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Powerful mid-infrared illumination combined with mechanical detection via force microscopy provides access to nanoscale spectroscopic imaging in Materials and Life Sciences. Photo-induced force microscopy (PiFM) employs pulsed illumination…

Optics · Physics 2025-09-09 Shohely Tasnim Anindo , Daniela Täuber , Christin David

We experimentally investigated the contrast mechanism of infrared photoinduced force microscopy (PiFM) for recording vibrational resonances. Extensive experiments have demonstrated that spectroscopic contrast in PiFM is mediated by…

Instrumentation and Detectors · Physics 2020-12-02 Mohammad A. Almajhadi , Syed Mohammad Ashab Uddin , H. Kumar Wickramasinghe

A nanoscopy technique that can characterize light-matter interactions with ever increasing spatial resolution and signal-to-noise ratio (SNR) is desired for spectroscopy at molecular levels. Photoinduced force microscopy (PiFM) with…

Applied Physics · Physics 2018-10-17 Mohsen Rajaei , Mohammad Ali Almajhadi , Jinwei Zeng , H. Kumar Wickramasinghe

Photoinduced force microscopy (PiFM) enables nanoscale visualization of optical responses by directly detecting photoinduced forces without relying on luminescence. In molecular assemblies, intermolecular polarization coupling can generate…

Optics · Physics 2026-05-21 Masayoshi Fujii , Mamoru Tamura , Hidemasa Yamane , Hajime Ishihara

IR spectroscopy has been widely used for chemical identification and quantitative analysis of reactions occurring in a specific time and space domains by measuring an average signal of the entire system1. Achieving IR measurements with…

Ferroelectric domain imaging with piezoresponse force microscopy (PFM) relies on the converse piezoelectric effect: a voltage applied to the sample leads to mechanical deformations. In case of PFM one electrode is realized by the tip,…

Materials Science · Physics 2015-06-25 T. Jungk , A. Hoffmann , E. Soergel

We demonstrate the application of Atomic Force Microscopy (AFM) based optical force microscopy to map the optical near-fields with nanometer resolution, limited only by the AFM probe geometry. We map the electric field distributions of…

Tip enhanced IR spectra and imaging have been widely used in cutting-edge studies for the in-depth understanding of the composition, structure and function of interfaces at the nanoscale. However, molecular monolayer sensitivity has only…

Photo-induced magnetic force between nanostructures, at optical frequencies, is investigated theoretically. Till now optical magnetic effects are not used in scanning probe microscopy because of the vanishing natural magnetism with…

When light illuminates the junction formed between a sharp metal tip and a sample, different mechanisms can con-tribute to the measured photo-induced force simultaneously. Of particular interest are the instantaneous force be-tween the…

The rapid development of nanoscience and nanotechnology in the last two decades was stimulated by the emergence of scanning probe microscopy (SPM) techniques capable of accessing local material properties, including transport, mechanical,…

Intermodulation atomic force microscopy (ImAFM) is a mode of dynamic atomic force microscopy that probes the nonlinear tip-surface force by measurement of the mixing of multiple tones in a frequency comb. A high $Q$ cantilever resonance and…

Mesoscale and Nanoscale Physics · Physics 2013-02-06 Daniel Platz , Daniel Forchheimer , Erik A. Tholén , David B. Haviland

Modern optical nano-elements pursue ever-smaller sizes and individualized functionalities. Those elements that can efficiently manipulate the magnetic field of light boast promising future applications with a great challenge: the magnetic…

The Photonic Force Microscope (PFM) is an opto-mechanical technique based on an optical trap that can be assumed to probe forces in microscopic systems. This technique has been used to measure forces in the range of pico- and femto-Newton,…

Data Analysis, Statistics and Probability · Physics 2011-11-10 Giorgio Volpe , Giovanni Volpe , Dmitri Petrov

Forces acting between an Atomic Force Microscope (AFM) tip and sample are three dimensional. Despite this, most AFM force measurements are confined to one or two dimensions. Extending AFM force measurements into three dimensions has…

Mesoscale and Nanoscale Physics · Physics 2025-04-21 Roger Proksch , Ryan Wagner

To achieve quantitative interpretation of Piezoresponse Force Microscopy (PFM), including resolution limits, tip bias- and strain-induced phenomena and spectroscopy, analytical representations for tip-induced electroelastic fields inside…

Materials Science · Physics 2009-11-10 Sergei V. Kalinin , Edgar Karapetian , Mark Kachanov

Mid-infrared photo-induced force microscopy (IR-PiFM/PiF-IR) enables high-resolution chemical imaging of surfaces with lateral resolution less than 5 nm. Here are some answers to questions about the physical background, practical handling…

Materials Science · Physics 2026-05-05 Daniela Täuber

The optoelectronic properties of nanoscale systems such as carbon nanotubes (CNTs), graphene nanoribbons and transition metal dichalcogenides (TMDCs) are determined by their dielectric function. This complex, frequency dependent function is…

Materials Science · Physics 2021-11-10 Oisín Garrity , Alvaro Rodriguez , Niclas S. Mueller , Otakar Frank , Patryk Kusch

We investigate the modification of photoluminescence (PL) from single semiconductor nanocrystal quantum dots (NCs) in proximity of metal and semiconducting Atomic Force Microscope (AFM) tips. The presence of the tip alters the radiative…

Chemical Physics · Physics 2016-09-28 Yuval Ebenstein , Eyal Yoskovitz , Ronny Costi , Asaf Aharoni , Uri Banin

Sub-nm resolution images can be achieved by Atomic Force Microscopy (AFM) on samples that are deposited on hard substrates. However, it is still extremely challenging to image soft interfaces, such as biological membranes, due to the…

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