Related papers: Dual-energy X-ray dark-field material decompositio…
In this paper, we propose a Bayesian spectral deconvolution considering the properties of peaks in different energy domains. Bayesian spectral deconvolution regresses spectral data into the sum of multiple basis functions. Conventional…
An integrated microscope that combines different optical techniques for simultaneous imaging is demonstrated. The microscope enables spectral-domain optical coherence microscopy based on optical backscatter, and multi-photon microscopy for…
We develop a means for speckle-based phase imaging of the projected thickness of a single-material object, under the assumption of illumination by spatially random time-independent x-ray speckles. These speckles are generated by passing x…
X-ray baggage security screening is in widespread use and crucial to maintaining transport security for threat/anomaly detection tasks. The automatic detection of anomaly, which is concealed within cluttered and complex…
Extended defects with one dimensionality smaller than that of the host, such as 2D grain boundaries in 3D materials or 1D grain boundaries in 2D materials, can be particularly damaging since they directly impede the transport of charge,…
Conventional scintillator-based X-ray imaging typically captures the full spectral of X-ray photons without distinguishing their energy. However, the absence of X-ray spectral information often results in insufficient image contrast,…
We present a new approach for retrieving dark-field, phase shift, and attenuation images from speckle-based X-ray imaging data. Speckle-based X-ray imaging (SBXI) exploits sample-induced alterations to a reference near-field speckle pattern…
X-ray single particle imaging involves the measurement of a large number of noisy diffraction patterns of isolated objects in random orientations. The missing information about these patterns is then computationally recovered in order to…
Dual-energy computed tomography (DECT) is an advanced CT scanning technique enabling material characterization not possible with conventional CT scans. It allows the reconstruction of energy decay curves at each 3D image voxel, representing…
Spectral CT is an emerging modality that uses a data acquisition scheme with varied spectral responses to provide enhanced material discrimination in addition to the structural information of conventional CT. Existing clinical and…
Spectroscopic techniques are essential for studying material properties, but the small cross-sections of some methods may result in low signal-to-noise ratios (SNRs) in the collected spectra. In this article we present methods, based on…
Rayleigh scattering has shown powerful abilities to study electron resonances of nanomaterials regardless of the specific shapes. In analogy to Rayleigh scattering, here we demonstrate that edge optical scattering from two-dimensional (2D)…
For the reliable fabrication of the current and next generation of nanostructures it is essential to be able to determine their material composition and dimensional parameters. Using the grazing incidence X-ray fluoresence technique, which…
Electromagnetic medical imaging in the microwave regime is a hard problem notorious for 1) instability 2) under-determinism. This two-pronged problem is tackled with a two-pronged solution that uses double compression to maximally utilizing…
Mahdavi et al. find that the degree of agreement between weak lensing and X-ray mass measurements is a function of cluster radius. Numerical simulations also point out that X-ray mass proxies do not work equally well at all radii. The…
This work demonstrates electron energy loss spectroscopy of 2D materials in a 1-30 keV electron microscope, observing 100-times stronger electron-matter coupling relative to 125 keV microscopes. We observe that the universal curve relating…
Differential evolution indicators are introduced for 3D spatiotemporal imaging of micromechanical processes in complex materials where progressive variations due to manufacturing and/or aging are housed in a highly scattering background of…
In an ultrasonic array system, increasing the aperture size to achieve a high resolution requires more transmit and receive channels, thus making it essential to have an analysis technique that can reconstruct the shape and physical…
The characterization of nanostructured surfaces with sensitivity in the sub-nm range is of high importance for the development of current and next generation integrated electronic circuits. Modern transistor architectures for e.g. FinFETs…
NSLS-II x-ray diagnostics will provide continuous online data of electron beam dimensions, which will be used to derive electron beam emittance and energy spread. It will also provide information of electron beam tilt for coupling…