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Scanning superconducting quantum interference device (SQUID) microscopy is a magnetic imaging technique combining high-field sensitivity with nanometer-scale spatial resolution. State-of-the-art SQUID-on-tip probes are now playing an…

Mesoscale and Nanoscale Physics · Physics 2022-03-03 M. Wyss , K. Bagani , D. Jetter , E. Marchiori , A. Vervelaki , B. Gross , J. Ridderbos , S. Gliga , C. Schönenberger , M. Poggio

The electron density close to the extraction grids and the co-extracted electrons represent a crucial issue when operating negative ion sources for fusion reactors. An excessive electron density in the plasma expansion region can indeed…

Plasma Physics · Physics 2023-03-29 R. Agnello , R. Cavazzana , I. Furno , R. Jacquier , R. Pasqualotto , E. Sartori , G. Serianni

We propose a scanning magnetic microscope which has a photoluminescence nanoprobe implanted in the tip of an AFM or STM, or NSOM, and exhibits optically detected magnetic resonance (ODMR). The proposed spin microscope has nanoscale lateral…

Quantum Physics · Physics 2009-11-10 Boris M. Chernobrod , Gennady P. Berman

A beam splitter is a key component used to direct and combine light paths in various optical and microwave systems. It plays a crucial role in devices like interferometers, such as the Mach-Zehnder and Hong-Ou-Mandel setups, where it splits…

We demonstrate a 2-grating free electron Mach-Zehnder interferometer constructed in a transmission electron microscope. A symmetric binary phase grating and condenser lens system forms two spatially separated, focused probes at the sample…

Instrumentation and Detectors · Physics 2021-10-13 Cameron W. Johnson , Amy E. Turner , Benjamin J. McMorran

In this study the possibility of combining commercial Scanning Force Microscopes (SFM) with stretching devices for the investigation of microscopic surface changes during stepwise elongation is investigated. Different types of stretching…

Soft Condensed Matter · Physics 2013-12-11 Sabine Hild , Armin Rosa , Othmar Marti

The microfluidic probe (MFP) is a non-contact, scanning microfluidic technology for local (bio)chemical processing of surfaces based on hydrodynamically confining nanoliter volumes of liquids over tens of micrometers. We present here a…

Tissues and Organs · Quantitative Biology 2014-08-19 J. F. Cors , R. D. Lovchik , E. Delamarche , G. V. Kaigala

We develop a novel hyperspectral imaging system using structured illumination in an SLM-based Michelson interferometer. In our design, we use a reflective SLM as a mirror in one of the arms of a Michelson interferometer, and scan the…

Optics · Physics 2022-04-25 Amar Deo Chandra , Mintu Karmakar , Dibyendu Nandy , Ayan Banerjee

Piezoelectric quartz tuning forks are investigated in view of their use as force sensors in dynamic mode scanning probe microscopy at temperatures down to 1.5 K and in magnetic fields up to 8 T. The mechanical properties of the forks are…

We use a small atomic Bose-Einstein condensate as an interferometric scanning probe to map out a microwave field near a chip surface with a few micrometers resolution. Using entanglement between the atoms we overcome the standard quantum…

Quantum Physics · Physics 2013-10-30 Caspar F. Ockeloen , Roman Schmied , Max F. Riedel , Philipp Treutlein

We report on the fabrication and performance of a new kind of tip for scanning tunneling microscopy. By fully incorporating a metallic tip on a silicon chip using modern micromachining and nanofabrication techniques, we realize so-called…

Scanning probe microscopy (SPM) is a valuable technique by which one can investigate the physical characteristics of the surfaces of materials. However, its widespread use is hampered by the time-consuming nature of running an experiment…

Instrumentation and Detectors · Physics 2025-09-03 Nicholas J. Sullivan , Julio J. Valdés , Kirk H. Bevan , Peter Grutter

Torsional harmonic cantilevers allow measurement of time varying tip-sample forces in tapping-mode atomic force microscopy. Accuracy of these force measurements is important for quantitative nanomechanical measurements. Here we demonstrate…

Instrumentation and Detectors · Physics 2008-11-26 Ozgur Sahin

The development and characterisation of a piezoelectric actuated high-frequency MEMS scanning mirror with on-chip frequency tuning capability is reported. The resonant scanner operates at frequencies in excess of 140 kHz, generating scan…

Applied Physics · Physics 2022-06-15 Paul Janin , Deepak Uttamchandani , Ralf Bauer

Optical interferometers are extensively used in fundamental physics test, gravitational wave detection, quantum metrology, topological photonics, and quantum information processing. Fiber-based interferometers are compact, robust and cheap,…

Optics · Physics 2025-02-21 Ruiyang Chen , Yi-Han Luo , Jinbao Long , Junqiu Liu

We use a piezoelectric quartz tuning fork to calibrate the displacement of ceramic piezoelectric scanners which are widely employed in scanning probe microscopy. We measure the static piezoelectric response of a quartz tuning fork and find…

Instrumentation and Detectors · Physics 2012-03-27 Andres Castellanos-Gomez , Carlos R. Arroyo , Nicolás Agraït , Gabino Rubio-Bollinger

Atomic force microscopy (AFM) is an analytical surface characterization tool which can reveal a sample's topography with high spatial resolution while simultaneously probing tip-sample interactions. Local measurement of chemical properties…

Applied Physics · Physics 2018-09-06 Omur E. Dagdeviren , Yoichi Miyahara , Aaron Mascaro , Peter Grutter

An integrated filterbank (IFB) in combination with microwave kinetic inductance detectors (MKIDs), both based on superconducting resonators, could be used to make broadband submillimeter imaging spectrographs that are compact and flexible.…

Instrumentation and Methods for Astrophysics · Physics 2015-05-28 A. Endo , P. van der Werf , R. M. J. Janssen , P. J. de Visser , T. M. Klapwijk , J. J. A. Baselmans , L. Ferrari , A. M. Baryshev , S. J. C. Yates

The two output signals of quadrature phase interferometers allow to benefit both from the high sensitivity of interferometry (working inside a fringe) and from an extended input range (counting fringes). Their calibration to reach a linear…

Instrumentation and Detectors · Physics 2022-09-07 Baptiste Ferrero , Ludovic Bellon

We report a new technique of scanning capacitance microscopy at microwave frequencies. A near field scanning microwave microscope probe is kept at a constant height of about 1nm above the samplewith the help of Scanning Tunneling Microscope…

Materials Science · Physics 2007-05-23 Atif Imtiaz , Steven M. Anlage
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