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This paper is concerned with a nonlinear imaging problem, which aims to reconstruct a locally perturbed, perfectly reflecting, infinite plane from intensity-only (or phaseless) far-field or near-field data. A recursive Newton iteration…
Graphene is an atomically thin metallic membrane capable of sustaining reversible strain and offers a tempting prospect of controlling its optoelectronic properties via strain. Graphenes exceptional mechanical flexibility and tensile…
Coherent x-ray diffractive imaging is extended to high resolution strain analysis in crystalline nanostructured devices. The application potential is demonstrated by determining the strain distribution in (Ga,Mn)As/GaAs nanowires. By…
We study the shape reconstruction of an inclusion from the {faraway} measurement of the associated electric field. This is an inverse problem of practical importance in biomedical imaging and is known to be notoriously ill-posed. By…
This work presents an automated three-point bending apparatus that can be used to study strain engineering and straintronics in two-dimensional materials. We benchmark the system by reporting reproducible strain tuned micro-reflectance,…
Hyperspectral neutron computed tomography enables 3D non-destructive imaging of the spectral characteristics of materials. In traditional hyperspectral reconstruction, the data for each neutron wavelength bin is reconstructed separately.…
This paper treats the inverse problem of retrieving the electrical conductivity of a material starting from boundary measurements in the framework of Electrical Resistance Tomography (ERT). In particular, the focus is on non-iterative…
Moir\'e fringes are used throughout a wide variety of applications in physics and engineering to bring out small variations in an underlying lattice by comparing with another reference lattice. This method was recently demonstrated in…
In this chapter, we demonstrate a general formulation of the Finite Element Method allowing to calculate the diffraction efficiencies from the electromagnetic field diffracted by arbitrarily shaped gratings embedded in a multilayered stack…
Electron diffraction through a thin patterned silicon membrane can be used to create complex spatial modulations in electron distributions by varying the intensity of different reflections using parameters such as crystallographic…
A method is described for the reconstruction of the amplitude and phase of the object exit wave function by phase-plate transmission electron microscopy. The proposed method can be considered as in-line holography and requires three images,…
In this work we develop and analyze an adaptive finite element method for efficiently solving electrical impedance tomography -- a severely ill-posed nonlinear inverse problem for recovering the conductivity from boundary voltage…
Ultrafast measurement technology provides essential contributions to our microscopic understanding of the properties and functions of solids and nanostructures. Atomic-scale vistas with ever-growing spatial and temporal resolution are…
This paper discusses the reconstruction of partially sampled spectrum-images to accelerate the acquisition in scanning transmission electron microscopy (STEM). The problem of image reconstruction has been widely considered in the literature…
The iterative refinement method (IRM) has been very successfully applied in many different fields for examples the modern quantum chemical calculation and CT image reconstruction. It is proved that the refinement method can create an exact…
This paper studies the numerical analysis of a parameter identification problem governed by elliptic equations with power-type nonlinearity. We propose a numerical reconstruction via a suitable least-squares minimization problem based on…
A reduced order asymptotic homogenization based multiscale technique which can capture damage and inelastic effects in composite materials is proposed. This technique is based on two scale homogenization procedure where eigen strain…
Here we introduce a new reconstruction technique for two-dimensional Bragg Scattering Tomography (BST), based on the Radon transform models of [arXiv preprint, arXiv:2004.10961 (2020)]. Our method uses a combination of ideas from multibang…
Atomic resolution STEM images often suffer from noise due to low electron doses and instrument imperfections, hence it is challenging to obtain critical structural details required for material analysis. To address the problem, we propose a…
Spatially resolved strain measurements are crucial to understanding the properties of engineering materials. Although strain measurements utilizing techniques such as transmission electron microscopy and electron backscatter diffraction…