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Through a simulation-based study we develop a statistical model-based quantification method for atomic resolution first moment scanning transmission electron microscopy (STEM) images. This method uses the uniformly weighted least squares…

Materials Science · Physics 2024-08-06 Yansong Hao , Annick De Backer , Scott David Findlay , Sandra Van Aert

Significant progress has been made in spatial resolution using environmental transmission electron microscopes (ETEM), which now enables atomic resolution visualization of structural transformation under variable temperature and gas…

Materials Science · Physics 2015-06-18 Wenpei Gao , Jianbo Wu , Xiaofeng Zhang , Aram Yoon , J. Mabon , W. Swiech , W. L. Wilson , H. Yang , Jian-Min Zuo

State-of-the-art electron microscopes such as scanning electron microscopes (SEM), scanning transmission electron microscopes (STEM) and transmission electron microscopes (TEM) have become increasingly sophisticated. However, the quality of…

Computational Physics · Physics 2023-03-31 I. Lobato , T. Friedrich , S. Van Aert

Aberration-corrected scanning electron microscopy (AC-STEM) can provide valuable information on the atomic structure of nanoclusters, an essential input for gaining an understanding of their physical and chemical properties. A systematic…

Materials Science · Physics 2021-05-11 Kusse S. Bersha , Alejandro Peña-Torres , Hannes Jónsson

The thousandfold increase in data-collection speed enabled by aberration-corrected optics allows us to overcome an electron microscopy paradox - how to obtain atomic-resolution chemical structure in individual nanoparticles, yet record a…

The applications of machine learning techniques to chemistry and materials science become more numerous by the day. The main challenge is to devise representations of atomic systems that are at the same time complete and concise, so as to…

Chemical Physics · Physics 2025-10-06 Michael J. Willatt , Felix Musil , Michele Ceriotti

Heterogeneous gas and solid catalyst reactions occur at the atomic level, and understanding and controlling complex catalytic reactions at this level is crucial for the development of improved processes and materials. There are postulations…

Chemical Physics · Physics 2017-05-19 Edward Boyes , Pratibha Gai

Scanning tunneling microscopy (STM) has been a fundamental tool to characterize many-body effects in condensed matter systems, from extended solids to quantum dots. STM of molecules decoupled from the supporting conductive substrate has the…

Mesoscale and Nanoscale Physics · Physics 2011-01-14 Dimitrios Toroz , Massimo Rontani , Stefano Corni

The atomic number contrast imaging technique reveals an increase in intensity at interfaces of a high and low-density material in case of relatively thick samples. Elastic scattering factors and absorption coefficients are incorporated in a…

Computational Physics · Physics 2019-12-25 Aniruddha Dutta , Helge Heinrich

In this paper, we demonstrate that atom probe tomography (APT) can be applied to small-molecule organic materials. We show that APT can provide an unprecedented combination of mass resolution of $\lt 1~\mathrm{Da}$, spatial resolution of…

Scanning transmission electron microscopy (STEM) has become the technique of choice for quantitative characterization of atomic structure of materials, where the minute displacements of atomic columns from high-symmetry positions can be…

Materials Science · Physics 2021-10-05 Kevin M. Roccapriore , Nicole Creange , Maxim Ziatdinov , Sergei V. Kalinin

In the domain of battery research, the processing of high-resolution microscopy images is a challenging task, as it involves dealing with complex images and requires a prior understanding of the components involved. The utilization of deep…

Computer Vision and Pattern Recognition · Computer Science 2025-03-19 Ganesh Raghavendran , Bing Han , Fortune Adekogbe , Shuang Bai , Bingyu Lu , William Wu , Minghao Zhang , Ying Shirley Meng

The motion of electrons in or near solids, liquids and gases can be tracked by forcing their ejection with attosecond x-ray pulses, derived from femtosecond lasers. The momentum of these emitted electrons carries the imprint of the…

Mesoscale and Nanoscale Physics · Physics 2017-06-14 C. W. Barlow-Myers , N. J. Pine , W. A. Bryan

Frequency modulation (FM) Atomic Force Microscopy (AFM) with metal tips functionalized with a CO molecule at the tip apex has provided access to the internal structure of molecules with totally unprecedented resolution. We propose a model…

Materials Science · Physics 2022-05-03 Jaime Carracedo-Cosme , Rubén Pérez

Heterogeneous catalysts are the most important catalysts in industrial reactions. Nanocatalysts, with size ranging from hundreds of nanometers to the atomic scale, possess activities that are closely connected to their structural…

Materials Science · Physics 2018-06-13 Yong Zhu , Mingquan Xu , Wu Zhou

Next-generation cryogenic transmission electron microscopes (TEM) aim to achieve high-resolution imaging at ultracold sample temperatures (< 90 K) and over extended hold times. Lower temperatures enable atomic-scale characterization with…

Careful extrapolation of atomic correlation energies suggests that $E_c$ tends to $-AZ\log{Z} + BZ$ as $Z$ tends to infinity, where $Z$ is the atomic number, $A$ is known, and $B$ is about 38 milliHartrees. The coefficients roughly agree…

Materials Science · Physics 2014-09-18 Kieron Burke , Antonio Cancio , Tim Gould , Stefano Pittalis

Scanning Transmission Electron Microscopy (STEM) has become the main stay for materials characterization on atomic level, with applications ranging from visualization of localized and extended defects to mapping order parameter fields. In…

Instrumentation and Detectors · Physics 2019-01-15 Xin Li , Ondrej Dyck , Sergei V. Kalinin , Stephen Jesse

The coupling of an electron monochromator (EM) to a mass spectrometer (MS) has created a new analytical technique, EM-MS, for the investigation of electrophilic compounds. This method provides a powerful tool for molecular identification of…

The distinction between point and line resolution in transmission electron microscopy (TEM) arises because an ability to image sub-0.2 nm fringes is a necessary, but not a sufficient, condition for imaging individual atoms. In scanned tip…

Instrumentation and Detectors · Physics 2007-05-23 P. Fraundorf , J. Tentschert