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When a sample's X-ray diffraction pattern (XRD) is measured, the corresponding crystal structure is usually determined by searching for similar XRD patterns in the database. However, if a similar XRD pattern is not found, it is tremendously…

Materials Science · Physics 2023-08-08 Joohwi Lee , Junpei Oba , Nobuko Ohba , Seiji Kajita

Structure-property relationships in ordered materials have long been a core principle in materials design. However, the intentional introduction of disorder into materials provides structural flexibility and thus access to material…

Analytical electron microscopy and spectroscopy of biological specimens, polymers, and other beam sensitive materials has been a challenging area due to irradiation damage. There is a pressing need to develop novel imaging and spectroscopic…

Machine Learning · Computer Science 2017-07-14 Yan Zhang , G. M. Dilshan Godaliyadda , Nicola Ferrier , Emine B. Gulsoy , Charles A. Bouman , Charudatta Phatak

Compact direct electron detectors are becoming increasingly popular in electron microscopy applications including electron backscatter diffraction, as they offer an opportunity for low cost and accessible microstructural analysis. In this…

Materials Science · Physics 2025-10-17 Tianbi Zhang , Ruth Birch , Graeme Francolini , Ebru Karakurt Uluscu , Ben Britton

Diffraction pattern analysis can be used to reveal the crystalline structure of materials, and this information is used to nano- and micro-structure of advanced engineering materials that enable modern life. For nano-structured materials…

Materials Science · Physics 2023-12-13 Tianbi Zhang , T. Ben Britton

Experimentally obtained X-ray diffraction (XRD) patterns can be difficult to solve, precluding the full characterization of materials, pharmaceuticals, and geological compounds. Herein, we propose a method based upon a multi-objective…

Materials Science · Physics 2024-07-09 Stefano Racioppi , Alberto Otero De la Roza , Samad Hajinazar , Eva Zurek

In this paper we discuss a method for nondestructive measurements of the longitudinal profile of sub-picosecond electron bunches for X-Ray Free Electron Lasers (XFELs). The method is based on the detection of the Coherent Synchrotron…

Accelerator Physics · Physics 2007-05-23 G. A. Geloni , E. L. Saldin , E. A. Schneidmiller , M. V. Yurkov

Crystal orientation and strain mapping of an individual curved and asymmetrical core-shell hetero-nanowire is performed based on transmission electron microscopy. It relies on a comprehensive analysis of scanning nanobeam electron…

Materials Science · Physics 2023-01-16 Serhii Kryvyi , Slawomir Kret , Piotr Wojnar

Three-dimensional X-ray diffraction (3DXRD) is shown to be feasible at the I12 Joint Engineering, Environmental and Processing (JEEP) beamline of Diamond Light Source. As a demonstration, a microstructually simple low-carbon ferritic steel…

Metasurfaces have attracted extensive interests due to their ability to locally manipulate optical parameters of light and easy integration to complex optical systems. Particularly, metasurfaces can provide a novel platform for splitting…

The advent of isolated and intense sub-femtosecond X-ray pulses enables tracking of quantummechanical motion of electrons in molecules and solids. The combination of X-ray spectroscopy and diffraction imaging is a powerful approach to…

Four-dimensional scanning transmission electron microscopy (4D-STEM) enables mapping of diffraction information with nanometer-scale spatial resolution, offering detailed insight into local structure, orientation, and strain. However, as…

Dynamic scattering and imaging with coherent, ultrafast, extreme ultraviolet (EUV) light sources can resolve charge, phonon and spin processes on their intrinsic length and time scales. However, full field coherent diffraction imaging…

In situ reflective high-energy electron diffraction (RHEED) is widely used to monitor the surface crystalline state during thin-film growth by molecular beam epitaxy (MBE) and pulsed laser deposition. With the recent development of machine…

A general theoretical approach based on the results of statistical optics is used for the analysis of the transverse coherence properties of 3-rd generation synchrotron sources and x-ray free-electron lasers (XFEL). Correlation properties…

Optics · Physics 2015-05-13 I. A. Vartanyants , A. Singer

Reflection high-energy electron diffraction (RHEED) is a powerful tool for characterizing crystal surface structures. However, the setup geometry leads to distorted and complicated patterns, which are not straightforward to link to the…

Materials Science · Physics 2022-08-25 Chong Liu , Kai Chang , Ke Zou

Contemporary machine learning requires training large neural networks on massive datasets and thus faces the challenges of high computational demands. Dataset distillation, as a recent emerging strategy, aims to compress real-world datasets…

Computer Vision and Pattern Recognition · Computer Science 2024-03-20 Peng Sun , Bei Shi , Daiwei Yu , Tao Lin

Over the last few decades, artificial intelligence research has made tremendous strides, but it still heavily relies on fixed datasets in stationary environments. Continual learning is a growing field of research that examines how AI…

Computer Vision and Pattern Recognition · Computer Science 2021-08-06 Minha Kim , Shahroz Tariq , Simon S. Woo

Single-particle cryo-electron microscopy (cryo-EM) has become a cornerstone of structural biology, enabling near-atomic resolution analysis of macromolecules through advanced computational methods. However, the development of cryo-EM…

Computer Vision and Pattern Recognition · Computer Science 2025-10-07 Runmin Jiang , Genpei Zhang , Yuntian Yang , Siqi Wu , Minhao Wu , Wanyue Feng , Yizhou Zhao , Xi Xiao , Xiao Wang , Tianyang Wang , Xingjian Li , Muyuan Chen , Min Xu

Electron backscatter diffraction (EBSD) has developed over the last few decades into a valuable crystallographic characterisation method for a wide range of sample types. Despite these advances, issues such as the complexity of sample…

Image and Video Processing · Electrical Eng. & Systems 2024-07-17 Zoë Broad , Alex W. Robinson , Jack Wells , Daniel Nicholls , Amirafshar Moshtaghpour , Angus I. Kirkland , Nigel D. Browning