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Synchrotron Laue microdiffraction and Digital Image Correlation measurements were coupled to track the elastic strain field (or stress field) and the total strain field near a general grain boundary in a bent bicrystal. A 316L stainless…

A new, iterative algorithm is presented to calculate the Embedded Element Pattern (EEP) tranformation from a set of patterns computed for a uniform antenna port loading (scaled identinty matrix) to a set of those computed for a non-uniform…

Instrumentation and Methods for Astrophysics · Physics 2026-01-23 Georgios Kyriakou

Electron microscopy (EM) is a foundational tool for directly assessing the structure of materials. Recent advances in direct electron detectors have improved signal-to noise ratios via single-electron counting. However, accurately counting…

The Kikuchi bands arise from Bragg diffraction of incoherent electrons scattered within a crystalline specimen and can be observed in both the transmission and reflection modes of scanning electron microscopy (SEM). Converging, rocking, or…

The recently developed information-theoretic approach to crystallographic symmetry classifications and quantifications in two dimensions (2D) from digital transmission electron and scanning probe microscope images is adapted for the…

Materials Science · Physics 2022-02-15 Peter Moeck , Lukas von Koch

Quantitative interpretation of transmission electron microscopy (TEM) data of crystalline specimens often requires the accurate knowledge of the local crystal orientation. A method is presented which exploits momentum-resolved scanning TEM…

Crystalline materials used in technological applications are often complex assemblies composed of multiple phases and differently oriented grains. Robust identification of the phases and orientation relationships from these samples is…

Nowadays, modern electron microscopes deliver images at atomic scale. The precise atomic structure encodes information about material properties. Thus, an important ingredient in the image analysis is to locate the centers of the atoms…

Computer Vision and Pattern Recognition · Computer Science 2017-09-13 Benjamin Berkels , Benedikt Wirth

Resolving pseudosymmetry has long presented a challenge for electron backscatter diffraction (EBSD) and has been notoriously challenging in the case of tetragonal ZrO2 in particular. In this work, a method is proposed to resolve…

Materials Science · Physics 2020-03-11 Edward L. Pang , Peter M. Larsen , Christopher A. Schuh

The design of novel materials hinges on the understanding of structure-property relationships. However, in recent times, our capability to synthesize a large number of materials has outpaced our speed at characterizing them. While the…

Accurate grain orientation mapping is essential for understanding and optimizing the performance of polycrystalline materials, particularly in energy-related applications. Lithium nickel oxide (LiNiO$_{2}$) is a promising cathode material…

Disordered Systems and Neural Networks · Physics 2025-11-26 Sebastian Wissel , Jonas Scheunert , Aaron Dextre , Shamail Ahmed , Andreas Bayer , Kerstin Volz , Bai-Xiang Xu

We introduce the first learning-based dense matching algorithm, termed Equirectangular Projection-Oriented Dense Kernelized Feature Matching (EDM), specifically designed for omnidirectional images. Equirectangular projection (ERP) images,…

Computer Vision and Pattern Recognition · Computer Science 2025-03-03 Dongki Jung , Jaehoon Choi , Yonghan Lee , Somi Jeong , Taejae Lee , Dinesh Manocha , Suyong Yeon

Diffraction is the most common method to solve for unknown or partially known crystal structures. However, it remains a challenge to determine the crystal structure of a new material that may have nanoscale size or heterogeneities. Here we…

A major challenge in single particle reconstruction from cryo-electron microscopy is to establish a reliable ab-initio three-dimensional model using two-dimensional projection images with unknown orientations. Common-lines based methods…

Machine Learning · Computer Science 2013-04-11 Lanhui Wang , Amit Singer , Zaiwen Wen

Camera calibration using planar targets has been widely favored, and two types of control points have been mainly considered as measurements: the corners of the checkerboard and the centroid of circles. Since a centroid is derived from…

Computer Vision and Pattern Recognition · Computer Science 2025-12-16 Chaehyeon Song , Dongjae Lee , Jongwoo Lim , Ayoung Kim

We present an expanded and improved deep-learning (DL) methodology for determining centers of star images on HST/WFPC2 exposures. Previously, we demonstrated that our DL model can eliminate the pixel-phase bias otherwise present in these…

Instrumentation and Methods for Astrophysics · Physics 2024-04-29 Dana I. Casetti-Dinescu , Roberto Baena-Galle , Terrence M. Girard , Alejandro Cervantes-Rovira , Sebastian Todeasa

To determine the precise positions of stars in CCD frames, various centering algorithms have been proposed for astrometry. The effective point spread function (ePSF) and the Gaussian centering algorithms are two representative centering…

Instrumentation and Methods for Astrophysics · Physics 2021-12-28 F. R. Lin , Q. Y. Peng , Z. J. Zheng , B. F. Guo , Y. J. Shang

We provide a complete pipeline for the detection of patterns of interest in an image. In our approach, the patterns are assumed to be adequately modeled by a known template, and are located at unknown positions and orientations that we aim…

Image and Video Processing · Electrical Eng. & Systems 2021-04-15 Julien Fageot , Virginie Uhlmann , Zsuzsanna Püspöki , Benjamin Beck , Michael Unser , Adrien Depeursinge

We present a theoretical analysis of the measuring algorithm we use when applying the Diffracto-Astrometry technique to Hubble Space Telescope Wide Field Planetary Camera 2 (WFPC2) saturated stellar images. Theoretical Point Spread…

Instrumentation and Methods for Astrophysics · Physics 2015-05-30 A. Ruelas-Mayorga , L. J. Sanchez , J. Olivares , C. Allen , A. Poveda , R. Costero , A. Nigoche-Netro

In a scanning transmission electron microscope (STEM), producing a high-resolution image generally requires an electron beam focused to the smallest point possible. However, the magnetic lenses used to focus the beam are unavoidably…