Related papers: A Range Matching CAM for Hierarchical Defect Toler…
While building machine learning models, Feature selection (FS) stands out as an essential preprocessing step used to handle the uncertainty and vagueness in the data. Recently, the minimum Redundancy and Maximum Relevance (mRMR) approach…
In this paper, we investigate the optimum way to allocate redundancy of finite-length nested codes for modern nonvolatile memories suffering from both permanent defects and transient errors (erasures or random errors). A nested coding…
The progress in neuromorphic computing is fueled by the development of novel nonvolatile memories capable of storing analog information and implementing neural computation efficiently. However, like most other analog circuits, these devices…
The continuous shift of computational bottlenecks to the memory access and data transfer, especially for AI applications, poses the urgent needs of re-engineering the computer architecture fundamentals. Many edge computing applications,…
Error correction is essential for modern computing systems, enabling information to be processed accurately even in the presence of noise. Here, we demonstrate a new approach which exploits an error correcting phase that emerges in a system…
We consider the problem of learning a mixture of Random Utility Models (RUMs). Despite the success of RUMs in various domains and the versatility of mixture RUMs to capture the heterogeneity in preferences, there has been only limited…
This paper explores advances in reconfiguration properties of SRAM-based FPGAs, namely Partial Dynamic Reconfiguration, to improve the resilience of critical systems that take advantage of this technology. Commercial of-the-shelf…
This paper presents a flexible irregular model for heterogeneous cloud storage systems and investigates how the cost of repairing failed nodes can be minimized. The fractional repetition code, originally designed for minimizing repair…
Machine learning based malware detection techniques rely on grayscale images of malware and tends to classify malware based on the distribution of textures in graycale images. Albeit the advancement and promising results shown by machine…
A high-speed random number generator (RNG) circuit based on magnetoresistive random-access memory (MRAM) using an error-correcting code (ECC) post processing circuit is presented. ECC post processing increases the quality of randomness by…
High-resolution printed circuit board (PCB) inspection suffers from resolution collapse when full-board images are resized to standard detector inputs: micro-scale defects shrink to a few pixels and are missed. Tile-based inference…
A novel multi-resolution cluster detection (MCD) method is proposed to identify irregularly shaped clusters in space. Multi-scale test statistic on a single cell is derived based on likelihood ratio statistic for Bernoulli sequence, Poisson…
Remote Memory Access (RMA) is an emerging mechanism for programming high-performance computers and datacenters. However, little work exists on resilience schemes for RMA-based applications and systems. In this paper we analyze fault…
Much effort has been devoted to device and materials engineering to realize nanoscale resistance random access memory (RRAM) for practical applications, but there still lacks a rational physical basis to be relied on to design scalable…
The structure of defect clusters formed in a displacement cascade plays a significant role in the micro-structural evolution during irradiation. Molecular dynamics simulations have been widely used to study collision cascades and subsequent…
Defects influence diverse properties of materials, shaping their structural, mechanical, and electronic characteristics. Among a variety of materials exhibiting unique defects, magnets exhibit diverse nano- to micro-scale defects and have…
Hierarchical application of Triple-Modular Redundancy (TMR) increases fault tolerance of digital Integrated Circuit (IC). In this paper, a simple probabilistic model was proposed for analysis of fault masking performance of hierarchical TMR…
With the rapid growth in the semiconductor industry, it is becoming critical to detect and classify increasingly smaller patterned defects. Recently machine learning, including deep learning, has come to aid in this endeavor in a big way.…
Reliability is necessary in safety-critical applications spanning numerous domains. Conventional hardware-based fault tolerance techniques, such as component redundancy, ensure reliability, typically at the expense of significantly…
We investigate a family of fault-tolerant quantum error correction schemes based on the concatenation of small error detection or error correction codes with the three-dimensional cluster state. We propose fault-tolerant state preparation…