmission response between…
We report a new technique of scanning capacitance microscopy at microwave frequencies. A near field scanning microwave microscope probe is kept at a constant height of about 1nm above the samplewith the help of Scanning Tunneling Microscope…
This paper presents a polarization calibration method applied to a microwave polarimeter demonstrator based on a near-infrared (NIR) frequency up-conversion stage that allows both optical correlation and signal detection at a wavelength of…
This paper presents a new technique for evaluating the consistency of the reference impedance in multiline thru-reflect-line (TRL) calibration. During the calibration process, it is assumed that all transmission line standards have the same…
This work builds on the previous introduction [1] of a coupled experimental-computational system devised to fully characterize the thermal behavior of complex 3D submicron electronic devices. The new system replaces the laser-based surface…
Quantum state tomography of weak microwave signals is an important part of many protocols in the field of quantum information processing with superconducting circuits. This step typically relies on an accurate $\textit{in-situ}$ estimation…
We present a simple home made solution enabling in-situ RF reflectometry measurements with a millikelvin scanning tunneling microscope (mk-STM). The additions described below were made using RF best practices following similar detection…
Measurement of low power infrared light emission spectra from microstructures can be challenging, but is of key importance in several research fields. Fourier transform infrared spectrometers (FTIR) can be used for characterizing such weak…
We report the instrumentation and experimental results of a cryogenic scanning microwave impedance microscope. The microwave probe and the scanning stage are located inside the variable temperature insert of a helium cryostat. Microwave…
Microwave band on-chip microcoils are developed for the application to single electron spin resonance measurement with a single quantum dot. Basic properties such as characteristic impedance and electromagnetic field distribution are…