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Defects in crystalline materials control the properties of materials, and their characterization focuses our strategies to optimize performance. Electron microscopy has served as the backbone of our understanding of defect structure and…
We present an experimental approach for cryogenic dielectric measurements on ultra-thin insulating films. Based on a coplanar microwave waveguide design we implement superconducting quarter-wave resonators with inductive coupling, which…
Thin films being a universal functional material have attracted much interest in academic and industrial applications, such as flexible electronics, soft robotics, and micro-nano devices. With thin films becoming micro/nanoscale, developing…
We propose a new concept for the design of high-efficiency photocells based on ultra-thin (submicron) semiconductor films of controlled thickness. Using a microscopic model of a thin dielectric layer interacting with incident…
A simple method was developed to observe the interference patterns of the light reflected by the interfaces of thin liquid films. Employing a fluorescent microscope with epi-illumination, we collected the 2D patterns of interference fringes…
It has been a general trend to develop low-voltage electron microscopes due to their high imaging contrast of the sample and low radiation damage. Atom-resolved transmission electron microscopes with voltages as low as 15-40 kV have been…
Silicon-based dielectric is crucial for many superconducting devices, including high-frequency transmission lines, filters, and resonators. Defects and contaminants in the amorphous dielectric and at the interfaces between the dielectric…
X-ray absorption spectroscopy of thin films is central to a broad range of scientific fields, and is typically detected using indirect techniques. X-ray excited optical luminescence (XEOL) from the sample's substrate is one such detection…
Photographic emulsion is a particle tracking device which features the best spatial resolution among particle detectors. For certain applications, for example muon radiography, large-scale detectors are required. Therefore, a huge surface…
Fast, non-destructive and on-site quality control tools, mainly high sensitive imaging techniques, are important to assess the reliability of photovoltaic plants. To minimize the risk of further damages and electrical yield losses,…
We consider a series of image segmentation methods based on the deep neural networks in order to perform semantic segmentation of electroluminescence (EL) images of thin-film modules. We utilize the encoder-decoder deep neural network…
Electroluminescence (EL) imaging is a useful modality for the inspection of photovoltaic (PV) modules. EL images provide high spatial resolution, which makes it possible to detect even finest defects on the surface of PV modules. However,…
Results obtained with a new very compact detector for imaging with a matrix of Leak Microstructures (LM)are reported. Spatial linearity and spatial resolution obtained by scanning as well as the detection of alpha particles with 100%…
Thin Film technology has widespread applications in everyday electronics, notably Liquid Crystal Display screens, solar cells, and organic light emitting diodes. We explore the potential of this technology as charged particle radiation…
Silicon tracking detectors have grown to cover larger surface areas up to hundreds of square meters, and are even taking over other sub-detectors, such as calorimeters. However, further improvements in tracking detector performance are more…
This work focuses on the development and demonstration of tunable superconducting on-chip resonator, leveraging the intrinsic current-dependent non-linear kinetic inductance of superconducting aluminium, and investigating the effect of…
Efficient quality control is inevitable in the manufacturing of light-emitting diodes (LEDs). Because defective LED chips may be traced back to different causes, a time and cost-intensive electrical and optical contact measurement is…
A growing need exists for efficient and accurate methods for detecting defects in semiconductor materials and devices. These defects can have a detrimental impact on the efficiency of the manufacturing process, because they cause critical…
We have developed scanning near-field microwave microscopes which can image electrodynamic properties of superconducting materials on length scales down to about 2 $\mu$m. The microscopes are capable of quantitative imaging of sheet…
The sensitivity of thin-film materials and devices to defects motivates extensive research into the optimization of film morphology. This research could be accelerated by automated experiments that characterize the response of film…