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Recent advances in ferroelectrics highlight the role of three-dimensional (3D) polar entities in forming topological polar textures and generating giant electromechanical responses, during polarization rotation. However, current electron…

Materials Science · Physics 2025-06-10 Jinho Byun , Keeyong Lee , Myoungho Jeong , Eunha Lee , Jeongil Bang , Haeryong Kim , Geun Ho Gu , Sang Ho Oh

Ultrafast electron diffraction (UED) is a technique in which short-pulse electron beams can probe the femtosecond-scale evolution of atomic structure in matter driven far from equilibrium. As an accelerator physics challenge, UED imposes…

Super-resolution fluorescence microscopy provides unprecedented insight into cellular and subcellular structures. However, going "beyond the diffraction barrier" comes at a price since most far-field super-resolution imaging techniques…

Three types of BaTiO3 core - amorphous nano-shell composite ceramics were processed from the same core-shell powder by standard sintering, spark-plasma sintering and two-step sintering techniques and characterized by XRD, HRSEM and…

Materials Science · Physics 2011-11-17 D. Nuzhnyy , J. Petzelt , V. Bovtun , M. Kempa , M. Savinov , C. Elissalde , U-C. Chung , D. Michau , M. Maglione , C. Estournes

Scanning X-ray nanodiffraction microscopy is a powerful technique for spatially resolving nanoscale structural morphologies by diffraction contrast. One of the critical challenges in experimental nanodiffraction data analysis is posed by…

Applied Physics · Physics 2024-06-26 Aileen Luo , Tao Zhou , Martin V. Holt , Andrej Singer , Mathew J. Cherukara

4D-STEM-based orientation and phase mapping has enabled rapid microstructure quantification that can be directly combined with standard TEM- and STEM-based imaging modes. Typically, orientation mapping is coupled with beam precession (i.e.…

Materials Science · Physics 2026-04-01 Yichen Yang , Olivier Pierron , Josh Kacher , David Rowenhorst

A triple-GEM detector with two-dimensional readout is developed. The detector provides high position resolution for powder diffraction experiments at synchrotron radiation. Spatial resolution of the detector is measured in the lab using a…

Instrumentation and Detectors · Physics 2017-04-12 Y. L. Zhang , H. R. Qi , Z. W. Wen , H. Y. Wang , Q. Ouyang , Y. B. Chen , J. Zhang , B. T. Hu

Determining the 3-dimensional crystallography of a material with sub-nanometre resolution is essential to understanding strain effects in epitaxial thin films. A new scanning transmission electron microscopy imaging technique is…

The propagation of high-energy electrons in crystals is in general a complicated multiple scattering problem. However, along high-symmetry zone axes the problem can be mapped to the time evolution of a two-dimensional (2D) molecular system.…

Materials Science · Physics 2012-12-07 Robert Hovden , Huolin L. Xin , David A. Muller

Direct observation of organic molecular nanocrystals and their evolution using electron microscopy is extremely challenging, due to their radiation sensitivity and complex structure. Here, we introduce 4D-scanning confocal electron…

Materials Science · Physics 2022-06-15 Mingjian Wu , Christina Harreiss , Colin Ophus , Erdmann Spiecker

Microstructure characterisation has been greatly enhanced through the use of electron backscatter diffraction (EBSD), where rich maps are generated through analysis of the crystal phase and orientation in the scanning electron microscope…

Materials Science · Physics 2018-11-15 Vivian S Tong , Alexander J Knowles , David Dye , T Ben Britton

Efficient imaging of biomolecules, 2D materials and electromagnetic fields depends on retrieval of the phase of transmitted electrons. We demonstrate a method to measure phase in a scanning transmission electron microscope using a…

In the scanning transmission electron microscope, both phase imaging of beam-sensitive materials and characterisation of a material's functional properties using in-situ experiments are becoming more widely available. As the practicable…

Materials Science · Physics 2024-09-20 Julie Marie Bekkevold , Jonathan J. P. Peters , Ryo Ishikawa , Naoya Shibata , Lewys Jones

The appearance of direct electron detectors marked a new era for electron diffraction. Their high sensitivity and low noise opens the possibility to extend electron diffraction from transmission electron microscopes (TEM) to lower energies…

Applied Physics · Physics 2025-02-18 Nikita Denisov , Andrey Orekhov , Johan Verbeeck

Functional devices with ultrathin ferroelectric layers have been attracted as a promising candidate for next-generation memory and logic device applications. Using the ultrathin ferroelectric layers, particularly approaching the…

Precession of a converged beam during acquisition of a 4D-STEM dataset improves strain, orientation, and phase mapping accuracy by averaging over continuous angles of illumination. Precession experiments usually rely on integrated systems,…

Instrumentation and Detectors · Physics 2025-10-20 Stephanie M. Ribet , Rohan Dhall , Colin Ophus , Karen C. Bustillo

Dynamic scattering and imaging with coherent, ultrafast, extreme ultraviolet (EUV) light sources can resolve charge, phonon and spin processes on their intrinsic length and time scales. However, full field coherent diffraction imaging…

Doppler reflectometry spatial and wavenumber resolution is analyzed within the framework of the linear Born approximation in slab plasma model. Explicit expression for its signal backscattering spectrum is obtained in terms of wavenumber…

Plasma Physics · Physics 2007-05-23 Alexander Surkov , Evgeniy Gusakov

In photon upconverting core-shell nanoparticles, structure strongly dictates performance. Conventional imaging in scanning transmission electron microscopy has sufficient resolution to probe the atomic structure of these nanoparticles, but…

X-ray ptychography is one of the versatile techniques for nanometer resolution imaging. The magnitude of the diffraction patterns is recorded on a detector and the phase of the diffraction patterns is estimated using phase retrieval…

Image and Video Processing · Electrical Eng. & Systems 2021-05-21 Prasan Shedligeri , Florian Schiffers , Semih Barutcu , Pablo Ruiz , Aggelos K Katsaggelos , Oliver Cossairt