Related papers: Labeling elemental detection sensitivities in part…
Knowledge on the temporal and size distribution of particulate matter (PM) in air as well as on its elemental composition is a key information for source appointment, for the investigation of their influence on environmental processes and…
Electron microscopy prevalently uses energy-dispersive x-ray spectroscopy (EDS) and electron energy loss spectroscopy (EELS) for elemental analysis. EDS and EELS energy resolutions are commonly between 30-100 eV or 0.01-1 eV, respectively.…
We have demonstrated the use of the bremsstrahlung radiation in energy dispersive x-ray fluorescence technique as a tool to perform non-destructive elemental analysis of solid samples employed in inter-disciplinary science research. The…
Energy-dispersive X-ray diffraction (EDXRD) is extremely insensitive to sample morphology when implemented in a back-reflection geometry. The capabilities of this non-invasive technique for cultural heritage applications have been explored…
In this work we show the operation and results of an X-ray fluorescence imaging system using a cascade of three gas electron multipliers (GEM) and a pinhole assembly. The detector operates in Ar/CO$_2$ (90/10) at atmospheric pressure, with…
Low power energy dispersive XRD-XRF portable instruments equipped with multiple angle scanning can take advantage of the shorter acquisition time of EDXRD with respect to ADXRD, and bring closer higher accuracy and resolution of…
To characterise (inter)diffusion in materials, concentration profiles can be measured by EDX. It allows one to determine the chemical composition with a very good accuracy if measurement artefacts are accounted for. Standard phenomena (such…
We report the implementation of energy dispersive X-ray spectroscopy for layered semiconductors in the form of atomically thin transition metal dichalcogenides. The technique is based on a scanning electron microscope equipped with a…
We applied a tabletop, ultrafast, high-harmonic generation (HHG) source to measure the element-specific ferromagnetic resonance (FMR) in ultra-thin magnetic alloys and multilayers on an opaque Si substrate. We demonstrate a continuous wave…
In this work a set of simulations that aim at the optimization of gaseous detectors for applications in X-ray fluorescence imaging in the energy range of 3 -- 30keV is presented. By studying the statistical distribution of the radiation…
X-ray free electron lasers (XFELs) generate sequences of ultra-short, spatially coherent pulses of x-ray radiation. We propose the diffraction focusing spectrometer (DFS), which is able to measure the whole energy spectrum of the radiation…
Emulsion detectors feature a very high position resolution and consequently represent an ideal device when particle detection is required at the micrometric scale. This is the case of quantum interferometry studies with antimatter, where…
We performed an analysis of coherence properties of the 4-th generation high-energy storage rings with emittance values of 10 pmrad. It is presently expected that a storage ring with these low emittance values will reach diffraction limit…
X-ray fluorescence (XRF) analysis is a widely applied technique for the quantitative analysis of thin films up to the $\mu$m scale because of its non-destructive nature and because it is easily automated. When low uncertainties of the…
Electrically detected magnetic resonance (EDMR) is applied to mm size devices with implanted leads and a 50 micron square gap laid down on bulk phosphorus doped silicon. Devices with a range of phosphorus concentrations and surface types…
We measured Electron Energy Distribution Functions (EEDFs) from below 200 eV to over 8 keV and spanning five orders-of-magnitude in intensity, produced in a low-power, RF-heated, tandem mirror discharge in the PFRC-II apparatus. The EEDF…
X-ray fluorescence holography (XFH) is a method for obtaining diffraction-limited images of the local atomic structure around a given type of emitter. The reconstructed wave-field represents a distorted image of the scatterer electron…
Energy dispersive X-ray (EDX) spectroscopy in the transmission electron microscope is a key tool for nanomaterials analysis, providing a direct link between spatial and chemical information. However, using it for precisely determining…
X-ray transition radiation can be used to measure the Lorentz factor of relativistic particles. At energies approaching gamma = E/mc^2 = 10^5, transition radiation detectors (TRDs) can be optimized by using thick (sim 5 - 10 mil) foils with…
With the advent of both modern X-ray fluorescence (XRF) methods and improved analytical reliability requirements the demand for suitable reference samples has increased. Especially in nanotechnology with the very low areal mass depositions,…