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Endoscopic ultrasound (EUS) imaging has a trade-off between resolution and penetration depth. By considering the in-vivo characteristics of human organs, it is necessary to provide clinicians with appropriate hardware specifications for…

Metallic contaminants in complex heterostructures are important topics due to their significant roles in determining physical properties as well as device performance. Heterostructures of polyimide via on Al pad and Cu redistribution layer…

We report the first measurements and detailed analysis of extreme ultraviolet (EUV) spectra (4 nm to 20 nm) of highly-charged tungsten ions W$^{54+}$ to W$^{63+}$ obtained with an electron beam ion trap (EBIT). Collisional-radiative…

The lack of transmissive photonic components in the extreme ultra-violet (XUV) constitutes a challenge for micro/nano-metric confinement. Here, we theoretically design a novel approach to attain XUV radiation guidance based on the…

The Mini-EUSO instrument is a UV telescope to be placed inside the International Space Station (ISS), looking down on the Earth from a nadir-facing window in the Russian Zvezda module. Mini-EUSO will map the earth in the UV range (300 - 400…

We use a sample of 332 Hubble Space Telescope spectra of 184 QSOs with z > 0.33 to study the typical ultraviolet spectral properties of QSOs, with emphasis on the ionizing continuum. Our sample is nearly twice as large as that of Zheng et…

In this paper we describe a way to achieve the extraordinary transmission regime from sub-wavelength slits carved on semiconductor substrates. Unlike metals, the dielectric permittivity of typical semiconductors like GaAs or GaP is negative…

High quality-factor (Q) dielectric metasurfaces operating in the visible to near-infrared range usually require sub-200 nm features, limiting their fabrication to expensive, low-throughput electron beam lithography. Here, we demonstrate…

Extreme Ultraviolet (EUV) photolithography is seen as the key enabler for increasing transistor density in the next decade. In EUV lithography, 13.5 nm EUV light is illuminated through a reticle, holding a pattern to be printed, onto a…

Many nano and quantum devices, with their sizes often spanning from millimeters down to sub-nanometer, have intricate low-dimensional, non-uniform, or hierarchical structures on surfaces and interfaces. Since their functionalities are…

We report on a compact and spectrally intense extreme-ultraviolet (XUV) source, which is based on high-harmonic generation (HHG) driven by 395 nm pulses. In order to minimize the XUV virtual source size and to maximize the XUV flux, HHG is…

We characterize the properties of extreme ultraviolet (EUV) light source plasmas driven by laser wavelengths in the $\lambda_{\mathrm{laser}} = 1.064 - 10.6 $ $\mu$m range. Detailed numerical simulations of laser-irradiated spherical tin…

Most advances in metaoptics have been made at visible wavelengths and above; in contrast, the vacuum ultraviolet (VUV) has barely been explored despite numerous scientific and technological opportunities. Creating metaoptic elements at this…

Following electronic processes in molecules and materials at the level of the quantum mechanical electron wavefunction with angstrom-level spatial resolution and with full access to its femtosecond temporal dynamics is at the heart of…

This paper discusses a simple, low-cost, highly efficient two-mirror projector with a simplified illumination system. The EUV source power can be reduced by 1/10 compared to the current six-mirror EUV projector system. The required EUV…

Driven by life-science applications, mega-electron-volt Scanning Transmission Electron Microscope (MeV-STEM) has been proposed to image thick biological samples. The high penetration of inelastic scattering signals of MeV electrons could…

The escalating demand for ultraviolet (UV) sensing in space exploration, environmental monitoring, and agricultural productivity necessitates detectors that are both environmentally and mechanically resilient. Diamond, featuring its high…

After a brief introduction to the NIST EBIT facility, we present the results of three different types of experiments that have been carried out there recently: EUV and visible spectroscopy in support of the microelectronics industry,…

We report our detailed investigation of high-resolution imaging using secondary electrons (SE) with a subnanometer probe in an aberration-corrected transmission electron microscope, Hitachi HD2700C. This instrument also allows us to acquire…

We present the results of an experiment where a short focal length (~ 1.3 cm) permanent magnet electron lens is used to image micron-size features of a metal sample in a single shot, using an ultra- high brightness ps-long 4 MeV electron…