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Dark-field X-ray Microscopy (DFXM) is a novel diffraction-based imaging technique that non-destructively maps the local deformation from crystalline defects in bulk materials. While studies have demonstrated that DFXM can spatially map 3D…
Mechanical properties in crystals are strongly correlated to the arrangement of 1D line defects, termed dislocations. Recently, Dark field X-ray Microscopy (DFXM) has emerged as a new tool to image and interpret dislocations within crystals…
Dislocations control the mechanical behavior of crystalline materials, yet their quantitative characterization in bulk has remained elusive. Transmission Electron Microscopy provides atomic-scale resolution but is restricted to thin foils,…
Crystal defects play a large role in how materials respond to their surroundings, yet there are many uncertainties in how extended defects form, move, and interact deep beneath a material's surface. A newly developed imaging diagnostic,…
The behavior of dislocations is essential to understand material properties, but their subsurface dynamics that are representative of bulk phenomena cannot be resolved by conventional transmission electron microscopy (TEM). Dark field X-ray…
Recent developments in x-ray science provide methods to probe deeply embedded mesoscale grain structures and spatially resolve them using dark field x-ray microscopy (DFXM). Extending this technique to investigate weak diffraction signals…
Dark-field X-ray microscopy (DFXM) is a novel X-ray imaging technique developed at synchrotrons to image along the diffracted beam with a real space resolution of ~100 nm and reciprocal space resolution of $10^{-4}$. Recent implementations…
Validating dislocation patterning models against in situ imaging experiments is a longstanding goal in materials physics. Here, we provide the first direct morphological comparison of such models. Using in situ Dark-Field X-ray Microscopy…
Dark-field x-ray microscopy utilizes Bragg diffraction to collect full-field x-ray images of "mesoscale" structure of ordered materials. Information regarding the structural heterogeneities and their physical implications is gleaned through…
We report on image processing techniques and experimental procedures to determine the lattice-site positions of single atoms in an optical lattice with high reliability, even for limited acquisition time or optical resolution. Determining…
Deformation gradient tensor fields are reconstructed in three dimensions (mapping all 9 tensor components) using synthetic Dark-Field X-ray Microscopy data. Owing to the unique properties of the microscope, our results imply that the…
Thermomechanical processing such as annealing is one of the main methods to tailor the mechanical properties of materials, however, much is unknown about the reorganization of dislocation structures deep inside macroscopic crystals that…
Resolving how defects emerge and interact within the hierarchical structure of polycrystalline materials remains a core challenge in materials science. Grain-mapping methods such as three-dimensional X-ray diffraction (3DXRD) and…
Localization microscopy is an imaging technique in which the positions of individual nanoscale point emitters (e.g. fluorescent molecules) are determined at high precision from their images. This is the key ingredient in…
The structures, strain fields, and defect distributions in solid materials underlie the mechanical and physical properties across numerous applications. Many modern microstructural microscopy tools characterize crystal grains, domains and…
In single molecule localisation super-resolution microscopy the need for repeated image capture limits the imaging speed, while the size of fluorescence probes limits the possible theoretical localisation resolution. Here, we demonstrated a…
Dark Field X-ray Microscopy (DFXM) has advanced 3D non-destructive, high-resolution imaging of strain and orientation in crystalline materials, enabling the study of embedded structures in bulk. However, the photon-intensive nature of…
An algorithm to estimate motion from satellite imagery is presented. Dense displacement fields are computed from time-separated images of of significant convective activity using a Bayesian formulation of the motion estimation problem.…
A new methodology is proposed to estimate 3D displacement fields from pairs of images obtained from X-Ray Computed Micro Tomography (XCMT). Contrary to local approaches, a global approach is followed herein that evaluates {\em continuous}…
Dark-field X-ray microscopy (DFXM) is a nondestructive full-field imaging technique providing three dimensional mapping of microstructure and local strain fields in deeply embedded crystalline elements. This is achieved by placing an…