Related papers: X-ray ptychographic topography, a new tool for str…
In many tomographic imaging problems the data consist of integrals along lines or curves. Increasingly we encounter "rich tomography" problems where the quantity imaged is higher dimensional than a scalar per voxel, including vectors…
Dark-field X-ray microscopy is a new full-field imaging technique that nondestructively maps the structure and local strain inside deeply embedded crystalline elements in three dimensions. Placing an objective lens in the diffracted beam…
Virtual histology is an emerging field in biomedicine that enables three-dimensional tissue visualization using X-ray micro-computed tomography. However, the method still lacks the specificity of conventional histology, in which parts of…
Progress in spintronics has been aided by characterization tools tailored to certain archetypical materials. New device structures and materials will require characterization tools that are material independent, provide sufficient…
Phase-contrast and dark-field imaging are relatively new X-ray imaging modalities that provide additional information to conventional attenuation-based imaging. However, this new information comes at the price of a more complex acquisition…
Ptychography is a computational imaging technique that has risen in popularity in the x-ray and electron microscopy communities in the past half decade. One of the reasons for this success is the development of new high performance electron…
Functional properties of ferroelectric thin films are governed by domains that can be engineered by epitaxial strain. Soft X-ray microscopy can image domain structures with elemental and electronic sensitivity, but hitherto its application…
Dark-field X-ray imaging visualizes structural inhomogeneities through small-angle scattering, but existing directional methods are confined to the micrometer scale. While recent advances have extended dark-field capabilities to nanoscale…
We present an optical metrology system for characterization of topography of micro/nano-structures on a surface or embedded in a semi-transparent material. Based on the principles of scatterometry, where the intensity of scattered light is…
X-ray crystallography (XC) is an experimental technique used to determine three-dimensional crystalline structures. The acquired data in XC, called diffraction patterns, is the Fourier magnitudes of the unknown crystalline structure. To…
Optical fiber technologies enable high-speed communication, medical imaging, and advanced sensing. Among the techniques for the characterization of optical fibers, Xray computed tomography has recently emerged as a versatile non-destructive…
Off-axis X-ray holography is a lensless imaging technique that allows unambiguous retrieval of an object's exit-wave function with high fidelity. It has been used with great success to study nanoscale phenomena and spatio-temporal dynamics…
A spectrograph is an optical instrument that disperses photons of different energies into distinct directions and space locations, and images photon spectra on a position-sensitive detector. Spectrographs consist of collimating, angular…
Ptychography is a data-intensive computational imaging technique that achieves high spatial resolution over large fields of view. The technique involves scanning a coherent beam across overlapping regions and recording diffraction patterns.…
X-ray echo spectroscopy, a counterpart of neutron spin-echo, is being introduced here to overcome limitations in spectral resolution and weak signals of the traditional inelastic x-ray scattering (IXS) probes. An image of a point-like x-ray…
The penetration power of x-rays allows one to image large objects. For example, centimeter-sized specimens can be imaged with micron-level resolution using synchrotron sources. In this case, however, the limited beam diameter and detector…
Strain-engineering of materials encompasses significant elastic deformation and leads to breaking of the lattice symmetry and as a consequence to the emergence of optical anisotropy. However, the capability to image and map local strain…
X-ray tomographic image reconstruction consists of determining an object function from its projections. In many applications such as non-destructive testing, we look for a fault region (air) in a homogeneous, known background (metal). The…
Reflective ptychography is a promising lensless imaging technique with a wide field of view, offering significant potential for applications in semiconductor manufacturing and detection. However, many semiconductor materials are coated with…
Solid-phase epitaxy (SPE) and other three-dimensional epitaxial crystallization processes pose challenging structural and chemical characterization problems. The concentration of defects, the spatial distribution of elastic strain, and the…