Related papers: X-ray optics and beam characterization using rando…
Speckle metrology exploits the high sensitivity of scattered fields to parameters of interest, yet this also leaves measurements vulnerable to unintended perturbations. Here we employ transmission matrix formalism to engineer light fields…
Improvements in X-ray optics critically depend on the measurement of their optical performance. The knowledge of wavefront aberrations, for example, can be used to improve the fabrication of optical elements or to design phase correctors to…
Ptychography is a promising phase retrieval technique for visible light, X-ray and electron beams. Conventional ptychography reconstructs the amplitude and phase of an object light from a set of the diffraction intensity patterns obtained…
{We report on an intensity-only and deep-learning based method for laser beam characterization that allows to predict the underlying optical field within milliseconds. A simple near-field / far-field camera setup enables online control of…
A phase-only spatial light modulator (SLM) provides a powerful way to shape laser beams into arbitrary intensity patterns, but at the cost of a hard computational problem of determining an appropriate SLM phase. Here we show that optimal…
This paper describes various approaches to modeling a random process with a given rational power spectral density. The main attention is paid to the spectral form of mathematical description, which allows one to obtain a relation for the…
Phase-sensitive coherent imaging exploits changes in the phases of backscattered light to observe tiny alterations of scattering structures or variations of the refractive index. But moving scatterers or a fluctuating refractive index…
Optical micro-manipulation and trapping of micro-particles delivers a mechanical system in direct interaction with a beam of light. In this interaction, the optical properties such as polarisation, beam profile and wavelength of the…
We propose X-NeRF, a novel method to learn a Cross-Spectral scene representation given images captured from cameras with different light spectrum sensitivity, based on the Neural Radiance Fields formulation. X-NeRF optimizes camera poses…
We describe an optical technique based on the statistical analysis of the random intensity distribution due to the interference of the near-field scattered light with the strong transmitted beam. It is shown that, from the study of the…
In optical metrology, grating-like structures are used as tools to evaluate the performance of lithographic techniques. In particular, several shape parameters characterize those structures. One of them, termed side-wall angle, suffers from…
Although speckle is a powerful tool for high-precision metrology, large datasets and cumbersome training are always required to learn from the encoded speckle patterns, which is unfavorable for rapid deployment and multi-dimensional…
Adaptive optics methods have long been used to perform complex light shaping at the output of a multimode fiber (MMF), with the specific aim of controlling the emitted beam in the near-field. Gaining control of other emission properties,…
Frequency domain spectroscopy allows an experimenter to establish optical properties of solids in a wide frequency band including the technically challenging 10 THz region, and in other bands enables metrological comparison between…
Light beams carrying orbital angular momentum are key resources in modern photonics. In many applications, the ability of measuring the complex spectrum of structured light beams in terms of these fundamental modes is crucial. Here we…
Piecewise constant image approximations of sequential number of segments or clusters of disconnected pixels are treated. The method of majorizing of optimal approximation sequence by hierarchical sequence of image approximations is…
Achieving high spatial resolution is the goal of many imaging systems. Designing a high-resolution lens with diffraction-limited performance over a large field of view remains a difficult task in imaging system design. On the other hand,…
In high energy resolution X-ray spectroscopy beamlines of synchrotron radiation facilities, it is important to keep X-ray spectrometer operating in optimal conditions. The adjusting process is normally very time consuming due to the…
The polarization of an X-ray beam that produces electrons with velocity components perpendicular to the beam generates an azimuthal distribution of the ejected electrons. We present methods for simulating and for analyzing the angular…
General formalism for describing dynamics of modulated beams along linear beamlines is developed. We describe modulated beams with spectral distribution function which represents Fourier transform of the conventional beam distribution…