Related papers: High-Resolution Short-Circuit Fault Localization i…
Atomic-resolution imaging on molten metal/solid interfaces at temperatures above 200 {\deg}C was achieved using a high-temperature, high-speed atomic force microscope (AFM) equipped with a qPlus sensor. A tip-scanning high-speed Quadpod…
The lower critical magnetic field, $H_{c1}$, of superconductors is measured by using ensembles of NV-centers-in-diamond optical magnetometry. The technique is minimally invasive, and has sub-gauss field sensitivity and sub-$\mu$m spatial…
Accurate fault diagnosis and quantification are essential for the reliable operation and intelligent maintenance of photovoltaic (PV) arrays. However, existing fault quantification methods often suffer from limited efficiency and…
Modern bandgap engineered electronic devices are typically made of multi-semiconductor multi-layer heterostructures that pose a major challenge to silicon-era characterization methods. As a result, contemporary bandgap engineering relies…
The negatively-charged nitrogen-vacancy center (NV) in diamond forms a versatile system for quantum sensing applications. Combining the advantageous properties of this atomic-sized defect with scanning probe techniques such as atomic force…
Fault models are indispensable for many EDA tasks, so as for design and implementation of quantum hardware. In this article, we propose a fault model for superconducting quantum systems. Our fault model reflects the real fault behavior in…
Although RF fingerprinting is one of the most commonly used techniques for localization, deploying it in a ubiquitous manner requires addressing the challenge of supporting a large number of heterogeneous devices and their variations. We…
Wide field-of-view magnetic field microscopy has been realised by probing shifts in optically detected magnetic resonance (ODMR) spectrum of Nitrogen Vacancy (NV) defect centers in diamond. However, these widefield diamond NV magnetometers…
Quantum machine learning carries the promise to revolutionize information and communication technologies. While a number of quantum algorithms with potential exponential speedups have been proposed already, it is quite difficult to provide…
We present QFAST, a quantum synthesis tool designed to produce short circuits and to scale well in practice. Our contributions are: 1) a novel representation of circuits able to encode placement and topology; 2) a hierarchical approach with…
Detection of high impedance faults (HIF) has been one of the biggest challenges in the power distribution network. The low current magnitude and diverse characteristics of HIFs make them difficult to be detected by over-current relays.…
We develop a theoretical framework for probing superconductivity with momentum resolution using the quantum twisting microscope (QTM), a planar tunneling device where a graphene tip is rotated relative to a two-dimensional sample. Because…
Intensity correlation microscopy (ICM), which is prominently known through antibunching microscopy or super-resolution optical fluctuation imaging (SOFI), provides superresolution through a correlation analysis of antibunching of…
Circuit cutting is a promising technique that leverages both quantum and classical computational resources, enabling the practical execution of large quantum circuits on noisy intermediate-scale quantum (NISQ) hardware. Recent approaches…
In this paper, we introduce DFSSD, a novel logic locking solution for sequential and FSM circuits with a restricted (locked) access to the scan chain. DFSSD combines two techniques for obfuscation: (1) Deep Faults, and (2) Shallow State…
Early and accurately detecting faults in rotating machinery is crucial for operation safety of the modern manufacturing system. In this paper, we proposed a novel Deep fault diagnosis (DFD) method for rotating machinery with scarce labeled…
Quantum entanglement is a unique criterion of the quantum realm and an essential tool to secure quantum communication. Ensuring high-fidelity entanglement has always been a challenging task owing to interaction with the hostile channel…
Electron microscopy is widely used to explore defects in crystal structures, but human detecting of defects is often time-consuming, error-prone, and unreliable, and is not scalable to large numbers of images or real-time analysis. In this…
We show that a scanning capacitance microscope (SCM) can image buried delta-doped donor nanostructures fabricated in Si via a recently developed atomic-precision scanning tunneling microscopy (STM) lithography technique. A critical…
Far-field optical imaging inevitably involves low-pass spatial filtering, limiting the resolution. Moreover, conventional imaging suppresses high spatial frequency components close to the cutoff, making them invisible under noise,…