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Electron Energy Loss Spectroscopy of 2D Materials in a Scanning Electron Microscope

Instrumentation and Detectors 2025-12-23 v1 Materials Science

Abstract

This work demonstrates electron energy loss spectroscopy of 2D materials in a 1-30 keV electron microscope, observing 100-times stronger electron-matter coupling relative to 125 keV microscopes. We observe that the universal curve relating beam energy to scattering holds for the transition from bulk graphite to graphene, albeit with a scale factor. We calculate that optimal coupling for most 2D materials and optical nanostructures falls in this range, concluding that spectroscopy of such systems will greatly benefit from use of this previously unexplored energy regime.

Keywords

Cite

@article{arxiv.2410.09291,
  title  = {Electron Energy Loss Spectroscopy of 2D Materials in a Scanning Electron Microscope},
  author = {John W. Simonaitis and Joseph A. Alongi and Benjamin Slayton and William P. Putnam and Karl K. Berggren and Phillip D. Keathley},
  journal= {arXiv preprint arXiv:2410.09291},
  year   = {2025}
}