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The influence of edge roughness in angle resolved scatterometry at periodically structured surfaces is investigated. A good description of the radiation interaction with structured surfaces is crucial for the understanding of optical…

Optics · Physics 2012-09-11 A. Kato , S. Burger , F. Scholze

A flexible apparatus for calibration of the absolute flux at the focal plane of the X-ray Source of a Powder Diffractometer, based on a fast scintillator counter, is presented. The measured fluxes, depending on the high voltage on the X-ray…

Instrumentation and Detectors · Physics 2020-08-27 Emmanuel Fokitis , Theodoros Geralis , Stavros Maltezos , Nikolaos Vodinas

A new method for identifying crystalline phases in X-ray diffraction data has been proposed, which is especially useful for the study of multiphase materials (more than eight - ten phases) with a relatively low content (less than 1 - 3…

Materials Science · Physics 2021-08-17 A. D. Skorbun , S. V. Gabielkov , I. V. Zhyganiuk

Spreading uniform and dense layers is of paramount importance to creating high-quality components using powder bed additive manufacturing (AM). Blade-like tools are often employed for spreading powder metal feedstocks, especially in laser…

We propose an application of the Angular X-ray Cross-Correlation Analysis (AXCCA) to the scattered intensity distribution measured in three-dimensional (3D) reciprocal space from a single crystalline sample. Contrary to the conventional…

Mesoscale and Nanoscale Physics · Physics 2022-02-18 Dmitry Lapkin , Anatoly Shabalin , Janne-Mieke Meijer , Ruslan Kurta , Michael Sprung , Andrei V. Petukhov , Ivan A. Vartanyants

Powder X-ray diffraction (pXRD) experiments are a cornerstone for materials structure characterization. Despite their widespread application, analyzing pXRD diffractograms still presents a significant challenge to automation and a…

In conventional x-ray ptychography, diffraction data is collected by scanning a sample through a monochromatic, and spatially coherent, x-ray beam. A high-resolution image is then retrieved using an iterative algorithm. Combined with a scan…

Optics · Physics 2025-08-26 Wiebe Stolp , Silvia Cipiccia , Darren Batey , Matthieu Boone

A method for estimating the relative content of crystalline phases of a multiphase sample, based on probabilistic analysis of the intensities of the diffraction pattern reflexes, has been developed. The method is based on the introduction…

Materials Science · Physics 2023-11-21 S. V. Gabielkov , I. V. Zhyganiuk , A. D. Skorbun

Grazing incidence fast atom diffraction (GIFAD, or FAD) has developed as a surface sensitive technique. GIFAD is less sensitive to thermal decoherence but more demanding in terms of surface coherence, the mean distance between defects. Such…

Atomic Physics · Physics 2016-09-21 Maxime Debiossac , Philippe Roncin

We demonstrate that powder diffraction data can be collected from sub-micron crystals of a mbrane protein with nearly two orders of magnitude more atoms than the molecules commonly used for powder diffraction. The crystals of photosystem-1…

A novel method and experimental configuration are proposed that allow the collection of high-quality X-ray absorption spectroscopy (XAS) data in transmission mode on a standard laboratory diffractometer. This configuration makes use of…

Instrumentation and Detectors · Physics 2025-09-23 Milen Gateshki , Charalampos Zarkadas , Detlef Beckers

High-accuracy dimensional measurements by laser interferometers require corrections because of diffraction, which makes the effective fringe-period different from the wavelength of a plane (or spherical) wave $\lambda_0$. By using a…

Optics · Physics 2016-04-20 Carlo Paolo Sasso , Enrico Massa , Giovanni Mana

Area detectors are used in many scientific and technological applications such as particle and radiation physics. Thanks to the recent technological developments, the radiation sources are becoming increasingly brighter and the detectors…

Instrumentation and Detectors · Physics 2011-04-27 Taha Sochi

Photons preferentially Compton scatter perpendicular to the plane of polarisation. This property can be exploited to design instruments to measure the linear polarisation of hard X-rays ($\sim$10 - 100 keV). Photons may undergo two…

Instrumentation and Detectors · Physics 2023-01-25 Ettore Del Monte , Sergio Fabiani , Mark Pearce

X-ray diffraction with high spatial resolution is commonly used to characterize (poly-)crystalline samples with, for example, respect to local strain, residual stress, grain boundaries and texture. However, the investigation of highly…

We demonstrate a smart laser-diffraction analysis technique for particle mixture identification. We retrieve information about the size, geometry, and ratio concentration of two-component heterogeneous particle mixtures with an efficiency…

Image and Video Processing · Electrical Eng. & Systems 2022-02-03 Arturo Villegas , Mario A. Quiroz-Juarez , Alfred U'Ren , Juan P. Torres , Roberto de J. Leon-Montiel

When used with coherent light, optical imaging systems, even diffraction-limited, are inherently unable to reproduce both the amplitude and the phase of a two-dimensional field distribution because their impulse response function varies…

Optics · Physics 2009-11-13 E. Brainis , C. Muldoon , L. Brandt , A. Kuhn

X-ray speckles have been used for a wide variety of experiments, ranging from imaging (and tomography), wavefront sensing, spatial coherence measurements all the way to x-ray photon correlation spectroscopy (XPCS) and ptychography. In the…

Medical Physics · Physics 2024-04-19 Rafael Celestre , Laurene Quenot , Christopher Ninham , Emmanuel Brun , Luca Fardin

Scattering and absorption of X-rays by interstellar dust is calculated for a model consisting of carbonaceous grains and amorphous silicate grains. The calculations employ realistic dielectric functions with structure near X-ray absorption…

Astrophysics · Physics 2009-11-10 B. T. Draine

Coherent X-ray diffraction microscopy is a method of imaging non-periodic isolated objects at resolutions only limited, in principle, by the largest scattering angles recorded. We demonstrate X-ray diffraction imaging with high resolution…