Related papers: Simultaneous Bright- and Dark-Field X-ray Microsco…
This paper presents the first time implementation of the eXtended Finite Element Method (XFEM) in the general purpose commercial software COMSOL Multiphysics. An enrichment strategy is proposed, consistent with the structure of the…
X-ray photoelectron diffraction (XPD) has developed into a powerful technique for the structural analysis of solids. Extension of the technique into the hard-X-ray range (hXPD) gives access to true bulk information. Here we give a status…
Single-particle imaging experiments of biomolecules at x-ray free-electron lasers (XFELs) require processing of hundreds of thousands (or more) of images that contain very few x-rays. Each low-flux image of the diffraction pattern is…
Energy dispersive X-ray fluorescence (EDXRF) is a widely used non-destructive technique for micro and trace multi-element analysis of materials. Conventional trials show that using laboratory assisted EDXRF measurements, one can obtain…
Current Flash X-ray single-particle diffraction Imaging (FXI) experiments, which operate on modern X-ray Free Electron Lasers (XFELs), can record millions of interpretable diffraction patterns from individual biomolecules per day. Due to…
We report, for the first time, a multi-confocal Fluorescence Correlation Spectroscopy (mFCS) technique which allows parallel measurements at different locations, by combining a Spatial Light Modulator (SLM), with an Electron Multiplying-CCD…
Scanning Electron Microscopy (SEM) is indispensable in modern materials science, enabling high-resolution imaging across a wide range of structural, chemical, and functional investigations. However, SEM imaging remains constrained by…
X-ray computed tomography (XCT) has become a reliable metrology tool for measuring internal flaws and other microstructural features in engineering materials. However, tracking of material points to measure three-dimensional (3D)…
The in situ synchrotron high-energy X-ray powder diffraction (XRD) technique is highly utilized by researchers to analyze the crystallographic structures of materials in functional devices (e.g., battery materials) or in complex sample…
X-ray Free Electron Lasers (XFEL) are revolutionary photons sources, whose ultrashort, brilliant pulses are expected to allow single molecule diffraction experiments providing structural information on the atomic length scale. This ultimate…
Localized residual stress and elastic strain concentrations in microelectronic devices often affect the electronic performance, resistance to thermomechanical damage, and, likely, radiation tolerance. A primary challenge for…
Scanning transmission electron microscopy (STEM) has advanced rapidly in the last decade thanks to the ability to correct the major aberrations of the probe forming lens. Now atomic-sized beams are routine, even at accelerating voltages as…
Cavity-based x-ray free-electron lasers (CBXFELs) represent a possible realization of fully coherent hard x-ray sources having high spectral brilliance along with a narrow spectral bandwidth of $\simeq 1 - 50$~meV, a high repetition pulse…
Serial crystallography experiments routinely produce thousands of diffraction patterns from crystals in random orientations. To turn this stream of images into a usable dataset, each pattern must be indexed before integration and merging…
Imaging of nanoscale magnetic textures within extended material systems is of critical importance both to fundamental research and technological applications. Whilst high resolution magnetic imaging of thin nanoscale samples is…
Speckle patterns manifesting from the interaction of coherent X-rays with matter offer a glimpse into the dynamics of nanoscale domains that underpin many emergent phenomena in quantum materials. While the dynamics of the average structure…
Dark-field imaging based on grating interferometry is an emerging X-ray modality in medical imaging, which is particularly capable of providing complementary diagnostic information by visualizing the microstructural properties of lung…
The fields of view of Extremely Large Telescopes will contain vast numbers of spatial sampling elements (spaxels) as their Adaptive Optics systems approach the diffraction limit over wide fields. Since this will exceed the detection…
The key to most surface phenomenon lies with the surface structure. Particularly it is the charge density distribution over surface that primarily controls overall interaction of the material with external environment. It is generally…
Accurately determining the crystallographic structure of a material, organic or inorganic, is a critical primary step in material development and analysis. The most common practices involve analysis of diffraction patterns produced in…