Related papers: Automatic and quantitative measurement of spectrom…
We theoretically propose a new method in cavity- and surface-enhanced Raman spectroscopy (SERS) with improved temporal resolution in the measurement of stochastic Raman spectral fluctuations. Our approach combines Fourier spectroscopy and…
The concept of compressive sensing was recently proposed to significantly reduce the electron dose in scanning transmission electron microscopy (STEM) while still maintaining the main features in the image. Here, an experimental setup based…
A few approximate schemes to solve the Hedin equations self-consistently introduced in (Phys. Rev. B 94, 155101 (2016)) are explored and tested for the 3D electron gas at metallic densities. We calculate one electron spectra, dielectric…
When light is passed through aberrated optical systems, the resulting degradation in amplitude and phase has deleterious effects, for example, on resolution in imaging, spot sizes in focussing, and the beam quality factor of the output…
We introduce an approach for performing spectrally resolved electron microscopy without the need for an electron spectrometer. The method involves an electron beam prepared as a coherent superposition of multiple paths, one of which passes…
Electron-beam propagation experiments have been used to determine the energy and angle dependence of electron-electron (ee) scattering a two-dimensional electron gas (2DEG) in a very direct manner by a new spectroscopy method. The…
A new material characterization technique is emerging for the transmission electron microscope (TEM). Using electron energy-loss spectroscopy, real space mappings of the underlying electronic transitions in the sample, so called orbital…
Scanning transmission electron microscopy (STEM) has been extensively used for imaging complex materials down to atomic resolution. The most commonly employed STEM modality, annular dark-field imaging, produces easily-interpretable…
One of the problems of producing spectrographs for Extremely Large Telescopes (ELTs) is that the beam size is required to scale with telescope aperture if all other parameters are held constant, leading to enormous size and implied cost.…
Electron energy loss spectra have been measured on hexagonal boron nitride single crystals employing a novel electron energy loss spectroscopic set-up composed by an electron microscope equipped with a monochromator and an in-column filter.…
Scanning transmission electron microscopy (STEM) has a broad range of applications in materials characterization, including real-space imaging, spectroscopy, and diffraction, at length scales from the micron to sub-{\AA}ngstr\"om. The…
Recent advances in wireless body area sensor net- works leverage wireless and mobile communication technologies to facilitate development of innovative medical applications that can significantly enhance healthcare services and improve…
We introduce a new image contrast mechanism for scanning transmission electron microscopy (STEM) that derives from the local symmetry within the specimen. For a given position of the electron probe on the specimen, the image intensity is…
Exploiting the information provided by electron energy-loss spectroscopy (EELS) requires reliable access to the low-loss region where the zero-loss peak (ZLP) often overwhelms the contributions associated to inelastic scatterings off the…
We report the first experimental demonstration of an electrostatic electron orbital angular momentum (OAM) sorter, which can be used to analyze the OAM states of electrons in a transmission electron microscope. We verify the sorter…
The determination of the neutrino mass is an open issue in modern particle physics and astrophysics. The direct mass measurement is the only theory-unrelated experimental tool capable to probe such quantity. The HOLMES experiment aims to…
Electron beam energies in Transmission Electron Microscopes (TEMs) reach the relativistic realm constituting Quantum Electrodynamics (QED) the appropriate framework for the study of electron matter interaction in TEMs. We focus on the…
Quantitative analysis methods based on the usage of a scanning electron microscope (SEM), such as energy dispersive x-ray spectroscopy, often require specimens to have a flat surface oriented normal to the electron beam. In-situ procedures…
Point-spread function of the probe forming optics ($PSF_{optics} $) is reported for the first time in an uncorrected (without multipole correctors) scanning electron microscope (SEM). In an SEM, the electron probe information is lost as the…
Combined frequency-resolved techniques are suitable to study electrochromic (EC) materials. We present an experimental setup for simultaneous electrochemical and color impedance studies of EC systems in transmission mode and estimate its…