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Change point detection is a crucial aspect of analyzing time series data, as the presence of a change point indicates an abrupt and significant change in the process generating the data. While many algorithms for the problem of change point…

Machine Learning · Computer Science 2023-05-23 Mario Krause

This paper presents a challenging computer vision task, namely the detection of generic components on a PCB, and a novel set of deep-learning methods that are able to jointly leverage the appearance of individual components and the…

Computer Vision and Pattern Recognition · Computer Science 2018-11-21 Chia-Wen Kuo , Jacob Ashmore , David Huggins , Zsolt Kira

Controlling crystalline material defects is crucial, as they affect properties of the material that may be detrimental or beneficial for the final performance of a device. Defect analysis on the sub-nanometer scale is enabled by…

Materials Science · Physics 2021-06-03 Nik Dennler , Antonio Foncubierta-Rodriguez , Titus Neupert , Marilyne Sousa

Automated visual inspection in the semiconductor industry aims to detect and classify manufacturing defects utilizing modern image processing techniques. While an earliest possible detection of defect patterns allows quality control and…

Machine Learning · Computer Science 2024-06-11 Tobias Schlosser , Frederik Beuth , Michael Friedrich , Danny Kowerko

Remote Sensing Change Detection (RS-CD) aims to detect relevant changes from Multi-Temporal Remote Sensing Images (MT-RSIs), which aids in various RS applications such as land cover, land use, human development analysis, and disaster…

Computer Vision and Pattern Recognition · Computer Science 2023-03-17 Wele Gedara Chaminda Bandara , Vishal M. Patel

In industrial defect segmentation tasks, while pixel accuracy and Intersection over Union (IoU) are commonly employed metrics to assess segmentation performance, the output consistency (also referred to equivalence) of the model is often…

Computer Vision and Pattern Recognition · Computer Science 2023-10-02 Zhen Qu , Xian Tao , Fei Shen , Zhengtao Zhang , Tao Li

A common source of defects in manufacturing miniature Printed Circuits Boards (PCB) is the attachment of silicon die or other wire bondable components on a Liquid Crystal Polymer (LCP) substrate. Typically, a conductive glue is dispensed…

Computer Vision and Pattern Recognition · Computer Science 2020-02-26 Nikolaos Dimitriou , Lampros Leontaris , Thanasis Vafeiadis , Dimosthenis Ioannidis , Tracy Wotherspoon , Gregory Tinker , Dimitrios Tzovaras

Surface defect inspection based on machine vision is often affected by uneven illumination. In order to improve the inspection rate of surface defects inspection under uneven illumination condition, this paper proposes a method for…

Computer Vision and Pattern Recognition · Computer Science 2023-07-18 Hao Wu , Yulong Liu , Wenbin Gao , Xiangrong Xu

Industrial surface defect detection often suffers from limited defect samples, severe long-tailed distributions, and difficulties in accurately localizing subtle defects under complex backgrounds. To address these challenges, this paper…

Artificial Intelligence · Computer Science 2026-04-22 Shuo Feng , Runlin Zhou , Yuyang Li , Guangcan Liu

Deep learning has been constantly improving in recent years and a significant number of researchers have devoted themselves to the research of defect detection algorithms. Detection and recognition of small and complex targets is still a…

Computer Vision and Pattern Recognition · Computer Science 2024-06-24 Siddiqui Muhammad Yasir , Hyunsik Ahn

We present a novel approach for inspecting variable data prints (VDP) with an ultra-low false alarm rate (0.005%) and potential applicability to other real-world problems. The system is based on a comparison between two images: a reference…

Computer Vision and Pattern Recognition · Computer Science 2020-01-14 Oren Haik , Oded Perry , Eli Chen , Peter Klammer

Early detection of incipient faults is of vital importance to reducing maintenance costs, saving energy, and enhancing occupant comfort in buildings. Popular supervised learning models such as deep neural networks are considered promising…

Machine Learning · Computer Science 2019-02-19 Baihong Jin , Dan Li , Seshadhri Srinivasan , See-Kiong Ng , Kameshwar Poolla , Alberto~Sangiovanni-Vincentelli

Photon counting detectors (PCDs) offer promising advancements in computed tomography (CT) imaging by enabling the quantification and 3D imaging of contrast agents and tissue types through multi-energy projections. However, the accuracy of…

Medical Physics · Physics 2023-10-18 Juan C. R. Luna , Mini Das

Visual anomaly detection plays a significant role in the development of industrial automatic product quality inspection. As a result of the utmost imbalance in the amount of normal and abnormal data, growing attention has been given to…

Computer Vision and Pattern Recognition · Computer Science 2023-01-16 Wei Luo , Haiming Yao , Wenyong Yu

Optical inspection of 1191 silicon micro-strip sensors was performed using a custom made optical inspection setup, employing a machine-learning based approach for the defect analysis and subsequent quality assurance. Furthermore,…

Instrumentation and Detectors · Physics 2021-12-08 E. Lavrik , M. Shiroya , H. R. Schmidt , A. Toia , J. M. Heuser

The rise of deep learning has introduced a transformative era in the field of image processing, particularly in the context of computed tomography. Deep learning has made a significant contribution to the field of industrial Computed…

Computer Vision and Pattern Recognition · Computer Science 2024-01-30 Yuzhong Zhou , Linda-Sophie Schneider , Fuxin Fan , Andreas Maier

Surface inspection systems are an important application domain for computer vision, as they are used for defect detection and classification in the manufacturing industry. Existing systems use hand-crafted features which require extensive…

Image and Video Processing · Electrical Eng. & Systems 2019-04-10 Selim Arikan , Kiran Varanasi , Didier Stricker

In this research work, we have demonstrated the application of Mask-RCNN (Regional Convolutional Neural Network), a deep-learning algorithm for computer vision and specifically object detection, to semiconductor defect inspection domain.…

Computer Vision and Pattern Recognition · Computer Science 2022-11-07 Bappaditya Dey , Enrique Dehaerne , Kasem Khalil , Sandip Halder , Philippe Leray , Magdy A. Bayoumi

Detecting and evaluating surface coating defects is important for marine vessel maintenance. Currently, the assessment is carried out manually by qualified inspectors using international standards and their own experience. Automating the…

Computer Vision and Pattern Recognition · Computer Science 2022-03-21 Li Yu , Kareem Metwaly , James Z. Wang , Vishal Monga

Deep learning techniques have achieved great success in remote sensing image change detection. Most of them are supervised techniques, which usually require large amounts of training data and are limited to a particular application.…

Image and Video Processing · Electrical Eng. & Systems 2021-10-11 Yuxing Chen , Lorenzo Bruzzone