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Interplay of the angle dependent X-ray reflectivity and absorption with the photoelectron attenuation length in the photoelectron emission process determine the optimal X-ray incidence angle which maximizes the photoelectron signal.…
We apply tomography, a general method for reconstructing 3-D distributions from multiple projections, to reconstruct the momentum distribution of electrons produced via strong field photoionization. The projections are obtained by rotating…
Programmable electron-beam scanning offers new opportunities to improve dose efficiency and suppress scan-induced artifacts in scanning transmission electron microscopy. Here, we systematically benchmark the impact of non-raster…
The scanning electron microscope (SEM) delivers high resolution, high depth of focus and an image quality as if microscopic objects are seen by the naked eye. This makes it not only a powerful scientific instrument, but a tool inherently…
In photoelectron spectroscopy, the measured electron momentum range is intrinsically related to the excitation photon energy. Low photon energies $<10$ eV are commonly encountered in laser-based photoemission and lead to a momentum range…
Low-energy electron microscopy (LEEM) is a surface science method that works primarily in the UHV environment. It provides information complementary to the other established techniques: it extends the limited view of scanning probe…
Microscopy is one of the most essential imaging techniques in life sciences. High-quality images are required in order to solve (potentially life-saving) biomedical research problems. Many microscopy techniques do not achieve sufficient…
Polarized electron beams are now in routine use in particle accelerators for nuclear and high energy physics experiments. These beams are presently produced by dc-biased photoelectron sources combined with rf chopping and bunching systems…
Using a high energy electron beam for the imaging of high density matter with both high spatial-temporal and areal density resolution under extreme states of temperature and pressure is one of the critical challenges in high energy density…
Phase imaging in electron microscopy is sensitive to the local potential, including charge redistribution from bonding. We demonstrate that electron ptychography provides the necessary sensitivity to detect this subtle effect by directly…
We introduce a high energy resolution electron source that matches the requirements for parallel readout of energy and momentum of modern hemispherical electron energy analyzers. The system is designed as an add-on device to typical…
We propose angle-resolved photoelectron spectroscopy of aerosol particles as an alternative way to determine the electron mean free path of low energy electrons in solid and liquid materials. The mean free path is obtained from fits of…
Advanced technical solution for the design of a low perveance electron gun with a high quality beam dedicated to high power Ka-band klystrons is presented in this paper. The proposed electron gun can be used to feed linear accelerating…
Ptychography is a scanning coherent diffraction imaging technique successfully applied in the electron, visible and x-ray regimes. One of the distinct features of ptychography with respect to other coherent diffraction techniques is its…
In this work, a combination of cathode retraction and two-slit emittance measurement technique is proposed as an advanced means to individually modify emittance growth components, specifically, rf injector fringe fields, to isolate and…
Theory of electron emission by metallic photocathodes under the exposure of long wavelength lasers will be studied. Energy of photons in long wavelength lasers is less than the work function of the photocathode material, and can only emit…
High quality electron beams, with high spatial and tempo- ral resolution, have an important use in electron diffraction experiments to probe and study the constituents of matter. A cold electron source is being developed based on elec- tron…
A new tool providing material contrast control in scanning electron microscopy (SEM) is demonstrated. The approach is based on deep-UV illumination during SEM imaging and delivers a novel material based contrast as well as higher resolution…
Exquisite control of electron beam energy is required for many electron spectroscopy and imaging applications. For both continuous and pulsed beams, the beam energy spread is fundamentally limited by the electron source, and is typically a…
A common issue encountered in photoemission electron sources used in electron accelerators is the transverse inhomogeneity of the laser distribution resulting from the laser-amplification process and often use of frequency up conversion in…