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The simulation of transmission electron microscopy (TEM) images or diffraction patterns is often required to interpret their contrast and extract specimen features. This is especially true for high-resolution phase-contrast imaging of…

Materials Science · Physics 2021-03-30 Jacob Madsen , Timothy J. Pennycook , Toma Susi

Scanning transmission electron microscopy (STEM) has advanced rapidly in the last decade thanks to the ability to correct the major aberrations of the probe forming lens. Now atomic-sized beams are routine, even at accelerating voltages as…

Here we explore the atomic number ($Z$) dependence of multislice electron ptychography and approaches to optimize Z sensitivity. Specifically, we show that ptychography's $Z$-dependence is highly dependent on the integrated area of an atom…

Materials Science · Physics 2025-06-12 Bridget R. Denzer , Colin Gilgenbach , James M. LeBeau

Environmental transmission electron microscopy (E-TEM) enables direct observation of nanoscale chemical processes crucial for catalysis and materials design. However, the high-energy electron probe can dramatically alter reaction pathways…

Recent advances in scanning transmission electron and scanning tunneling microscopies allow researchers to measure materials structural and electronic properties, such as atomic displacements and charge density modulations, at an Angstrom…

It has been argued that in atomic-resolution transmission electron microscopy (TEM) of sparse weakly scattering structures, such as small biological molecules, multiple electron scattering usually has only a small effect, while the…

Optics · Physics 2021-11-16 T. E. Gureyev , H. M. Quiney , A. Kozlov , D. M. Paganin , G. Schmalz , L. J. Allen

We develop the machine learning capability to predict a time sequence of in-situ transmission electron microscopy (TEM) video frames based on the combined long-short-term-memory (LSTM) algorithm and the features de-entanglement method. We…

Materials Science · Physics 2022-05-24 Wenkai Fu , Steven R. Spurgeon , Chongmin Wang , Yuyan Shao , Wei Wang , Amra Peles

Instrumentation developments in electron energy-loss spectroscopy (EELS) in the scanning transmission electron microscope (STEM) one decade ago paved the way for combining milli-electronvolt energy resolution in spectroscopy with…

Mesoscale and Nanoscale Physics · Physics 2024-10-15 Benedikt Haas , Christoph T. Koch , Peter Rez

The information content of atomic resolution scanning transmission electron microscopy (STEM) images can often be reduced to a handful of parameters describing each atomic column, chief amongst which is the column position. Neural networks…

Materials Science · Physics 2023-02-22 Jingrui Wei , Ben Blaiszik , Aristana Scourtas , Dane Morgan , Paul M. Voyles

Atomic resolution imaging is key to understanding thin film growth and how a particular set of conditions influences properties. Whilst such imaging in the scanning transmission electron microscope (STEM) has had transformative impact in…

Understanding the interplay between the structure, composition and opto-electronic properties of semiconductor nano-objects requires combining transmission electron microscopy (TEM) based techniques with electrical and optical measurements…

Sub-micrometer scale light patterns play a pivotal role in various fields, including biology, biophysics, and AMO physics. High-resolution, in situ observation of light profiles is essential for their design and application. However,…

It has been a general trend to develop low-voltage electron microscopes due to their high imaging contrast of the sample and low radiation damage. Atom-resolved transmission electron microscopes with voltages as low as 15-40 kV have been…

Instrumentation and Detectors · Physics 2015-12-29 Wei-Tse Chang , Chun-Yueh Lin , Wei-Hao Hsu , Mu-Tung Chang , Yi-Sheng Chen , En-Te Hwu , Ing-Shouh Hwang

The optical properties of molecules close to plasmonic nanostructures greatly differ from their isolated molecule counterparts. To theoretically investigate such systems in a Quantum Chemistry perspective, one has to take into account that…

Mesoscale and Nanoscale Physics · Physics 2016-12-26 Silvio Pipolo , Stefano Corni

We recast the Howie-Whelan equations for generating simulated transmission electron microscope (TEM) images, replacing the dependence on local atomic displacements with atomic positions only. This allows very rapid computation of simulated…

Materials Science · Physics 2024-09-04 D. R. Mason , M. Boleininger , J. Haley , E. Prestat , G. He , F. Hofmann , S. L. Dudarev

Electron energy-loss spectroscopy (EELS) can measure similar information to X-ray, UV-Vis, and IR spectroscopies but with atomic resolution and increased scattering cross sections. Recent advances in electron monochromators have expanded…

Chemical Physics · Physics 2024-04-26 Ye-Jin Kim , Levi D. Palmer , Wonseok Lee , Nicholas J. Heller , Scott K. Cushing

Low-electron-dose observation is indispensable for observing various samples using a transmission electron microscope; consequently, image processing has been used to improve transmission electron microscopy (TEM) images. To apply such…

Image and Video Processing · Electrical Eng. & Systems 2022-03-02 Hiroyasu Katsuno , Yuki Kimura , Tomoya Yamazaki , Ichigaku Takigawa

Scientists use imaging to identify objects of interest and infer properties of these objects. The locations of these objects are often measured with error, which when ignored leads to biased parameter estimates and inflated variance.…

Accurate determination of three-dimensional (3D) atomic structures is crucial for understanding and controlling the properties of nanomaterials. Atomic electron tomography (AET) offers non-destructive atomic imaging with picometer-level…

Materials Science · Physics 2025-06-23 Juhyeok Lee , Yongsoo Yang

Accurate molecular imaging via high-order harmonic generation relies on comparing the harmonic emission from a molecule and an adequate reference system. However, an ideal reference atom with the same ionization properties as the molecule…

Atomic Physics · Physics 2015-05-28 Elmar V. van der Zwan , Manfred Lein