Related papers: Enhancing sensitivity in atomic force microscopy f…
We demonstrate a tuneable, chip-scale wavelength reference to greatly reduce the complexity and volume of cold-atom sensors. A 1 mm optical path length micro-fabricated cell provides an atomic wavelength reference, with dynamic frequency…
The resonant buildup of light within optical microcavities elevates the radiation pressure which mediates coupling of optical modes to the mechanical modes of a microcavity. Above a certain threshold pump power, regenerative mechanical…
The quality factor of a mechanical resonator is an important figure of merit for various sensing applications and for observing quantum behavior. Here, we demonstrate a technique to push the quality factor of a micro-mechanical resonator…
Ultrasound sensors have wide applications across science and technology. However, improved sensitivity is required for both miniaturisation and increased spatial resolution. Here, we introduce cavity optomechanical ultrasound sensing, where…
The rise of artificial intelligence has triggered exponential growth in data volume, demanding rapid and efficient processing. High-speed, energy-efficient, and parallel-scalable computing hardware is thus increasingly critical. We…
The Transient Fluctuation Theorem is used to calibrate an Atomic Force Microscope by measuring the fluctuations of the work performed by a time dependent force applied between a collo{\"i}dal probe and the surface. From this measure one can…
Frequency-modulation atomic force microscopy provides an outstanding precision of the measurement of chemical bonding forces. However, as the cantilever oscillates with an amplitude A that is usually on the order of atomic dimensions or…
The development and characterisation of a piezoelectric actuated high-frequency MEMS scanning mirror with on-chip frequency tuning capability is reported. The resonant scanner operates at frequencies in excess of 140 kHz, generating scan…
In this paper, a dynamic model of reconstruction of the shear force $g(t)$ in the Atomic Force Microscopy (AFM) cantilever tip-sample interaction is proposed. The interaction of the cone-shaped cantilever tip with the surface of the…
Light pressure effect has been discovered long ago and has been used as an optical method to manipulate microand nanoparticles. It is usually considered as a nonresonant effect determined by the transfer of the momentum of light. However,…
We use a piezoelectric quartz tuning fork to calibrate the displacement of ceramic piezoelectric scanners which are widely employed in scanning probe microscopy. We measure the static piezoelectric response of a quartz tuning fork and find…
Force sensors are at the heart of different technologies such as atomic force microscopy or inertial sensing \cite{RMPforce2003, Rugar2004, YazdiIEEE}. These sensors often rely on the measurement of the displacement amplitude of mechanical…
A method to precisely calibrate the oscillation amplitude in Dynamic Scanning Force Microscopy is described. It is experimentally shown that a typical electronics used to process the dynamic motion of the cantilever can be adjusted to…
We use the strong intrinsic non-linearity of a microwave superconducting qubit with a 4 GHz transition frequency to directly detect and control the energy of a micro-mechanical oscillator vibrating at 25 MHz. The qubit and the oscillator…
We examine the mechanical eigenmodes of a quartz tuning fork (QTF) for the purpose of facilitat- ing its use as a probe for multi-frequency atomic force microscopy (AFM). We perform simulations based on the three-dimensional finite element…
It was shown recently that the Force Feedback Microscope can avoid the jump-to-contact in Atomic force Microscopy even when the cantilevers used are very soft, thus increasing force resolution. In this letter, we explore theoretical aspects…
We present a theoretical study of the measurements of photoinduced force microscopy (PiFM) for composite molecular systems. Using the discrete dipole approximation, we calculate the self-consistent response electric field of the entire…
Atomic force microscopy is based on tip sample interaction, which is determined by the properties of tip and sample. Unfortunately, in particular in ambient conditions the tip as well as the sample are contaminated, and it is not clear how…
In order to develop a new structure microwave probe, the fabrication of AFM probe on the GaAs wafer was studied. A waveguide was introduced by evaporating Au film on the top and bottom surfaces of the GaAs AFM probe. A tip having 8…
We introduce quantum sensing protocol for detection spatially varying fields by using two coupled harmonic oscillators as a quantum probe. We discuss a physical implementation of the sensing technique with two trapped ions coupled via…