Spin- and time-resolved photoelectron spectroscopy and diffraction studies using time-of-flight momentum microscopes
Abstract
Momentum microscopy (MM) is a novel way of performing angular-resolved photoelectron spectroscopy (ARPES). Combined with time-of-flight (ToF) energy recording, its high degree of parallelization is advantageous for photon-hungry experiments like ARPES at X-ray energies and spin-resolved ARPES. This article introduces into the spin-resolved variant of ToF-MM and illustrates its performance by selected examples obtained in different spectral ranges. In a multidimensional view of the photoemission process, spectral density function , spin polarization and related quantities of circular dichroism in the angular distribution (CDAD) are part of the complete experiment, a concept adopted from atomic photoemission. We show examples of spin-resolved valence-band mapping in the UV, VUV, soft- and hard-X-ray range. Spin mapping of the Heusler compounds CoMnGa and CoFeMnSi at ~eV prove that the second compound is a half-metallic ferromagnet. Analysis of the Tamm state on Re(0001) using VUV-excitation reveals a Rashba-type spin texture. Bulk band structure including Fermi surface, Fermi velocity distribution , full CDAD texture and spin signature of W(110) have been derived via tomographic mapping with soft X-rays. Hard X-rays enable accessing large k-regions so that the final-state sphere crosses many Brillouin zones in -space with different . At ~keV this fast 4D mapping mode (at fixed ) revealed the temperature dependence of the Fermi surface of the Kondo system YbRhSi. Probing the true bulk spin polarization of FeO at ~keV proved its half-metallic nature. The emerging method of ToF-MM with fs X-ray pulses from a free-electron laser enables simultaneous valence, core-level and photoelectron diffraction measurements in the ultrafast regime.
Keywords
Cite
@article{arxiv.2110.13832,
title = {Spin- and time-resolved photoelectron spectroscopy and diffraction studies using time-of-flight momentum microscopes},
author = {Gerd Schönhense and Hans-Joachim Elmers},
journal= {arXiv preprint arXiv:2110.13832},
year = {2024}
}
Comments
JVST Special collection Commemorating Charles S. Fadley