Related papers: Comparing different solutions for testing resistiv…
Machine learning based malware detection techniques rely on grayscale images of malware and tends to classify malware based on the distribution of textures in graycale images. Albeit the advancement and promising results shown by machine…
Model fingerprinting has emerged as a promising paradigm for claiming model ownership. However, robustness evaluations of these schemes have mostly focused on benign perturbations such as incremental fine-tuning, model merging, and…
Testing black-box perceptual-control systems in simulation faces two difficulties. Firstly, perceptual inputs in simulation lack the fidelity of real-world sensor inputs. Secondly, for a reasonably accurate perception system, encountering a…
Low-frequency disturbances of power quality are one of the most common disturbances in the power grid. These disturbances are most often the result of the impact of power electronic and energy-saving devices, the number of which is…
Chemical, mechanical, thermal and/or electronic properties of bulk or low-dimensional materials can be engineered by introducing structural defects to form novel functionalities. When using particles irradiation, these defects can be…
Negative feedback is a powerful approach capable of improving several aspects of a system. In linear electronics, it has been critical for allowing invariance to device properties. Negative feedback is also known to enhance linearity in…
In many real-world scenarios, obtaining large amounts of labeled data can be a daunting task. Weakly supervised learning techniques have gained significant attention in recent years as an alternative to traditional supervised learning, as…
Applying deductive verification to formally prove that a program respects its formal specification is a very complex and time-consuming task due in particular to the lack of feedback in case of proof failures. Along with a non-compliance…
Embedded RAM blocks (BRAMs) in field programmable gate arrays (FPGAs) are susceptible to single event effects (SEEs) induced by environmental factors such as cosmic rays, heavy ions, alpha particles and so on. As technology scales, the…
The SRAM cell is made up of latch, which ensures that the cell data is preserved as long as power is turned on and refresh operation is not required for the SRAM cell. SRAM is widely used for on-chip cache memory in microprocessors, game…
Fault tolerance is a critical aspect of modern computing systems, ensuring correct functionality in the presence of faults. This paper presents a comprehensive survey of fault tolerance methods and software-based mitigation techniques in…
We will discuss the RowHammer problem in DRAM, which is a prime (and likely the first) example of how a circuit-level failure mechanism in Dynamic Random Access Memory (DRAM) can cause a practical and widespread system security…
With full knowledge of a material's atomistic structure, it is possible to predict any macroscopic property of interest. In practice, this is hindered by limitations of the chosen characterisation techniques. For example, electron…
In this paper, we propose an easy-to-implement residual-based specification testing procedure for detecting structural changes in factor models, which is powerful against both smooth and abrupt structural changes with unknown break dates.…
Stochastic behaviors of resistive random access memory (RRAM) play an important role in the design of cross-point memory arrays. A Monte Carlo compact model of oxide RRAM is developed and calibrated with experiments on various device stack…
The ever-increasing demand for high-capacity rechargeable batteries highlights the need for sensitive and accurate diagnostic technology for determining the state of a cell, for identifying and localizing defects, or for sensing capacity…
Our ISCA 2014 paper provided the first scientific and detailed characterization, analysis, and real-system demonstration of what is now popularly known as the RowHammer phenomenon (or vulnerability) in modern commodity DRAM chips, which are…
Nanometallic devices based on amorphous insulator-metal thin films are developed to provide a novel non-volatile resistance-switching random-access memory (RRAM). In these devices, data recording is controlled by a bipolar voltage, which…
Deep learning-based semiconductor defect inspection has gained traction in recent years, offering a powerful and versatile approach that provides high accuracy, adaptability, and efficiency in detecting and classifying nano-scale defects.…
The soft error rate (SER) of integrated circuits (ICs) operating in space environment may vary by several orders of magnitude due to the variable intensity of radiation exposure. To ensure the radiation hardness without compromising the…