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Related papers: Scanning electron diffraction tomography of strain

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Due to their particle-like properties, three-dimensional (3D) spin textures have garnered significant interest, particularly for their potential applications in next-generation information storage devices. However, efficiently identifying…

Mesoscale and Nanoscale Physics · Physics 2025-02-27 Moritz Winterott , Samir Lounis

Serial section electron microscopy (ssEM) is a widely used technique for obtaining volumetric information of biological tissues at nanometer scale. However, accurate 3D reconstructions of identified cellular structures and volumetric…

Image and Video Processing · Electrical Eng. & Systems 2020-02-06 Thanuja D. Ambegoda , Julien N. P. Martel , Jozef Adamcik , Matthew Cook , Richard H. R. Hahnloser

Characterization and control of the transverse phase space of high-brightness electron beams is required at free-electron lasers or electron diffraction experiments for emittance measurement and beam optimization as well as at advanced…

The scanning electron microscopy (SEM) is probably one the most fascinating examination approach that has been used since more than two decades to detailed inspection of micro scale objects. Most of the scanning electron microscopes could…

Computer Vision and Pattern Recognition · Computer Science 2016-02-18 Wichai Shanklin

Here a new microscopic method is proposed to image and characterize very thin samples like few-layer materials, organic molecules, and nanostructures with nanometer or sub-nanometer resolution using electron beams of energies lower than 20…

Instrumentation and Detectors · Physics 2016-01-06 Ing-Shouh Hwang

Modern nanomaterials contain complexity that spans all three dimensions - from multigate semiconductors to clean energy nanocatalysts to complex block copolymers. For nanoscale characterization, it has been a long-standing goal to observe…

Applied Physics · Physics 2020-06-03 Robert Hovden , David A. Muller

Transmission electron microscopy (TEM) is a powerful imaging tool that has found broad application in materials science, nanoscience and biology(1-3). With the introduction of aberration-corrected electron lenses, both the spatial…

The advantages of convergent beam electron diffraction for symmetry determination at the scale of a few nm are well known. In practice, the approach is often limited due to the restriction on the angular range of the electron beam imposed…

Materials Science · Physics 2013-07-09 Richard Beanland , Paul J. Thomas , David I. Woodward , Pamela A. Thomas , Rudolf A. Roemer

Electron backscatter diffraction (EBSD) in the scanning electron microscope is routinely used for microstructural characterisation of polycrystalline materials. Maps of EBSD data are typically acquired at high stage tilt and slow scan…

Materials Science · Physics 2020-09-01 Vivian Tong , Thomas Benjamin Britton

Electron tomography is a technique used in both materials science and structural biology to image features well below optical resolution limit. In this work, we present a new algorithm for reconstructing the three-dimensional(3D)…

Signal Processing · Electrical Eng. & Systems 2018-07-12 David Ren , Michael Chen , Laura Waller , Colin Ophus

A new method for estimation of intragranular strain fields in polycrystalline materials based on scanning three-dimensional X-ray diffraction data (scanning-3DXRD) is presented and evaluated. Given an apriori known anisotropic compliance,…

Materials Science · Physics 2021-06-16 Axel Henningsson , Johannes Hendriks

Atomic-resolution imaging with scanning transmission electron microscopy is a powerful tool for characterizing the nanoscale structure of materials, in particular features such as defects, local strains, and symmetry-breaking distortions.…

The use of fast pixelated detectors and direct electron detection technology is revolutionising many aspects of scanning transmission electron microscopy (STEM). The widespread adoption of these new technologies is impeded by the technical…

Instrumentation and Detectors · Physics 2020-08-06 Magnus Nord , Robert W. H. Webster , Kirsty A. Paton , Stephen McVitie , Damien McGrouther , Ian MacLaren , Gary W. Paterson

Deep learning has demonstrated superb efficacy in processing imaging data, yet its suitability in solving challenging inverse problems in scientific imaging has not been fully explored. Of immense interest is the determination of local…

Materials Science · Physics 2019-02-20 Nouamane Laanait , Qian He , Albina Y. Borisevich

High-throughput analysis of multidimensional transmission electron microscopy (TEM) datasets remains a significant challenge, limiting the broader impact on strategic materials research. Conventional workflows typically involve sequential,…

Materials Science · Physics 2025-07-16 Arda Genc , Ravit Silverstein

In this second part of a series we attempt to construct an empirical model that can mimick all experimental observations made regarding the role of an alternative interleaved scan pattern in STEM imaging on the beam damage in a specific…

Materials Science · Physics 2021-05-03 D. Jannis , A. Velazco , A. Béché , J. Verbeeck

Strain-engineering of materials encompasses significant elastic deformation and leads to breaking of the lattice symmetry and as a consequence to the emergence of optical anisotropy. However, the capability to image and map local strain…

Optics · Physics 2024-07-26 Joan Sendra , Fabian Haake , Micha Calvo , Henning Galinski , Ralph Spolenak

Proton radiography is a technique extensively used to resolve magnetic field structures in high energy density plasmas, revealing a whole variety of interesting phenomena such as magnetic reconnection and collisionless shocks found in…

We demonstrate a multi-beam scanning transmission electron microscopy (STEM) imaging that integrates down-sampling with super-resolution image reconstruction via a compressive sensing framework. A custom condenser aperture with six randomly…

Instrumentation and Detectors · Physics 2026-03-19 Akira Yasuhara , Takumi Sannomiya , Ryoichi Horisaki

Forward and backward scattering provide complementary volumetric and interfacial information, yet conventional three-dimensional (3D) imaging typically accesses only one. In this Letter, we present a substrate-enhanced diffraction…

Optics · Physics 2026-03-05 Tongyu Li , Yi Shen , Dashan Dong , Danchen Jia , Jianpeng Ao , Ji-Xin Cheng , Lei Tian