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Scanning transmission electron microscopy (STEM) has advanced rapidly in the last decade thanks to the ability to correct the major aberrations of the probe forming lens. Now atomic-sized beams are routine, even at accelerating voltages as…
Manipulating transparent objects presents significant challenges due to the complexities introduced by their reflection and refraction properties, which considerably hinder the accurate estimation of their 3D shapes. To address these…
Strain engineering is used to obtain desirable materials properties in a range of modern technologies. Direct nanoscale measurement of the three-dimensional strain tensor field within these materials has however been limited by a lack of…
Plane feature is a kind of stable landmark to reduce drift error in SLAM system. It is easy and fast to extract planes from dense point cloud, which is commonly acquired from RGB-D camera or lidar. But for stereo camera, it is hard to…
Diffraction gratings integrated into an atomic, molecular, and optical (AMO) setup offer a compact and efficient route toward atom cooling and trapping, thus preparing magneto-optical traps (MOT) for insertion into future scalable quantum…
This paper presents a regularized regression model with a two-level structural sparsity penalty applied to locate individual atoms in a noisy scanning transmission electron microscopy image (STEM). In crystals, the locations of atoms is…
There is a trend in research towards more automation using smart systems powered by artificial intelligence. While experiments are often challenging to automate, they can greatly benefit from automation by reducing labor and increasing…
Deep-learning algorithms enable precise image recognition based on high-dimensional hierarchical image features. Here, we report the development and implementation of a deep-learning-based image segmentation algorithm in an autonomous…
In a lot of scientific problems, there is the need to generate data through the running of an extensive number of experiments. Further, some tasks require constant human intervention. We consider the problem of crack detection in steel…
With continuous progression of Moore's Law, integrated circuit (IC) device complexity is also increasing. Scanning Electron Microscope (SEM) image based extensive defect inspection and accurate metrology extraction are two main challenges…
Background: Photoacoustic Microscopy (PAM) integrates optical and acoustic imaging, offering enhanced penetration depth for detecting optical-absorbing components in tissues. Nonetheless, challenges arise in scanning large areas with high…
In garment manufacturing, an automatic sewing machine is desirable to reduce cost. To accomplish this, a high speed vision system is required to track fabric motions and recognize repetitive weave patterns with high accuracy, from a micro…
We present a method to determine the strain tensor and local lattice rotation with Dark Field X-ray Microscopy. Using a set of at least 3 non-coplanar, symmetry-equivalent Bragg reflections, the illuminated volume of the sample can be kept…
A new procedure aiming at folding a powder diffraction 2-D into a 1-D scan is presented. The technique consists of three steps: tracking the beam centre by means of a Simulated Annealing (SA) of the diffraction rings along the same axis,…
High angular resolution electron backscatter diffraction (HR-EBSD) affords an increase in angular resolution, as compared to 'conventional' Hough transform based EBSD, of two orders of magnitude, enabling measurements of relative…
It is a crucial issue to realize real-time piston correction in the area of sparse aperture imaging. This paper introduces an optical diffractive neural network-based piston sensing method, which can achieve light-speed sensing. By using…
This paper provides a novel approach to stitching surface images of rotationally symmetric parts. It presents a process pipeline that uses a feature-based stitching approach to create a distortion-free and true-to-life image from a video…
The use of differential phase contrast (DPC) in scanning transmission electron microscopy (STEM) has shown much promise for directly investigating the functional properties of a material system, leveraging the natural coupling between the…
Diffraction drastically limits the bit density in optical data storage. To increase the storage density, alternative strategies involving supplementary recording dimensions and robust read-out schemes must be explored. Here, we propose to…
Electron tomography offers important three-dimensional (3D) structural information which cannot be observed by two-dimensional imaging. By combining annular dark field scanning transmission electron microscopy (ADF-STEM) with aberration…