Related papers: X-ray diffraction with micrometer spatial resoluti…
To overcome the limit of diffraction while achieving the superresolution technique, solid immersion lenses are the key optical elements for data storage and nanophotonics applications. Recent demonstrations have shown how different…
For x-ray spot sizes of a few tens of microns or smaller, a mm-sized flat analyzer crystal placed ~ 1 cm from the sample will exhibit high energy resolution while subtending a collection solid angle comparable to that of a typical…
The ability to measure small deformations or strains is useful for understanding many aspects of materials. Here, a new analysis of speckle diffraction peaks is presented in which the systematic shifts of the speckles are analyzed allowing…
Diffraction-before-destruction imaging with single ultrashort X-ray pulses has the potential to visualise non-equilibrium processes, such as chemical reactions, at the nanoscale with sub-femtosecond resolution in the native environment…
A further development of a focusing monochromator concept for X-ray energy resolution of 0.1 meV and below is presented. Theoretical analysis of several optical layouts based on this concept was supported by numerical simulations performed…
In analogy with optical near-field scanning methods, we use tapered dielectric waveguides as probes for a millimeter wave vector network analyzer. By scanning thin samples between two such probes we are able to map the spatially varying…
A telescope with Fresnel Zone Plates has been contemplated to be an excellent imaging mask in X-rays and gamma-rays for quite some time. With a proper choice of zone plate material, spacing and an appropriate readout system it is possible…
We introduce a distinct method to perform spatially-resolved spectral analysis of astronomical sources with highly structured X-ray emission. The method measures the surface brightness of neighbouring pixels to adaptively size and shape…
In the last years, optical readout of Micromegas gaseous detectors has been achieved by implementing a Micromegas detector on a glass anode coupled to a CMOS camera. Effective X-ray radiography was demonstrated using integrated imaging…
The development of synchrotron radiation light sources has been going on for decades. Recently, X-ray free-electron lasers as well as the fourth-generation synchrotron radiation sources based on multiple bend achromat lattices are…
We demonstrate that powder diffraction data can be collected from sub-micron crystals of a mbrane protein with nearly two orders of magnitude more atoms than the molecules commonly used for powder diffraction. The crystals of photosystem-1…
The in situ synchrotron high-energy X-ray powder diffraction (XRD) technique is highly utilized by researchers to analyze the crystallographic structures of materials in functional devices (e.g., battery materials) or in complex sample…
The use of strongly bent crystals in spectrometers for pulses of a hard x-ray free-electron laser is explored theoretically. Diffraction is calculated in both dynamical and kinematical theories. It is shown that diffraction can be treated…
We analyze X-ray diffraction data used to extract cell parameters of ultrathin films on closely matching substrates. We focus on epitaxial La2/3Sr1/3MnO3 films grown on (001) SrTiO3 single crystalline substrates. It will be shown that, due…
Strain and composition play a fundamental role in semiconductor physics, since they are means to tune the electronic and optical properties of a material and hence develop new devices. Today it is still a challenge to measure strain in…
We describe a high resolution imaging detector based on a single 80 mm micro-channel-plate (MCP) and a phosphor screen mounted on a UHV flange of only 100 mm inner diameter. It relies on standard components and we describe its performance…
The spectral dispersion of light is critical in applications ranging from spectroscopy to sensing and optical communication technologies. We demonstrate that ultra-high spectral dispersion can be achieved with a finite-size surface plasmon…
Efficient and accurate measurement of the bi-directional reflectance distribution function (BRDF) plays a key role in high quality image rendering and physically accurate sensor simulation. However, obtaining the reflectance properties of a…
The realization of X-ray telescopes with imaging capabilities in the hard (> 10 keV) X-ray band requires the adoption of optics with shallow (< 0.25 deg) grazing angles to enhance the reflectivity of reflective coatings. On the other hand,…
Interferometers are widely used in imaging technologies to achieve enhanced spatial resolution, but require that the incoming photons be indistinguishable. In previous work, we built and analyzed color erasure detectors which expand the…