Related papers: Development and characterization of a dispersion-e…
The measurement of very low reflection coefficients of anti-reflective coated interfaces has become a key issue for the realization of precision instruments such as the giant interferometers used for the detection of gravitational waves. We…
A simple method was developed to observe the interference patterns of the light reflected by the interfaces of thin liquid films. Employing a fluorescent microscope with epi-illumination, we collected the 2D patterns of interference fringes…
Thin film interferometry is a powerful technique for non-invasively measuring liquid film thickness with applications in ophthalmology, but its clinical translation is hindered by the challenges in reconstructing thickness profiles from…
Measuring the dispersion of photonic devices with small dispersion-length products is challenging due to the phase-sensitive, and alignment-intensive nature of conventional methods. In this letter, we demonstrate a quantum technique to…
We describe a method of low-coherence interferometry based optical profilometry using standard light-emitting diode (LED) illumination and complementary metal-oxide-semiconductor (CMOS) image sensors. A line-field illumination strategy…
In this paper, we show how the combined use of low coherence interferometry, balanced detection and data processing comparable to that used in Fourier transform spectrometry allows us to characterize with ultimate resolutions (sub-ppm in…
We present a new imaging technique, swept-angle synthetic wavelength interferometry, for full-field micron-scale 3D sensing. As in conventional synthetic wavelength interferometry, our technique uses light consisting of two…
An interferometer has been used to measure the surface profile of generic object. Frequency scanning interferometry has been employed to provide unambiguous phase readings, to suppress etalon fringes, and to supersede phase-shifting. The…
Dynamic thin film interferometry is a technique used to non-invasively characterize the thickness of thin liquid films. Recovering the underlying thickness from the captured interferograms, unconditionally and automatically is still an open…
The paper report new results of chromatic dispersion in Photonic Crystal Fibers (PCFs) through appropriate designing of index-guiding triangular-lattice structure devised, with a selective infiltration of only the first air-hole ring with…
In semiconductor manufacturing processes, silicon dioxide films are commonly used as barrier layers, insulating layers, and protective layers. Coherence scanning interferometry (CSI) offers thin film thickness measurements with a…
This paper describes a 561 nm laser heterodyne interferometer that provides time-resolved measurements of line-integrated plasma electron density within the range of 10^15-10^18 cm^(-2). Such plasmas are produced by railguns on the Plasma…
A radio interferometer indirectly measures the intensity distribution of the sky over the celestial sphere. Since measurements are made over an irregularly sampled Fourier plane, synthesising an intensity image from interferometric…
Terahertz imaging holds great potential for non-destructive material inspection, but practical implementation has been limited by resolution constraints. In this study, we present a single-pixel THz imaging system based on a confocal…
Emerging high-frequency accelerator technology in the terahertz regime is promising for the development of compact high-brightness accelerators and high resolution-power beam diagnostics. One resounding challenge when scaling to higher…
We describe a high-speed interferometric method, using multiple angles of incidence and multiple wavelengths, to measure the absolute thickness, tilt, the local angle between the surfaces, and the refractive index of a fluctuating…
Compressive imaging is an emerging application of compressed sensing, devoted to acquisition, encoding and reconstruction of images using random projections as measurements. In this paper we propose a novel method to provide a scalable…
This work concerns the development of a 3D measuring system able to realize noncontact surface topography with millimetric depth-range and micrometric resolutions both in the spatial and depth axes. The optical concept is based on the well…
The optical elements comprised of sub-diffractive light scatterers, or metasurfaces, hold a promise to reduce the footprint and unfold new functionalities of optical devices. A particular interest is focused on metasurfaces for manipulation…
A new approach was proposed to accurately determine the thickness of film, especially for ultra-thin film, through spectrum fitting with the assistance of interference layer. The determination limit can reach even less than 1 nm. Its…