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We show that diffraction intensity into the First Order Laue Zone (FOLZ) of a crystal can have a strong azimuthal dependence, where this FOLZ ring appears solely because of unidirectional atom position modulation. Such a modulation was…

Materials Science · Physics 2023-10-03 Aurys Silinga , Christopher S. Allen , Juri Barthel , Colin Ophus , Ian MacLaren

Compact direct electron detectors are becoming increasingly popular in electron microscopy applications including electron backscatter diffraction, as they offer an opportunity for low cost and accessible microstructural analysis. In this…

Materials Science · Physics 2025-10-17 Tianbi Zhang , Ruth Birch , Graeme Francolini , Ebru Karakurt Uluscu , Ben Britton

4D-STEM, in which the 2D diffraction plane is captured for each 2D scan position in the scanning transmission electron microscope (STEM) using a pixelated detector, is complementing and increasingly replacing existing imaging approaches.…

Instrumentation and Detectors · Physics 2022-07-27 Colum M. O'Leary , Benedikt Haas , Christoph T. Koch , Peter D. Nellist , Lewys Jones

In materials science and particularly electron microscopy, Electron Back-scatter Diffraction (EBSD) is a common and powerful mapping technique for collecting local crystallographic data at the sub-micron scale. The quality of the…

Computer Vision and Pattern Recognition · Computer Science 2019-03-08 Florian Strub , Marie-Agathe Charpagne , Tresa M. Pollock

Diffraction analysis in four dimensional scanning transmission electron microscopy now enables the mapping of local structures including symmetry, strain, and polarization of materials. However, measuring the distribution of these…

Materials Science · Physics 2024-06-19 Tim B. Eldred , Jacob G. Smith , Wenpei Gao

Accurately determining the crystallographic structure of a material, organic or inorganic, is a critical primary step in material development and analysis. The most common practices involve analysis of diffraction patterns produced in…

An approach for the crystallographic mapping of two-phase alloys on the nanoscale using a combination of scanned precession electron diffraction and open-source python libraries is introduced in this paper. This method is demonstrated using…

Materials Science · Physics 2024-02-05 Ian MacLaren , Enrique Frutos-Myro , Steven Zeltmann , Colin Ophus

Electron backscatter diffraction is a widely used technique for nano- to micro-scale analysis of crystal structure and orientation. Backscatter patterns produced by an alloy solid solution matrix and its ordered superlattice exhibit only…

Materials Science · Physics 2020-10-13 Thomas P McAuliffe , David Dye , T Ben Britton

Atomic resolution imaging in transmission electron microscopy (TEM) and scanning TEM (STEM) of light elements in electron-transparent materials has long been a challenge. Biomolecular materials, for example, are rapidly altered when…

Instrumentation and Detectors · Physics 2018-12-05 Fehmi S. Yasin , Tyler R. Harvey , Jordan J. Chess , Jordan S. Pierce , Colin Ophus , Peter Ercius , Benjamin J. McMorran

A real-time image reconstruction method for scanning transmission electron microscopy (STEM) is proposed. With an algorithm requiring only the center of mass (COM) of the diffraction pattern at one probe position at a time, it is able to…

Materials Science · Physics 2021-12-15 Chu-Ping Yu , Thomas Friedrich , Daen Jannis , Sandra Van Aert , Johan Verbeeck

Advancements in fast electron detectors have enabled the statistically significant sampling of crystal structures on the nanometre scale by means of Scanning Electron Nanobeam Diffraction (SEND). Characterisation of structural similarity…

Materials Science · Physics 2022-07-28 Andy Bridger , William I. F. David , Thomas J. Wood , Mohsen Danaie , Keith T. Butler

Automated experimentation with real time data analysis in scanning transmission electron microscopy (STEM) often require end-to-end framework. The four-dimensional scanning transmission electron microscopy (4D-STEM) with high-throughput…

Computer Vision and Pattern Recognition · Computer Science 2025-08-26 Mingyu Liu , Zian Mao , Zhu Liu , Haoran Zhang , Jintao Guo , Xiaoya He , Xi Huang , Shufen Chu , Chun Cheng , Jun Ding , Yujun Xie

Four-dimensional Scanning Transmission Electron Microscopy (4D-STEM) is a powerful technique for high-resolution and high-precision materials characterization at multiple length scales, including the characterization of beam-sensitive…

Applied Physics · Physics 2023-08-11 Hsu-Chih Ni , Renliang Yuan , Jiong Zhang , Jian-Min Zuo

Ultrafast nanocrystallography has the potential to revolutionize biology by enabling structural elucidation of proteins for which it is possible to grow crystals with 10 or fewer unit cells on the side. The success of nanocrystallography…

Optics · Physics 2012-09-24 F. R. N. C. Maia , C. Yang , S. Marchesini

Addressing the need for efficient and integrated multiscale crystallographic and defect analyses of advanced materials, this paper presents the implementation of a new multi-configuration detection system, integrating a single…

Instrumentation and Detectors · Physics 2026-05-19 Nohayla El-Khairaoui , Julien Guyon , Nathalie Gey , Luc Morhain , Nabila Maloufi

We present a few recent developments in the field of electron backscatter diffraction (EBSD). We highlight how open source algorithms and open data formats can be used to rapidly to develop microstructural insight of materials. We include…

Computational Physics · Physics 2019-08-15 Alex Foden , Alessandro Previero , Thomas Benjamin Britton

Atomic resolution imaging is key to understanding thin film growth and how a particular set of conditions influences properties. Whilst such imaging in the scanning transmission electron microscope (STEM) has had transformative impact in…

Chemomechanical interactions in gas or liquid environments are crucial for the functionality and longevity of various materials used in sustainable energy technologies, such as rechargeable batteries, water-splitting catalysts, and…

Characterizing crystal structures and interfaces down to the atomic level is an important step for designing advanced materials. Modern electron microscopy routinely achieves atomic resolution and is capable to resolve complex arrangements…

Materials Science · Physics 2023-09-07 Andreas Leitherer , Byung Chul Yeo , Christian H. Liebscher , Luca M. Ghiringhelli

The recently developed information-theoretic approach to crystallographic symmetry classifications and quantifications in two dimensions (2D) from digital transmission electron and scanning probe microscope images is adapted for the…

Materials Science · Physics 2022-02-15 Peter Moeck , Lukas von Koch