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Photonic integrated circuits (PICs) are vital for developing affordable, high-performance optoelectronic devices that can be manufactured at an industrial scale, driving innovation and efficiency in various applications. Optical loss of…
Low-Gain Avalanche Diode (LGAD) sensor is one of candidate sensors for the tracker at future hadron collider experiments. To use this sensor as a tracking detector, AC-LGAD sensor is being developed which has both timing and spatial…
We have developed a modified Michelson interferometer type Raman laser system to manipulate cold 87 Rb atoms to interfere. A frequency modulated continuous wave technique was introduced to determine the optical path difference, thus…
Background. Astrometry at or below the micro-arcsec level with an imaging telescope assumes that the uncertainty on the location of an unresolved source can be an arbitrarily small fraction of the detector pixel, given a sufficient photon…
We present a numerical and experimental study of the impact of phase errors on the performance of large, high-resolution Arrayed Waveguide Gratings (AWG) for applications in astronomy. We use a scalar diffraction model to study the…
Neutron imaging is a non-destructive inspection technique with a wide range of applications. One of the important aspects concerning neutron imaging is achieving micrometer-scale spatial resolution. Developing a neutron detector with a high…
Cross-grating phase microscopy (CGM) is a quantitative phase microscopy technique based on the association of a 2-dimensional diffraction grating (cross-grating) and a regular camera sensor, separated by a millimetric distance. This simple…
Atomic force microscopy (AFM) using qPlus sensors is a powerful tool for high-resolution analysis in various liquids, including high-viscosity or opaque environments. However, the relatively high displacement sensor noise density (n_{ds}),…
The electronic and crystallographic structure of the graphene/Rh(111) moir\'e lattice is studied via combination of density-functional theory calculations and scanning tunneling and atomic force microscopy (STM and AFM). Whereas the…
A new fitting method is explored for momentum reconstruction of tracks in a constant magnetic field for a silicon-strip tracker. Substantial increases of momentum resolution respect to standard fit is obtained. The key point is the use of a…
The Anti Coincidence Shield (ACS) of the INTEGRAL SPI instrument provides an excellent sensitivity for the detection of Gamma Ray Bursts (GRBs) above ~ 75keV, but no directional and energy information is available. We studied the ACS…
There have been many reports of non-statistical effects in neutron-capture measurements. However, reports of deviations of reduced-neutron-width distributions from the expected Porter-Thomas (PT) shape largely have been ignored. Most of…
A 1M- and a 4M-pixel monolithic CMOS active pixel sensor with 9.5x9.5 micron^2 pixels have been developed for direct imaging in transmission electron microscopy as part of the TEAM project. We present the design and a full characterisation…
We present a novel geometry of scintillator tiles developed for fiberless coupling to silicon photomultipliers (SiPMs) for applications in highly granular calorimeters. A high degree of uniformity of the tile response over the full active…
Serial section electron microscopy (ssEM) is a widely used technique for obtaining volumetric information of biological tissues at nanometer scale. However, accurate 3D reconstructions of identified cellular structures and volumetric…
Crystalline membranes at finite temperatures have an anomalous behavior of the bending rigidity that makes them more rigid in the long wavelength limit. This issue is particularly relevant for applications of graphene in nano- and…
We introduce "microdeflectometry", a novel technique for measuring the microtopography of specular surfaces. The primary data is the local slope of the surface under test. Measuring the slope instead of the height implies high information…
We report a systematic study to determine local elastic properties of surfaces combining atomic force microscope (AFM) with acoustic waves which is known as atomic force acoustic microscopy - AFAM. We describe the methodology of AFAM in…
A novel method for measuring the surface coverage of randomly distributed cylindrical nanoparticles such as nanorods and nanowires, using atomic force microscopy (AFM), is presented. The method offers several advantages over existing…
We propose a new method to investigate interactions involved in atomic force microscopy (AFM). It is a dynamical method relying on the growth of oscillations via parametric resonance. With this method the second and third derivatives of the…