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The contemporary superconductive electronics is widely using planar circuits with micrometer-scale elements for a variety of applications. With the rise of complexity of a circuit and increased number of its components, a simple impedance…
We present a new method of DEEM, the direct energy encircling method, for characterising the performance of fibres in most astronomical spectroscopic applications. It's a versatile platform to measure focal ratio degradation (FRD),…
Quantum computing is a new technology that is expected to revolutionize the computation paradigm in the next few years. Qubits exploit the quantum physics proprieties to increase the parallelism and speed of computation. Unfortunately,…
Quantum technologies based on quantum point defects in crystals require control over the defect charge state. Here we tune the charge state of shallow nitrogen-vacancy and silicon-vacancy centers by locally oxidizing a hydrogenated surface…
Complete theoretical understanding of the most complex superconductors requires a detailed knowledge of the symmetry of the superconducting energy-gap $\Delta_\mathbf{k}^\alpha$, for all momenta $\mathbf{k}$ on the Fermi surface of every…
We introduce a multi-modal, multi-level quantum complex exponential least squares (MM-QCELS) method to simultaneously estimate multiple eigenvalues of a quantum Hamiltonian on early fault-tolerant quantum computers. Our theoretical analysis…
Dynamical decoupling techniques are widely used to characterize and control the environments of solid-state quantum defects, enabling solid-state quantum memories and nanoscale quantum sensors. However, resolution is often limited by the…
The development of quantum computers and quantum simulators promises to provide solutions to problems, which can currently not be solved on classical computers. Finding the best physical implementation for such technologies is an important…
Today, interest in automotive applications notably Hybrid Electric Vehicles (HEV) has risen due to environmental concerns and the modern society's energetic dependence. Consequently, it is necessary to study and implement in these vehicle…
Quantum error mitigation (QEM) for dynamic circuits, i.e., those incorporating mid-circuit measurements and feedforward, is important for two key reasons. First, quantum error correction (QEC) circuits are instances of dynamic circuits, and…
We present a two-level decomposition strategy to enhance the quality and performance of Quantum Hadamard Edge Detection (QHED) for practical image analysis on Noisy Intermediate-Scale Quantum (NISQ) devices. A Data-Level Decomposition…
Fine-grained spectral properties of quantum Hamiltonians, including both eigenvalues and their multiplicities, provide useful information for characterizing many-body quantum systems as well as for understanding phenomena such as…
Quantum diamond magnetometers using lock-in detection have successfully detected weak bio-magnetic fields from neurons, a live mammalian muscle, and a live mouse heart. This opens up the possibility of quantum diamond magnetometers…
Dynamic quantum circuits with mid-circuit measurements (MCMs) and feed-forward operations play a crucial role in various applications, such as quantum error correction and quantum algorithms. With advancements in quantum hardware enabling…
A method of the mid-IR-laser microscopy has been proposed for the investigation of the large-scale electrically and recombination active defects in semiconductors and non-destructive inspection of semiconductor materials and structures in…
The nature of stacking faults - whether intrinsic or extrinsic - plays a pivotal role in defect-mediated processes in crystalline materials. Yet, current electron microscopy techniques for their reliable analysis remain limited to either…
In this paper, we describe the modification of Nanoscale Impedance Microscopy (NIM), namely, a combination of contact-mode atomic force microscopy with local impedance measurements. The postulated approach is based on the application of…
Fourier ptychographic microscopy (FPM) is a recently developed computational imaging technique for wide-field, high-resolution microscopy with a high space-bandwidth product. It integrates the concepts of synthetic aperture and phase…
Atomic force microscopy (AFM) is a well-known tool for studying surface roughness and to collect depth information about features on the top atomic layer of samples. By combining secondary ion mass spectroscopy (SIMS) with focused ion beam…
Controlling crystalline material defects is crucial, as they affect properties of the material that may be detrimental or beneficial for the final performance of a device. Defect analysis on the sub-nanometer scale is enabled by…