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Reliability has taken centre stage in the development of high-performance computing processors. A Surge of interest is noticeable in recent times in formulating fault and failure models, understanding failure mechanism and strategizing…
The random cluster model is used to define an upper bound on a distance measure as a function of the number of data points to be classified and the expected value of the number of classes to form in a hybrid K-means and regression…
In this research work, we have demonstrated the application of Mask-RCNN (Regional Convolutional Neural Network), a deep-learning algorithm for computer vision and specifically object detection, to semiconductor defect inspection domain.…
In-Memory Computing (IMC) introduces a new paradigm of computation that offers high efficiency in terms of latency and power consumption for AI accelerators. However, the non-idealities and defects of emerging technologies used in advanced…
As memory technologies continue to shrink and memory error rates increase, the demand for stronger reliability becomes increasingly critical. Fine-grain memory replication has emerged as an appealing approach to improving memory fault…
Visual anomaly detection plays a significant role in the development of industrial automatic product quality inspection. As a result of the utmost imbalance in the amount of normal and abnormal data, growing attention has been given to…
The formation and subsequent growth of structural defects in an irradiated material can strongly influence the material's performance in technological and industrial applications. Predicting how the growth of defects affects material…
The scaling of high density NOR Flash memory devices with multi level cell (MLC) hits the reliability break wall because of relatively high intrinsic bit error rate (IBER). The chip maker companies offer two solutions to meet the output bit…
Resistive Random Access Memory (ReRAM) has emerged as a promising platform for deep neural networks (DNNs) due to its support for parallel in-situ matrix-vector multiplication. However, hardware failures, such as stuck-at-fault defects, can…
SRAM-based FPGAs are popular in the aerospace industry for their field programmability and low cost. However, they suffer from cosmic radiation-induced Single Event Upsets (SEUs). Triple Modular Redundancy (TMR) is a well-known technique to…
We consider rank modulation codes for flash memories that allow for handling arbitrary charge-drop errors. Unlike classical rank modulation codes used for correcting errors that manifest themselves as swaps of two adjacently ranked…
Low-power SRAM architectures are especially sensitive to many types of defects that may occur during manufacturing. Among these, resistive defects can appear. This paper analyzes some types of such defects that may impair the device…
Raw bit errors are common in NAND flash memory and will increase in the future. These errors reduce flash reliability and limit the lifetime of a flash memory device. We aim to improve flash reliability with a multitude of low-cost…
Despite its maturity, the field of fault-tolerant redundancy suffers from significant terminological fragmentation, where functionally equivalent methods are frequently described under disparate names across academic and industrial domains.…
Hazard radiation can lead the system fault therefore Fault Tolerance is required. Fault Tolerant is a system, which is designed to keep operations running, despite the degradation in the specific module is happening. Many fault tolerances…
Effects of radiation on electronic circuits used in extra-terrestrial applications and radiation prone environments need to be corrected. Since FPGAs offer flexibility, the effects of radiation on them need to be studied and robust methods…
As DRAM scales in density and adopts 3D integration, raw fault rates increase and multi-bit errors are no longer rare. Such errors can severely impact Deep Neural Networks (DNNs): although DNNs tolerate small numerical perturbations, random…
This study investigates the capabilities of Cyclic Redundancy Checks(CRCs) to detect burst and random errors. Researchers have favored these error detection codes throughout the evolution of computing and have implemented them in…
Functional properties of transition-metal oxides strongly depend on crystallographic defects. In transition-metal-oxide electrocatalysts such as SrIrO3 (SIO), crystallographic lattice deviations can affect ionic diffusion and adsorbate…
Fault tolerance is one of the major design goals for HPC. The emergence of non-volatile memories (NVM) provides a solution to build fault tolerant HPC. Data in NVM-based main memory are not lost when the system crashes because of the…