Related papers: Hyperspectral imaging for dynamic thin film interf…
Thin film interferometry is a powerful technique for non-invasively measuring liquid film thickness with applications in ophthalmology, but its clinical translation is hindered by the challenges in reconstructing thickness profiles from…
A simple method was developed to observe the interference patterns of the light reflected by the interfaces of thin liquid films. Employing a fluorescent microscope with epi-illumination, we collected the 2D patterns of interference fringes…
Optical stellar interferometers have demonstrated milli-arcsecond resolution with few apertures spaced hundreds of meters apart. To obtain rich direct images, many apertures will be needed, for a better sampling of the incoming wavefront.…
To design semiconductor-based optical devices, the optical properties of the used semiconductor materials must be precisely measured over a large band. Transmission spectroscopy stands out as an inexpensive and widely available method for…
Hyperspectral imaging is useful for applications ranging from medical diagnostics to agricultural crop monitoring; however, traditional scanning hyperspectral imagers are prohibitively slow and expensive for widespread adoption. Snapshot…
A new approach was proposed to accurately determine the thickness of film, especially for ultra-thin film, through spectrum fitting with the assistance of interference layer. The determination limit can reach even less than 1 nm. Its…
We proposed a novel approach to coherent imaging of dynamic samples. The inter-frame similarity of the sample's local structures is found to be a powerful constraint in phasing a sequence of diffraction patterns. We devised a new image…
Using light spectra is an essential element in many applications, for example, in material classification. Often this information is acquired by using a hyperspectral camera. Unfortunately, these cameras have some major disadvantages like…
We present an imaging technique that allows the recovery of the transparency profile of wavelength-scale objects with deep subwavelength resolution based on far-field intensity measurements. The approach, interscale mixing microscopy (IMM),…
Diffraction of light beams from the phase steps due to the abrupt changes in the boundary of step leads to Fresnel fringes that their visibility and intensity profile depend on the change of the step height or light incident angle. The…
We present a new imaging technique, swept-angle synthetic wavelength interferometry, for full-field micron-scale 3D sensing. As in conventional synthetic wavelength interferometry, our technique uses light consisting of two…
Because of atmospheric turbulence, obtaining high angular resolution images with a high dynamic range is difficult even in the near infrared domain of wavelengths. We propose a novel technique to overcome this issue. The fundamental idea is…
Near-infrared (NIR) hyperspectral imaging is widely used to reveal morphological and chemical information. However, conventional spectral imagers usually rely on costly focal plane arrays and suffer from data redundancy and inefficiencies…
For measurements designed to accurately determine layer thickness, there is a natural trade-off between sensitivity to optical thickness and lateral resolution due to the angular ray distribution required for a focused beam. We demonstrate…
Mid-infrared hyperspectral imaging has become an indispensable tool to spatially resolve chemical information in a wide variety of samples. However, acquiring three-dimensional data cubes is typically time-consuming due to the limited speed…
The high inertia of classical fluid coating processes severely limits the possibility of controlling the deposited film thickness through the entrainment velocity. We describe and characterize a new experimental device where the inertia is…
Spectroscopic ellipsometry is a powerful method with high surface sensitivity that can be used to monitor the growth of even sub-monolayer film. However, the analysis of ultrathin films is complicated by the correlation of the dielectric…
In this paper, a thin film thickness gauge based on the interferometric principle of Y-shaped optical fiber is proposed to achieve accurate measurement of film thickness. In this paper, the optical fiber, the interferometric principle and…
We describe an extension of multi-speckle diffusing wave spectroscopy adapted to follow the non-stationary microscopic dynamics in drying films and coatings in a very reactive way and with a high dynamic range. We call this technique…
White light spectral interferometry is applied to measure the refractive index in absorbing liquids in the spectral range from 400 to 1000 nm. We analyze the influence of absorption on the visibility of interferometric fringes and,…