Related papers: Switchable-magnetisation planar probe MFM sensor
Magnetic force microscopy (MFM) allows detection of stray magnetic fields around magnetic materials and the two-dimensional visualization of these fields. This paper presents a theoretical analysis of the oscillations of an MFM tip above a…
Planar scanning probe microscopy is a recently emerging alternative approach to tip-based scanning probe imaging. It can scan an extended planar sensor, such as a polished bulk diamond doped with magnetic-field-sensitive nitrogen-vacancy…
Scanning probe microscopy (SPM) is traditionally based on very sharp tips, where the small size of the apex is critical for resolution. This paradigm is about to shift, since a novel generation of planar probes (color centers in diamond,…
Spin-polarized scanning tunneling microscopy (SP-STM) measures tunnel magnetoresistance (TMR) with atomic resolution. While various methods for achieving SP probes have been developed, each is limited with respect to fabrication,…
The separation of physical forces acting on the tip of a magnetic force microscope (MFM) is essential for correct magnetic imaging. Electrostatic forces can be modulated by varying the tip-sample potential and minimized to map the local…
The rapid development of nanoscience and nanotechnology in the last two decades was stimulated by the emergence of scanning probe microscopy (SPM) techniques capable of accessing local material properties, including transport, mechanical,…
Since the invention of the atomic force microscope (AFM) in 1986, there has been a drive to apply this scanning probe technique or a form of this technique to various disciplines in nanoscale science. Magnetic force microscopy (MFM) is a…
A scanning tunneling microscope (STM) with a magnetic tip that has a sufficiently strong spin-polarization can be used to map the sample's spin structure down to the atomic scale but usually lacks the possibility to absolutely determine the…
A local magnetization measurement was performed with a Magnetic Force Microscope (MFM) to determine magnetization in domains of an exchange coupled [Co/Pt]/Co/Ru multilayer with predominant perpendicular anisotropy. The quantitative MFM…
In this work, we explored theoretically the spatial resolution of magnetic solitons and the variations of their sizes when subjected to a Magnetic Force Microscopy (MFM) measurement. Next to tip-sample separation, we considered reversal in…
We present a new approach to tuning fork-based atomic force microscopy for utilizing advanced "tip-on-chip" probes with high sensitivity and broad compatibility. Usually, such chip-like probes with a size reaching 2 mm x 2 mm drastically…
We have developed the experimental approach to characterize spatial distribution of the magnetic field produced by cantilever tips used in magnetic resonance force microscopy (MRFM). We performed MRFM measurements on a well characterized…
A recent advance in improving the spatial resolution of magnetic force microscopy (MFM) uses as sensor tips carbon nanotubes grown at the apex of conventional silicon cantilever pyramids and coated with a thin ferromagnetic layer. Magnetic…
We present Magnetic Resonance Force Microscopy (MRFM) measurements of Ferromagnetic Resonance (FMR) in a 50 nm thick permalloy film, tilted with respect to the direction of the external magnetic field. At small probe-sample distances the…
Approaching a two-component tip made of a superconductor (S) and a ferromagnet (F) from a magnetic sample allows for two distinct tunneling processes between the ferromagnets, through S: i) Charge and spin are conserved; ii) Charge and spin…
In the present work, we report on the in situ magnetic force microscopy (MFM) study of the magnetization reversal in two-dimensional arrays of ferromagnetic Ni80Fe20 and Co55Fe45 nanowires(NW) with different diameters (40, 50, 70 and 100…
We present a comprehensive method for visualisation and quantification of the magnetic stray field of magnetic force microscopy (MFM) probes, applied to the particular case of custom-made multi-layered probes with controllable high/low…
Tip functionalization in AFM allows imaging organic nano-structures with sub-molecular resolution. Here, recent progress by using atomically defined copper-oxide tips is discussed. With their outstanding rigidity and elemental selectivity…
Domain wall probes (DW-probes) were custom-made by modifying standard commercial magnetic force microscopy (MFM) probes using focused ion beam lithography. Excess of magnetic coating from the probes was milled out, leaving a V-shaped…
Magnetic force microscopy (MFM) is long established as a powerful tool for probing the local manifestation of magnetic nanostructures across a range of temperatures and applied stimuli. A major drawback of the technique, however, is that…