Related papers: Simulations and Design of a Single-Photon CMOS Ima…
Capturing depth and reflectivity images at low light levels from active illumination of a scene has wide-ranging applications. Conventionally, even with single-photon detectors, hundreds of photon detections are needed at each pixel to…
Monolithic CMOS pixel sensors offer unprecedented opportunities for fast nano-imaging through direct electron detection in transmission electron microscopy. We present the design and a full characterisation of a CMOS pixel test structure…
The conventional high-level sensing techniques require high-fidelity images as input to extract target features, which are produced by either complex imaging hardware or high-complexity reconstruction algorithms. In this letter, we propose…
Studies of a single photon counting hybrid pixel detector for X-ray imaging applications are presented. A silicon- and a CdTe-sensor were bump bonded onto the MPEC pixel readout chip and could be successfully operated. A new USB based…
Conventional LIDAR systems require hundreds or thousands of photon detections to form accurate depth and reflectivity images. Recent photon-efficient computational imaging methods are remarkably effective with only 1.0 to 3.0 detected…
We demonstrate superconducting single-photon detectors that integrate signals locally at each pixel. This capability is realized by the monolithic integration of superconducting-nanowire single-photon detectors with Josephson electronics.…
CMOS Monolithic Active Pixel Sensors (CPS) are ultra-light and highly granular silicon pixel detectors suited for highly sensitive charged particle tracking. Being manufactured with cost efficient standard CMOS processes, CPS may integrate…
In many applications, such as development and testing of image processing algorithms, it is often necessary to simulate images containing realistic noise from solid-state photosensors. A high-level model of CCD and CMOS photosensors based…
A multi-imaging strategy is proposed and experimentally tested to improve the accuracy of photon counting with an electron multiplying charge-coupled device (EMCCD), by taking into account the random nature of its on-chip gain and the…
For near-term quantum devices, an important challenge is to develop efficient methods to certify that noise levels are low enough to allow potentially useful applications to be carried out. We present such a method tailored to photonic…
A promising result from optical quantum metrology is the ability to achieve sub-shot-noise performance in transmission or absorption measurements. This is due to the significantly lower uncertainty in light intensity of quantum beams with…
A CMOS pixel sensor, named Supix-1, is developed for a pixelated silicon tracker for the Circular Electron-Positron Collider (CEPC) project. The sensor, consisted of nine sectors varying in pixel sizes, diode sizes and geometries, is…
A prototype of the CMOS pixel sensor named SUPIX-1 has been fabricated and tested in order to investigate the feasibility of a pixelated tracker for a proposed Higgs factory, namely, the Circular Electron-Positron Collider (CEPC). The…
High resolution image sensors require electrical access to each individual pixel for signal readout. Such access is especially challenging for ultra-miniaturized pixels, for heterogeneously integrated sensing and readout layers in…
We have developed a non-destructive readout system that uses a floating-gate amplifier on a thick, fully depleted charge coupled device (CCD) to achieve ultra-low readout noise of 0.068 e- rms/pix. This is the first time that discrete…
The usually reported pixel resolution of single pixel imaging (SPI) varies between $32 \times 32$ and $256 \times 256$ pixels falling far below imaging standards with classical methods. Low resolution results from the trade-off between the…
A simple model system is introduced for demonstrating how a single photon source might be used to transduce classical analog information. The theoretical scheme results in measurements of analog source samples that are (i) quantized in the…
Single-pixel imaging, originally developed in light optics, facilitates fast three-dimensional sample reconstruction, as well as probing with light wavelengths undetectable by conventional multi-pixel detectors. However, the spatial…
Silicon pixel sensors manufactured using commercial CMOS processes are promising instruments for high-energy particle physics experiments due to their high yield and proven radiation hardness. As one of the essential factors for the…
The optimization of silicon photodiode-based CMOS sensors with backside-illumination for 300-1000 nm wavelength range was studied. It was demonstrated that a single hole on a photodiode increases the optical efficiency of the pixel in…