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We measured the local composition and thickness of SiO2-based glass material from diffraction. By using four dimensional scanning transmission electron microscopy (4D-STEM), we obtained diffraction at each scanning point. Comparing the…

Materials Science · Physics 2020-05-20 K. Nakazawa , K. Mitsuishi , K. Shibata , S. Amma , T. Mizoguchi

The success of the various secondary operations involved in the production of particulate products depends on the production of particles with a desired size and shape from a previous primary operation such as crystallisation. This is…

We describe a lattice-based crystallographic approximation for the analysis of distorted crystal structures via Electron Backscatter Diffraction (EBSD) in the scanning electron microscope. EBSD patterns are closely linked to local lattice…

Materials Science · Physics 2019-01-02 Aimo Winkelmann , Gert Nolze , Grzegorz Cios , Tomasz Tokarski

The surface structure of Bi(110) has been investigated by low-energy electron diffraction (LEED) intensity analysis and by first-principles calculations. Diffraction patterns at a sample temperature of 110 K and normal incidence reveal a…

Other Condensed Matter · Physics 2007-05-23 J. Sun , A. Mikkelsen , M. Fuglsang Jensen , Y. M. Koroteev , G. Bihlmayer , E. V. Chulkov , D. L. Adams , Ph. Hofmann , K. Pohl

Laser cutting of semiconductor wafers and transparent dielectrics has become a dominant process in manufacturing industries, encompassing a wide range of applications from flat display panels to microelectronic chips. Limited by the…

The bremsstrahlung cross section is calculated at leading order for polarized beams of electrons and ions, which is needed for luminosity measurements at the upcoming Electron Ion Collider (EIC). Analytic expressions, differential in the…

High Energy Physics - Phenomenology · Physics 2023-09-12 Dhevan Gangadharan

The microstructural development in H13 tool steel upon nitriding by an ion beam process was investigated. The nitriding experiments were performed at a relatively low temperature of about 400\deg C and at constant ion beam energy (400 eV)…

Materials Science · Physics 2012-12-14 L. F. Zagonel , E. J. Mittemeijer , F. Alvarez

One of many challenges for niobium (Nb) based superconducting devices is the improvement over the surface morphology and superconducting properties as well as the reduction of defects. We employed a novel deposition technique, i.e. biased…

Materials Science · Physics 2017-08-14 Salinporn Kittiwatanakul , Nattawut Anuniwat , Nam Dao , Stuart A. Wolf , Jiwei Lu

Biological tissues are composed of discrete compartments of biochemical media that often exhibit subtle differences in refractive index. Light propagating through these compartments partially diffracts in a forward direction with a pi/2…

Optics · Physics 2025-05-12 Gregory N. McKay , Jerome Mertz , Nicholas J. Durr

The design of novel materials hinges on the understanding of structure-property relationships. However, in recent times, our capability to synthesize a large number of materials has outpaced our speed at characterizing them. While the…

A method for specular reflection of polar molecules is proposed. Electrostatatic potentials and forces are calculated for a low-field-seeking molecule near a series of long cylindrical electrodes of radius $r$ with dc potentials of $+V$ and…

Electromagnetic metasurfaces have attracted significant interest recently due to their low profile and advantageous applications. Practically, many metasurface designs start with a set of constraints for the radiated far-field, such as…

Materials Science · Physics 2022-04-04 Stewart Pearson , Parinaz Naseri , Sean V. Hum

Immersed reflection gratings improve spectral resolving power by enabling diffraction within a high refractive index medium. This principle has been widely adopted to make grating spectrometers more compact. Conventional immersed gratings…

Electron beam probe (EBP) is a new principle detector, which makes use of a low-intensity and low-energy electron beam to measure the transverse profile, bunch shape, beam neutralization and beam wake field of an intense beam with small…

Four-dimensional Scanning Transmission Electron Microscopy (4D-STEM) is a powerful technique for high-resolution and high-precision materials characterization at multiple length scales, including the characterization of beam-sensitive…

Applied Physics · Physics 2023-08-11 Hsu-Chih Ni , Renliang Yuan , Jiong Zhang , Jian-Min Zuo

Different techniques of the X-ray Diffraction Line Profile Analysis (XRDLPA) have been used to assess the microstructure of the irradiated Zr-1.0%Nb-1.0%Sn-0.1%Fe alloy. The domain size, microstrain, density of dislocation and the stacking…

Materials Science · Physics 2007-05-23 A. Sarkar , P. Mukherjee , P. Barat

A characteristic feature of the nuclear microprobe using a 3 MeV proton beam is the long range of particles (around 70 \mu m in light matrices). The PIXE method, with EDS analysis and using the multilayer approach for treating the X-ray…

Geophysics · Physics 2008-12-18 David Strivay , Claire Ramboz , J. P. Gallien , D. Grambole , Kalin Kouzmanov

Nanoscale fabrication and characterisation techniques critically underpin a vast range of fields, including materials science, nanoelectronics and nanobiotechnology. Focused ion beam (FIB) techniques are particularly appealing due to their…

The Nitrogen Vacancy color center (NV-) in diamond is of great interest for novel photonic applications. Diamond nano-photonic structures are often implemented using Focused-Ion-Beam (FIB) processing, leaving a damaged surface which has a…

Twisted bilayer photonic crystals introduce a twist between two stacked photonic crystal slabs, enabling strong modulation of their electromagnetic properties. The change in the twist angle strongly influences the resonant frequencies and…

Optics · Physics 2024-12-17 Nicolas Roy , Beicheng Lou , Shanhui Fan , Alexandre Mayer , Michaël Lobet