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Scanning transmission electron microscopy (STEM) has a broad range of applications in materials characterization, including real-space imaging, spectroscopy, and diffraction, at length scales from the micron to sub-{\AA}ngstr\"om. The…

Instrumentation and Detectors · Physics 2022-06-07 Bryan D Esser , Joanne Etheridge

Object segmentation and structure localization are important steps in automated image analysis pipelines for microscopy images. We present a convolution neural network (CNN) based deep learning architecture for segmentation of objects in…

Computer Vision and Pattern Recognition · Computer Science 2019-01-24 Shan E Ahmed Raza , Linda Cheung , Muhammad Shaban , Simon Graham , David Epstein , Stella Pelengaris , Michael Khan , Nasir M. Rajpoot

We introduce a new image contrast mechanism for scanning transmission electron microscopy (STEM) that derives from the local symmetry within the specimen. For a given position of the electron probe on the specimen, the image intensity is…

Materials Science · Physics 2020-12-30 Matus Krajnak , Joanne Etheridge

Focused ion beams (FIBs) are widely used in nanofabrication for applications such as circuit repair, ultra-thin lamella preparation, strain engineering, and quantum device prototyping. Although the lateral spread of the ion beam is often…

Instrumentation and Detectors · Physics 2025-11-04 M. G. Masteghin , Z. P. Aslam , A. P. Brown , M. J. Whiting , S. K. Clowes , R. P. Webb , D. C. Cox

Scanning transmission electron microscopy is a common tool used to study the atomic structure of materials. It is an inherently multimodal tool allowing for the simultaneous acquisition of multiple information channels. Despite its…

Here a new microscopic method is proposed to image and characterize very thin samples like few-layer materials, organic molecules, and nanostructures with nanometer or sub-nanometer resolution using electron beams of energies lower than 20…

Instrumentation and Detectors · Physics 2016-01-06 Ing-Shouh Hwang

The trend towards higher resolution remote sensing imagery facilitates a transition from land-use classification to object-level scene understanding. Rather than relying purely on spectral content, appearance-based image features come into…

Computer Vision and Pattern Recognition · Computer Science 2016-06-09 Jamie Sherrah

Thin film oxides are a source of endless fascination for the materials scientist. These materials are highly flexible, can be integrated into almost limitless combinations, and exhibit many useful functionalities for device applications.…

Materials Science · Physics 2025-06-17 Steven R. Spurgeon

Controlling crystalline material defects is crucial, as they affect properties of the material that may be detrimental or beneficial for the final performance of a device. Defect analysis on the sub-nanometer scale is enabled by…

Materials Science · Physics 2021-06-03 Nik Dennler , Antonio Foncubierta-Rodriguez , Titus Neupert , Marilyne Sousa

Deep learning has established many new state of the art solutions in the last decade in areas such as object, scene and speech recognition. In particular Convolutional Neural Network (CNN) is a category of deep learning which obtains…

Computer Vision and Pattern Recognition · Computer Science 2016-09-26 Vincent Andrearczyk , Paul F. Whelan

We introduce a machine learning approach to determine the transition dynamics of silicon atoms on a single layer of carbon atoms, when stimulated by the electron beam of a scanning transmission electron microscope (STEM). Our method is…

Scanning transmission electron microscopy (STEM) has been extensively used for imaging complex materials down to atomic resolution. The most commonly employed STEM modality, annular dark-field imaging, produces easily-interpretable…

Over the last two decades, Electron Energy Loss Spectroscopy (EELS) imaging with a scanning transmission electron microscope (STEM) has emerged as a technique of choice for visualizing complex chemical, electronic, plasmonic, and phononic…

Reconstruction of PET images is an ill-posed inverse problem and often requires iterative algorithms to achieve good image quality for reliable clinical use in practice, at huge computational costs. In this paper, we consider the PET…

Computer Vision and Pattern Recognition · Computer Science 2017-04-25 Jieqing Jiao , Sebastien Ourselin

Scanning transmission electron microscopy (STEM) allows for imaging, diffraction, and spectroscopy of materials on length scales ranging from microns to atoms. By using a high-speed, direct electron detector, it is now possible to record a…

In this study we explore the possibility to use deep learning for the reconstruction of phase images from 4D scanning transmission electron microscopy (4D-STEM) data. The process can be divided into two main steps. First, the complex…

Materials Science · Physics 2023-02-15 Thomas Friedrich , Chu-Ping Yu , Jo Verbeeck , Sandra Van Aert

Hyperspectral imagery is rich in spatial and spectral information. Using 3D-CNN can simultaneously acquire features of spatial and spectral dimensions to facilitate classification of features, but hyperspectral image information spectral…

Image and Video Processing · Electrical Eng. & Systems 2022-02-15 Guandong Li , Chunju Zhang

Change detection is the process of identifying pixelwise differences in bitemporal co-registered images. It is of great significance to Earth observations. Recently, with the emergence of deep learning (DL), the power and feasibility of…

Computer Vision and Pattern Recognition · Computer Science 2021-09-03 Pan Chen , Danfeng Hong , Zhengchao Chen , Xuan Yang , Baipeng Li , Bing Zhang

Dual energy computed tomography (DECT) has become of particular interest in clinic recent years. The DECT scan comprises two images, corresponding to two photon attenuation coefficients maps of the objects. Meanwhile, the DECT images are…

Medical Physics · Physics 2017-11-21 Sui Li , Yongbo Wang , Yuting Liao , Ji He , Dong Zeng , Zhaoying Bian , Jianhua Ma

Curvilinear structures frequently appear in microscopy imaging as the object of interest. Crystallographic defects, i.e., dislocations, are one of the curvilinear structures that have been repeatedly investigated under transmission electron…

Image and Video Processing · Electrical Eng. & Systems 2021-10-19 Okan Altingövde , Anastasiia Mishchuk , Gulnaz Ganeeva , Emad Oveisi , Cecile Hebert , Pascal Fua
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