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This paper studies robustness of MIMO control systems with parametric uncertainties, and establishes a lower dimensional robust stability criterion. For control systems with interval transfer matrices, we identify the minimal testing set…
Resistive switching devices and other components with negative differential resistance (NDR) are emerging as possible electronic constituents of next-generation computing architectures. Due to the NDR effects exhibited, switching operations…
To understand and improve DRAM performance, reliability, security and energy efficiency, prior works study characteristics of commodity DRAM chips. Unfortunately, state-of-the-art open source infrastructures capable of conducting such…
As machine-learning (ML) based systems for malware detection become more prevalent, it becomes necessary to quantify the benefits compared to the more traditional anti-virus (AV) systems widely used today. It is not practical to build an…
We experimentally investigate the suitability of a multi-path waveguide interferometer with mechanical shutters for performing a test for hypercomplex quantum mechanics. Probing the interferometer with coherent light we systematically…
Material properties strongly depend on the nature and concentration of defects. Characterizing these features may require nano- to atomic-scale resolution to establish structure-property relationships. 4D-STEM, a technique where diffraction…
One of the prerequisites of any organization is an unvarying sustainability in the dynamic and competitive industrial environment. Development of high quality software is therefore an inevitable constraint of any software industry. Defect…
This paper proposes and compares experimentally several methods to estimate the series resistance and reactance (i.e., the transversal components of the $\pi$-model of a line) of low-voltage lines in distribution grids. It first shows that…
An important issue in additive manufacturing is the reliability and reproducibility of parts. One major problem in achieving this are uncontrolled local variations in the obtained material properties which arise in the complex manufacturing…
Fault tolerance in multi-core architecture has attracted attention of research community for the past 20 years. Rapid improvements in the CMOS technology resulted in exponential growth of transistor density. It resulted in increased…
Understanding fault types can lead to novel approaches to debugging and runtime verification. Dealing with complex faults, particularly in the challenging area of embedded systems, craves for more powerful tools, which are now becoming…
We experimentally demonstrate the effects of read disturbance (RowHammer and RowPress) and uncover the inner workings of undocumented read disturbance defense mechanisms in High Bandwidth Memory (HBM). Detailed characterization of six real…
Smaller feature size, higher clock frequency and lower power consumption are of core concerns of today's nano-technology, which has been resulted by continuous downscaling of CMOS technologies. The resultant 'device shrinking' reduces the…
Product metrics, such as size or complexity, are often used to identify defect-prone parts or to focus quality assurance activities. In contrast, quality information that is available early, such as information provided by inspections, is…
Bug finding tools can find defects in software source code us- ing an automated static analysis. This automation may be able to reduce the time spent for other testing and review activities. For this we need to have a clear understanding of…
The morphological evolution of the conducting filament (CF) predominantly controls the electric response of the resistive random access memory (ReRAM) devices. However, the parameters -- in terms of the material and the processing -- which…
Testing deep learning-based systems is crucial but challenging due to the required time and labor for labeling collected raw data. To alleviate the labeling effort, multiple test selection methods have been proposed where only a subset of…
This paper proposes an adaptive random experiment design (ARED) algorithm that can be applied to optimize the multiple factors and levels experiments. The algorithm takes real-time model error as the adaptive condition, and outputs a model…
Solid-state quantum coherent devices are quickly progressing. Superconducting circuits, for instance, have already been used to demonstrate prototype quantum processors comprising a few tens of quantum bits. This development also revealed…
Predictable execution time upon accessing shared memories in multi-core real-time systems is a stringent requirement. A plethora of existing works focus on the analysis of Double Data Rate Dynamic Random Access Memories (DDR DRAMs), or…