Related papers: Spatial and spectral dynamics in STEM hyperspectra…
Subsampling and fast scanning in the scanning transmission electron microscope is problematic due to scan coil hysteresis - the mismatch between the actual and assumed location of the electron probe beam as a function of the history of the…
Semantic Image Segmentation facilitates a multitude of real-world applications ranging from autonomous driving over industrial process supervision to vision aids for human beings. These models are usually trained in a supervised fashion…
Optical imaging through scattering media is a long-standing challenge. Although many approaches have been developed to focus light or image objects through scattering media, they are either invasive, restricted to stationary or…
Automated experiments in 4D Scanning Transmission Electron Microscopy are implemented for rapid discovery of local structures, symmetry-breaking distortions, and internal electric and magnetic fields in complex materials. Deep kernel…
A new statistical model designed for regression analysis with a sparse design matrix is proposed. This new model utilizes the positions of the limited non-zero elements in the design matrix to decompose the regression model into…
Sparse sampling schemes have the potential to dramatically reduce image acquisition time while simultaneously reducing radiation damage to samples. However, for a sparse sampling scheme to be useful it is important that we are able to…
In a scanning transmission electron microscope (STEM), producing a high-resolution image generally requires an electron beam focused to the smallest point possible. However, the magnetic lenses used to focus the beam are unavoidably…
The need to increase data transfer rates constitutes a key challenge in modern information-driven societies. Taking advantage of the transverse spatial modes of light to encode more information is a promising avenue for both classical and…
Quantitative interpretation of transmission electron microscopy (TEM) data of crystalline specimens often requires the accurate knowledge of the local crystal orientation. A method is presented which exploits momentum-resolved scanning TEM…
We present a new analysis method for atomic resolution four-dimensional scanning transmission electron microscopy (4D-STEM, in which a diffraction pattern is collected at each point of a raster scan of a focused electron beam across the…
In x-ray microscopy, traditional raster-scanning techniques are used to acquire a microscopic image in a series of step-scans. Alternatively, scanning the x-ray probe along a continuous path, called a fly-scan, reduces scan time and…
As free-space optical systems grow in scale and complexity, troubleshooting becomes increasingly time-consuming and, in the case of remote installations, perhaps impractical. An example of a task that is often laborious is the alignment of…
Scanning Transmission Electron Microscopy (STEM) coupled with Electron Energy Loss Spectroscopy (EELS) presents a powerful platform for detailed material characterization via rich imaging and spectroscopic data. Modern electron microscopes…
While transmission electron microscopes (TEM) can achieve a much higher resolution than optical microscopes, they face challenges of damage to samples during the high energy processes involved. Here, we explore using computational ghost…
Spatial Transcriptomics (ST) merges the benefits of pathology images and gene expression, linking molecular profiles with tissue structure to analyze spot-level function comprehensively. Predicting gene expression from histology images is a…
The Intelligent Fault Diagnosis of rotating machinery currently proposes some captivating challenges. Although results achieved by artificial intelligence and deep learning constantly improve, this field is characterized by several open…
Four dimensional scanning transmission electron microscopy (4D STEM) records the scattering of electrons in a material in great detail. The benefits offered by 4D STEM are substantial, with the wealth of data it provides facilitating for…
In this article, a new scanning electron microscopy (SEM) image composition technique is described, which can significantly reduce drift related image corruptions. Drift-distortion commonly causes blur and distortions in the SEM images.…
Scattering scanning near-field optical microscopy (s-SNOM) is a technique to enhance the spatial resolution, and when combined by Fourier transform spectroscopy it can provide spectroscopic information with high spatial resolution. This…
Spectro-temporal processing is essential in reaching ultimate per-photon information capacity in optical communication and metrology. In contrast to the spatial domain, complex multimode processing in the time-frequency domain is however…