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In this study, we have used a Zr-Nb alloy containing well-defined nano-precipitates as a model material in which to study imaging contrast inversions (atomic number or diffraction contrast) observed with the forescattered electron imaging…
In-situ transmission electron microscopy (TEM) has become an important technique to study dynamic processes at highest spatial resolution and one branch is the investigation of phenomena related with electrical currents. Here, we present…
Electron vortex beams hold great promise for development in transmission electron microscopy, but have yet to be widely adopted. This is partly due to the complex set of interactions that occur between a beam carrying orbital angular…
When aiming for atomic resolution electron magnetic circular dichroism (EMCD) in STEM mode, the high convergence angle of the electron probe can lead to unforeseen artefacts and strong reductions of the signal to noise ratio (SNR) in the…
Scanning Electron Microscopy (SEM) is pivotal in revealing intricate micro- and nanoscale features across various research fields. However, obtaining high-resolution SEM images presents challenges, including prolonged scanning durations and…
Electron microscopy has shown to be a very powerful tool to map the chemical nature of samples at various scales down to atomic resolution. However, many samples can not be analyzed with an acceptable signal-to-noise ratio because of the…
Feynman once asked physicists to build better electron microscopes to be able to watch biology at work. While electron microscopes can now provide atomic resolution, electron beam induced specimen damage precludes high resolution imaging of…
Secondary electron (SE) imaging techniques, such as scanning electron microscopy and helium ion microscopy (HIM), use electrons emitted by a sample in response to a focused beam of charged particles incident at a grid of raster scan…
By means of numerical simulations, we demonstrate the innovative use of computational ghost imaging in transmission electron microscopy to retrieve images with a resolution that overcomes the limitations imposed by coherent aberrations. The…
Compressed sensing algorithms are used to decrease electron microscope scan time and electron beam exposure with minimal information loss. Following successful applications of deep learning to compressed sensing, we have developed a…
We use camera-in-the-loop calibration to calibrate a phase-only spatial light modulator (SLM) in a far-field hologram setup. The recorded intensity distributions achieve a high degree of consistency with the calculated results, indicating a…
Circular dichroism spectroscopy is an essential technique for understanding molecular structure and magnetic materials, but spatial resolution is limited by the wavelength of light, and sensitivity sufficient for single-molecule…
Scanning transmission electron microscopy (STEM) is an extremely versatile method for studying materials on the atomic scale. Many STEM experiments are supported or validated with electron scattering simulations. However, using the…
Low-energy electron microscopy (LEEM) is a surface science method that works primarily in the UHV environment. It provides information complementary to the other established techniques: it extends the limited view of scanning probe…
We introduce a compact design for an electronic device capable of superposing 8 bias voltages up to $\pm$96~V on a voltage of up to 5~kV. Such a device has been implemented to provide biasing of a beam steerer-shifter system for use in…
Spectrographs nominally contain a degree of quasi-static optical aberrations resulting from the quality of manufactured component surfaces, imperfect alignment, design residuals, thermal effects, and other other associated phenomena…
For quantitative electron microscopy high precision position information is necessary so that besides an adequate resolution and sufficiently strong contrast of atoms, small width of peaks which represent atoms in structural images is…
In detection of electrons from $\mu \to e $ conversion process the monochromatic electron spectrum is transformed due to a photon emission and fluctuations of energy loss in a target. The selection criterion of $\mu \to e (\gamma)$…
A new method for dark field imaging is introduced which uses scanned electron diffraction (or 4DSTEM - 4-dimensional scanning transmission electron microscopy) datasets as its input. Instead of working on simple summation of intensity, it…
Transmission electron microscopes use electrons with wavelengths of a few picometers, potentially capable of imaging individual atoms in solids at a resolution ultimately set by the intrinsic size of an atom. Unfortunately, due to…