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4D-STEM, in which the 2D diffraction plane is captured for each 2D scan position in the scanning transmission electron microscope (STEM) using a pixelated detector, is complementing and increasingly replacing existing imaging approaches.…

Instrumentation and Detectors · Physics 2022-07-27 Colum M. O'Leary , Benedikt Haas , Christoph T. Koch , Peter D. Nellist , Lewys Jones

The development of four-dimensional (4D) scanning transmission electron microscopy (STEM) using fast detectors has opened-up new avenues for addressing some of long-standing challenges in electron imaging. One of these challenges is how to…

Materials Science · Physics 2021-01-19 Yu-Tsun Shao , Renliang Yuan , Haw-Wen Hsiao , Qun Yang , Yang Hu , Jian-Min Zuo

Thresholds for beam damage have been assessed for La$_{0.7}$Sr$_{0.3}$MnO$_3$ and SrTiO$_3$ as a function of electron probe current and exposure time at 80 and 200 kV acceleration voltage. The materials were exposed to an intense electron…

Materials Science · Physics 2016-08-30 Magnus Nord , Per Erik Vullum , Ingrid Hallsteinsen , Thomas Tybell , Randi Holmestad

Despite the widespread use of Scanning Transmission Electron Microscopy (STEM) for observing the structure of materials at the atomic scale, a detailed understanding of some relevant electron beam damage mechanisms is limited. Recent…

Aberration corrected scanning transmission electron microscopes (STEM) enable to determine local strain fields, composition and bonding states at atomic resolution. The precision to locate atomic columns is often obstructed by scan…

Applied Physics · Physics 2019-01-16 Benjamin Berkels , Christian H. Liebscher

Significant progress has been made in spatial resolution using environmental transmission electron microscopes (ETEM), which now enables atomic resolution visualization of structural transformation under variable temperature and gas…

Materials Science · Physics 2015-06-18 Wenpei Gao , Jianbo Wu , Xiaofeng Zhang , Aram Yoon , J. Mabon , W. Swiech , W. L. Wilson , H. Yang , Jian-Min Zuo

In TEM, a typical goal consists of making a small electron probe in the sample plane in order to obtain high spatial resolution in scanning transmission electron microscopy. In order to do so, the phase of the electron wave is corrected to…

Understanding light-matter interactions using localized surface plasmons (LSPs) is of fundamental interest in classical and quantum plasmonics and has a wide range of applications. In order to understand the spatial properties of LSPs,…

Mesoscale and Nanoscale Physics · Physics 2016-03-22 Rong-Chun Ge , Stephen Hughes

Four-dimensional scanning transmission electron microscopy (4D-STEM) of local atomic diffraction patterns is emerging as a powerful technique for probing intricate details of atomic structure and atomic electric fields. However, efficient…

Image and Video Processing · Electrical Eng. & Systems 2019-01-15 Xin Li , Ondrej E. Dyck , Mark P. Oxley , Andrew R. Lupini , Leland McInnes , John Healy , Stephen Jesse , Sergei V. Kalinin

We measure the energy distribution of electrons passing through a two-dimensional electron gas using a scanning probe microscope. We present direct spatial images of coherent electron wave flow from a quantum point contact formed in a…

Mesoscale and Nanoscale Physics · Physics 2015-06-24 B. J. LeRoy , A. C. Bleszynski , M. A. Topinka , R. M. Westervelt , S. E. J. Shaw , E. J. Heller , K. D. Maranowski , A. C. Gossard

Accurate quantification of the energy distribution of backscattered electrons (BSEs) contributing to electron backscatter diffraction (EBSD) patterns remains as an active challenge. This study introduces an energy-resolved EBSD methodology…

The appearance of direct electron detectors marked a new era for electron diffraction. Their high sensitivity and low noise opens the possibility to extend electron diffraction from transmission electron microscopes (TEM) to lower energies…

Applied Physics · Physics 2025-02-18 Nikita Denisov , Andrey Orekhov , Johan Verbeeck

The capability of the adaptive optics to correct for the segmentation error is analyzed in terms of the residual wavefront RMS and the power spectral density of the phase. The analytical model and the end-to-end simulation give…

Astrophysics · Physics 2009-11-11 Natalia Yaitskova , Christophe Verinaud

Modulated electroreflectance spectroscopy $\Delta R/R$ of semiconductor self-assembled quantum dots is investigated. The structure is modeled as dots with lens shape geometry and circular cross section. A microscopic description of the…

Materials Science · Physics 2016-08-16 A. H. Rodríguez , C. Trallero-Giner , Martín Muñoz , María C. Tamargo

We study quantum phase sensing with an asymmetric two-mode entangled coherent state (ECS) in which the two local amplitudes have different values. We find the phenomenon of the asymmetry-enhanced phase sensing which the asymmetry can…

Quantum Physics · Physics 2023-05-26 Xiao-Tong Chen , Wang-Jun Lu , Yunlan Zuo , Rui Zhang , Ya-Feng Jiao , Le-Man Kuang

This paper describes the advantages and challenges of applying microelectromechanical accelerometer systems (MEMS accelerometers) in order to attain precise, accurate and stateless positioning of telescope mounts. This provides a completely…

Instrumentation and Methods for Astrophysics · Physics 2015-06-22 László Mészáros , Attila Jaskó , András Pál , Gergely Csépány

The recent demonstration of electron vortex beams has opened up the new possibility of studying orbital angular momentum (OAM) in the interaction between electron beams and matter. To this aim, methods to analyze the OAM of an electron beam…

Optics · Physics 2014-02-18 Giulio Guzzinati , Laura Clark , Armand Béché , Jo Verbeeck

Spatial confinement of matter in functional nanostructures has propelled these systems to the forefront of nanoscience, both as a playground for exotic physics and quantum phenomena and in multiple applications including plasmonics,…

Monochromators are an essential component in electron microscopy and spectroscopy for enhancing the spatial and energy resolution. However, its adoption in scanning electron microscopes remains limited because of its high cost and…

Instrumentation and Detectors · Physics 2025-10-27 M. J. Adriaans , J. P. Hoogenboom , A. Mohammadi-Gheidari

Electrical impedance tomography (EIT) uses current-voltage measurements on the surface of an imaging subject to detect conductivity changes or anomalies. EIT is a promising new technique with great potential in medical imaging and…

Numerical Analysis · Mathematics 2018-11-19 Bastian Harrach , Marcel Ullrich