Spin-polarized scanning tunneling microscopy (SP-STM) measures tunnel magnetoresistance (TMR) with atomic resolution. While various methods for achieving SP probes have been developed, each is limited with respect to fabrication, performance, and allowed operating conditions. In this study, we present the fabrication and use of SP-STM tips made from commercially available antiferromagnetic Mn88Ni12 foil. The tips are intrinsically SP, which is attractive for exploring magnetic phenomena in the zero field limit. The tip material is relatively ductile and straightforward to etch. We benchmark the conventional STM and spectroscopic performance of our tips and demonstrate their spin sensitivity by measuring the two-state switching of holmium single atom magnets on MgO/Ag(100).
@article{arxiv.1807.00364,
title = {Antiferromagnetic MnNi tips for spin-polarized scanning probe microscopy},
author = {P. R. Forrester and T. Bilgeri and F. Patthey and H. Brune and F. D. Natterer},
journal= {arXiv preprint arXiv:1807.00364},
year = {2019}
}