Related papers: X-ray ptychographic topography, a new tool for str…
In this work, we present and investigate the novel blind inverse problem of position-blind ptychography, i.e., ptychographic phase retrieval without any knowledge of scan positions, which then must be recovered jointly with the image. The…
Image reconstruction in X ray tomography consists in determining an object from its projections. In many applications such as non destructive testing, we look for an image who has a constant value inside a region (default) and another…
Here a new microscopic method is proposed to image and characterize very thin samples like few-layer materials, organic molecules, and nanostructures with nanometer or sub-nanometer resolution using electron beams of energies lower than 20…
Polarimetry is widely considered a powerful observational technique in X-ray astronomy, useful to enhance our understanding of the emission mechanisms, geometry and magnetic field arrangement of many compact objects. However, the lack of…
Conventional X-ray methods use incoming plane waves and result in discrete diffraction patterns when scattered at crystals. Here we find, by a systematic method, incoming waveforms which exhibit discrete diffraction patterns when scattered…
Lattice defects play a key role in determining the properties of crystalline materials. Probing the 3D lattice strains that govern their interactions remains a challenge. Bragg Coherent Diffraction Imaging (BCDI) allows strain to be…
X-ray ptychography is one of the versatile techniques for nanometer resolution imaging. The magnitude of the diffraction patterns is recorded on a detector and the phase of the diffraction patterns is estimated using phase retrieval…
This review presents the state of the art in strain and ripple-induced effects on the electronic and optical properties of graphene. It starts by providing the crystallographic description of mechanical deformations, as well as the…
Strain is attracting much interest as a mean to tune the properties of thin exfoliated two-dimensional materials and their heterostructures. Numerous devices to apply tunable uniaxial strain are proposed in the literature, but only few for…
X-ray echo spectroscopy, a space-domain counterpart of neutron spin echo, is a recently proposed inelastic x-ray scattering (IXS) technique. X-ray echo spectroscopy relies on imaging IXS spectra, and does not require x-ray…
The experimental observations of many interaction-driven electronic phases in moir\'e superlattices have stimulated intense theoretical and experimental efforts to understand and engineer these correlated physics. Strain is a powerful tool…
Investigating the structure of matter at the nanoscale non destructively is a key capability enabled by X-ray imaging. One of the most powerful nano-imaging methods is X-ray ptychography, a coherent diffraction imaging technique that has…
Spatially resolved strain measurements are crucial to understanding the properties of engineering materials. Although strain measurements utilizing techniques such as transmission electron microscopy and electron backscatter diffraction…
Material decomposition in X-ray imaging uses the energy-dependence of attenuation to virtually decompose an object into specific constituent materials. X-ray phase contrast imaging is a developing technique that can enhance image contrast…
The measurement of the Si lattice parameter by x-ray interferometry assumes the use of strain-free crystals, which might not be true because of intrinsic stresses due to surface relaxation, reconstruction, and oxidation. We used x-ray…
A new method for identifying crystalline phases in X-ray diffraction data has been proposed, which is especially useful for the study of multiphase materials (more than eight - ten phases) with a relatively low content (less than 1 - 3…
Ptychography enables coherent diffractive imaging (CDI) of extended samples by raster scanning across the illuminating XUV/X-ray beam thereby generalizing the unique advantages of CDI techniques. Table-top realizations of this method are…
This paper introduces a three-dimensional (3-D) mathematical and computational framework for the characterization of crack-tip fields in star-shaped cracks within porous elastic solids. A core emphasis of this model is its direct…
Atomic-scale characterization of spin textures in solids is essential for understanding and tuning properties of magnetic materials and devices. While high-energy electrons are employed for atomic-scale imaging of materials, they are…
Ptychographic Coherent Diffractive Imaging enables diffraction-limited imaging of nanoscale structures at extreme ultraviolet and x-ray wavelengths, where high-quality image-forming optics are not available. However, its reliance on a set…