Related papers: Seeing atoms with an atomic force microscope
We have built and operated an atom interferometer of the Mach-Zehnder type. The atomic wave is a supersonic beam of lithium seeded in argon and the mirrors and beam-splitters for the atomic wave are based on elastic Bragg diffraction on…
Magnetic force microscopy (MFM) allows one to image the domain structure of ferromagnetic samples by probing the dipole forces between a magnetic probe tip and a magnetic sample. The magnetic domain structure of the sample depends on the…
We propose an arresting scheme for emulating the famous Faraday effect in ultracold atomic gases. Inspired by the similarities between the light field and bosonic atoms, we represent the light propagation in medium by the atomic transport…
High-speed atomic force microscopy (HS-AFM) is an indispensable technique in the biological field owing to its excellent imaging capability for the real-time observation of biomolecules with high spatial resolution. Furthermore, recent…
Stretchable conductors are of crucial relevance for emerging technologies such as wearable electronics, low-invasive bioelectronic implants or soft actuators for robotics. A critical issue for their development regards the understanding of…
Atomistic modeling of thin-film processes provides an avenue not only for discovering key chemical mechanisms of the processes but also to extract quantitative metrics on the events and reactions taking place at the gas-surface interface.…
The atomic lensing model has been proposed as a promising method facilitating atom-counting in heterogeneous nanocrystals [KHW van den Bos et. al, Phys. Rev. Lett. 116 (2016) 246101] Here, image simulations will validate the model, which…
Using Atomic Force Microscopes (AFM) to manipulate nano-objects is an actual challenge for surface scientists. Basic haptic interfacesbetween the AFM and experimentalists have already been implemented. Themulti-sensory renderings (seeing,…
Dynamic-mode atomic force microscopy (AFM) in liquid remains complicated due to the strong viscous damping of the cantilever resonance. Here we show that a high-quality resonance (Q>20) can be achieved in aqueous solution by attaching a…
We demonstrate a simple method to significantly improve the sharpness of standard silicon probes for an atomic force microscope, or to repair a damaged probe. The method is based on creating and maintaining a strong, spatially localized…
Atomic-scale characteristics of surfaces dictate the principles governing numerous scientific phenomena ranging from catalysis to friction. Despite this fact, our ability to visualize and alter surfaces on the atomic scale is severely…
Atomic force microscopy (AFM) has been constantly supporting nanosciences and nanotechnologies for over 30 years, being present in many fields from condensed matter physics to biology. It enables measuring very weak forces at the nanoscale,…
Atomic force microscopy (AFM) is a powerful tool to investigate interaction forces at the micro and nanoscale. Cantilever stiffness, dimensions and geometry of the tip can be chosen according to the requirements of the specific application,…
Spontaneous emission spectra of two initially excited closely spaced identical atoms are very sensitive to the strength and the direction of the applied magnetic field. The relevant schemes are considered that ensure the determination of…
A spreadsheet algorithm is given for the atomic force microscope that accounts for non-linear behavior in the deflection of the cantilever and in the photo-diode response. In addition, the data analysis algorithm takes into account…
In this work, we report the integration of an atomic force microscope (AFM) into a helium ion microscope (HIM). The HIM is a powerful instrument, capable of sub-nanometer resolution imaging and machining of nanoscale structures, while the…
We describe our research programme on the use of atomic magnetometers to detect conductive objects via electromagnetic induction. The extreme sensitivity of atomic magnetometers at low frequencies, up to seven orders of magnitude higher…
Atomic Force Microscopy - Infrared (AFM-IR) has emerged as a useful technique for measuring absorption spectra with spatial resolution better than the optical diffraction limit. The technique relies on the movement of a probe for atomic…
In low energy atom-surface scattering, it is possible for the atom to be reflected in a region of attractive potential with no classical turning point. This phenomenon has come to be known as quantum reflection and it can reduce the…
Atomic force microscope (AFM) generally works on the basis of manipulating absolute magnitude of van der Waals (vdW) force between the tip and specimen. The force is, however, less sensitive to alternation of atom species than to tip-sample…