Related papers: Structure Analysis using Time-of-Flight Momentum M…
Recent advances in the brilliance of hard-X-ray beamlines and photoelectron momentum microscopy facilitate bulk valence-band mapping and core-level-resolved hard-X-ray photoelectron diffraction (hXPD) for structural analysis in the same…
Photoelectron momentum microscopy is an emerging powerful method for angle-resolved photoelectron spectroscopy (ARPES), especially in combination with imaging spin filters. These instruments record kx-ky images, typically exceeding a full…
We established a new approach to hard-X-ray photoelectron spectroscopy (HAXPES). The instrumental key feature is an increase of the dimensionality of the recording scheme from 2D to 3D. A high-energy momentum microscope can detect electrons…
Momentum microscopy (MM) is a novel way of performing angular-resolved photoelectron spectroscopy (ARPES). Combined with time-of-flight (ToF) energy recording, its high degree of parallelization is advantageous for photon-hungry experiments…
Plasma profiling time of flight mass spectrometry (PP-TOFMS) has recently gained interest, as it enables the elemental profiling of semiconductor structures with high depth resolution in short acquisition times. As recently shown by Tempez…
Time-of-flight-based momentum microscopy has a growing presence in photoemission studies, as it enables parallel energy- and momentum-resolved acquisition of the full photoelectron distribution. Here, we report table-top extreme ultraviolet…
The Fe/MgO magnetic tunnel junction is a classic spintronic system, with current importance technologically, and interest for future innovation. The key magnetic properties are linked directly to the structure of hard-to-access buried…
Owing to strongly enhanced bulk sensitivity, angle- or momentum-resolved photoemission using X-rays is an emergent powerful tool for electronic structure mapping. A novel full-field k-imaging method with time-of-flight energy detection…
The physical properties of polycrystalline materials depend on their microstructure, which is the nano-to-centimeter-scale arrangement of phases and defects in their interior. Such microstructure depends on the shape, crystallographic phase…
Efforts to push the spatiotemporal imaging-resolution limits of femtosecond (fs) laser-driven ultrafast electron microscopes (UEMs) to the combined angstrom-fs range will benefit from stable sources capable of generating high bunch charges.…
High-throughput X-ray magnetic circular dichroism (XMCD) spectroscopy was conducted on Fe-Co-Ni compositionally graded films to systematically analyze the variation of magnetic properties as a function of composition. On-the-fly XMCD…
Since its inception, velocity map imaging (VMI) has been a powerful tool for measuring the 2D momentum distribution of photoelectrons generated by strong laser fields. There has been continued interest in expanding it into 3D measurements…
Mass spectrometry is a widespread approach to work out what are the constituents of a material. Atoms and molecules are removed from the material and collected, and subsequently, a critical step is to infer their correct identities based…
With the emergence of advanced Silicon (Si) sensor technologies such as LGADs, it is now possible to achieve exceptional time measurement precision below 50 ps. As a result, the implementation of time-of-flight (TOF) particle identification…
We explore the potential of Time-Of-Flight Medium Energy Ion Scattering (TOFMEIS) for thin film analysis and analyze possible difficulties in evaluation of experimental spectra. Issues regarding different combinations of composition and…
Time-of-flight (ToF) measurements is a possible alternative to anti-scatter grids in computed tomography (CT). Simulations have shown a possible 75% reduction in the detrimental scattering contribution with a 100 ps FWHM timing resolution.…
The small time gap of synchrotron radiation in conventional multi-bunch mode (100-500MHz) is prohibitive for time-of-flight (ToF) based electron spectroscopy. Even the new generation of delay-line detectors with improved time resolution…
This review aims to introduce the x-ray emission spectroscopy (XES) and resonant inelastic x-ray scattering (RIXS) techniques to the materials scientist working with magnetic semiconductors (e.g. semiconductors doped with 3d transition…
Time-resolved photoemission with ultrafast pump and probe pulses is an emerging technique with wide application potential. Real-time recording of non-equilibrium electronic processes, transient states in chemical reactions or the interplay…
We propose a new method for absolute momentum calibration of magnetic spectrometers used in nuclear physics, using the time-of-flight (TOF), differences of pairs of particles with different masses. In cases where the flight path is not…