Related papers: Spectral Domain Z-scan Technique
Scattering-type scanning near-field optical microscopy is a powerful imaging technique for studying materials beyond the diffraction limit. However, interpreting near-field measurements poses challenges in mapping the response of…
X-ray near-field speckle-based phase-sensing approaches provide efficient means to characterise optical elements. Here, we present a theoretical review of several of these speckle methods in the frame of optical characterisation and provide…
Accurately estimating data density is crucial for making informed decisions and modeling in various fields. This paper presents a novel nonparametric density estimation procedure that utilizes bivariate penalized spline smoothing over…
Hyperspectral images often have hundreds of spectral bands of different wavelengths captured by aircraft or satellites that record land coverage. Identifying detailed classes of pixels becomes feasible due to the enhancement in spectral and…
We present a perturbative technique for modeling the scattering of light by a nonlinear material. This approach eliminates the need for an iterative algorithm to solve the fully coupled nonlinear problem. We demonstrate its effectiveness in…
We tackle the problem of modeling light scattering in homogeneous translucent material and estimating its scattering parameters. A scattering phase function is one of such parameters which affects the distribution of scattered radiation. It…
We introduce a method of estimating parameters associated with a fractal random scattering medium, which utilizes the multiscale properties of the scattered field. The example of ray-density fluctuations beyond a phase screen with fractal…
Epsilon-near-zero (ENZ) materials have shown strong refractive nonlinearities that can be fast in an absolute sense. While continuing to advance fundamental science, such as time varying interactions, the community is still searching for an…
The ability to measure small deformations or strains is useful for understanding many aspects of materials. Here, a new analysis of speckle diffraction peaks is presented in which the systematic shifts of the speckles are analyzed allowing…
We present a theoretical analysis of open aperture $Z$-scan signatures for materials exhibiting an absorption admixture of different multiphoton processes. Based on a polynomial expansion, we suggest some procedures to separate the…
Imaging is of great importance in everyday life and various fields of science and technology. Conventional imaging is achieved by bending light rays originating from an object with a lens. Such ray bending requires space-variant structures,…
Schlieren imaging is a powerful, non-intrusive method widely used to visualize refractive index gradients in fluid dynamics and heat transfer studies, essential in fields like aerospace engineering, combustion analysis, and supersonic flow…
Light scattering techniques are widely used in many fields of condensed and sof t matter physics. Usually these methods are based on the study of the scattered light in the far field. Recently, a new family of near field detection schemes…
Scattering-type scanning near-field optical microscopy is becoming a premier method for the nanoscale optical investigation of materials well beyond the diffraction limit. A number of popular numerical methods exist to predict the…
We present a method to determine the static aberrations in a nearly diffraction-limited spectrograph introduced, for example, by alignment or manufacturing errors. We consider an instrument with two stages separated by a slit or image…
The scattering parameter extraction method of metamaterial homogenization is reviewed to show that the only ambiguity is the one related to the choice of the branch of the complex logarithmic function (or the complex inverse cosine…
The terahertz (THz) band (0.1-10 THz) is widely considered to be a candidate band for the sixth-generation mobile communication technology (6G). However, due to its short wavelength (less than 1 mm), scattering becomes a particularly…
Free-surface synthetic Schlieren (FS-SS) is a high-resolution, refraction-based optical technique for measuring the instantaneous elevation of a liquid interface. Under the assumptions of small amplitude, small slope, and small paraxial…
In this work we study in details the influence of pure astronomical refraction on solar metrologic measurements made from ground-based full disk imagery and provide the tools for correcting the measurements and estimating the associated…
The iso-frequency contours of a photonic crystal are important for predicting and understanding exotic optical phenomena that are not apparent from high-symmetry band structure visualizations. Here, we demonstrate a method to directly…