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A possibility of a few MeV electron beam diagnostics (Lorentz factor ~ 10) using polarization characteristics of the optical transition radiation (OTR) have been considered. Determinaton of the electron beam divergence have been performed…

In a lot of systems, charge transport is governed by local features rather than being a global property as suggested by extracting a single resistance value. Consequently, techniques that resolve local structure in the electronic potential…

Circular dichroism spectroscopy is an essential technique for understanding molecular structure and magnetic materials, but spatial resolution is limited by the wavelength of light, and sensitivity sufficient for single-molecule…

Electron backscatter diffraction (EBSD) in the scanning electron microscope is routinely used for microstructural characterisation of polycrystalline materials. Maps of EBSD data are typically acquired at high stage tilt and slow scan…

Materials Science · Physics 2020-09-01 Vivian Tong , Thomas Benjamin Britton

*To be published in Springer Handbook of Surface Science (Springer Verlag) [Preprint]* The capability to display images containing chemical, magnetic and structural information and to perform spectroscopy and diffraction from a {\mu}m-sized…

Mesoscale and Nanoscale Physics · Physics 2018-12-06 Alessandro Sala

Germanium is a strong candidate as a laser source for silicon photonics. It is widely accepted that the band structure of germanium can be altered by tensile strain so as to reduce the energy difference between its direct and indirect band…

Lorentz transmission electron microscopy (LTEM) is a powerful tool for high-resolution imaging of magnetic textures, including their dynamics under external stimuli and ultrafast nonequilibrium conditions. However, magnetic imaging is often…

Materials Science · Physics 2025-05-12 Shunsuke Hayashi , Dongxue Han , Hidenori Tsuji , Kyoko Ishizaka , Asuka Nakamura

Secondary electron (SE) imaging offers a powerful complementary capabilities to conventional scanning transmission electron microscopy (STEM) by providing surface-sensitive, pseudo-3D topographic information. However, contrast…

Applied Physics · Physics 2025-11-19 Evgenii Vlasov , Wouter Heyvaert , Tom Stoops , Sandra Van Aert , Johan Verbeeck , Sara Bals

A simple comparison between the exact and approximate correlation components U of the electron-electron repulsion energy of several states of few-electron harmonium atoms with varying confinement strengths provides a superior validation…

Chemical Physics · Physics 2017-11-16 Jerzy Cioslowski , Mario Piris , Eduard Matito

Scanning tunneling microscopy is the method of choice for characterizing charge density waves by imaging the variation in atomic-scale contrast of the surface. Due to the measurement principle of scanning tunneling microscopy, the…

The dual continuum model serves as a powerful tool in the modeling of subsurface applications. It allows a systematic coupling of various components of the solutions. The system is of multiscale nature as it involves high heterogeneous and…

Numerical Analysis · Mathematics 2018-07-31 Siu Wun Cheung , Eric T. Chung , Yalchin Efendiev , Wing Tat Leung , Maria Vasilyeva

X-ray absorption spectroscopy measured at the $L$-edge of transition metals (TMs) is a powerful element-selective tool providing direct information about the correlation effects in the $3d$ states. The theoretical modeling of the…

A consistent theory of electron energy-loss spectroscopy (EELS) includes two indispensable elements: (i) electronic response of the target system and (ii) quantum kinematics of probing electrons. While for the bulk materials and their…

Mesoscale and Nanoscale Physics · Physics 2017-12-12 Vladimir U. Nazarov , Vyacheslav M. Silkin , Eugene E. Krasovskii

Electron energy-loss spectroscopy (EELS) offers a window to view nanoscale properties and processes. When performed in a scanning transmission electron microscope, EELS can simultaneously render images of nanoscale objects with…

Mesoscale and Nanoscale Physics · Physics 2016-09-26 Charles Cherqui , Niket Thakkar , Guoliang Li , Jon P. Camden , David Masiello

Electron emission can be utilised to measure the work function of the surface. However, the number of significant digits in the values obtained through thermionic-, field- and photo-emission techniques is typically just two or three. Here,…

Materials Science · Physics 2020-09-22 Y. Ishida , J. K. Jung , M. S. Kim , J. Kwon , Y. S. Kim , D. Chung , I. Song , C. Kim , T. Otsu , Y. Kobayashi

We explore the possibility of using a double-tip STM to probe the single electron Green function of a sample surface, and describe a few important applications: (1) Probing constant energy surfaces in $\k$-space by ballistic transport; (2)…

Condensed Matter · Physics 2008-02-03 Q. Niu , M. C. Chang , C. K. Shih

In situ electron microscopy is a key tool for understanding the mechanisms driving novel phenomena in 2D structures. Unfortunately, due to various practical challenges, technologically relevant 2D heterostructures prove challenging to…

Digital image correlation of laser-ablated platinum nanoparticles on the surface of a polycrystalline metal (nickel-based superalloy Rene 88DT) was used to obtain the local strain behavior from an in situ scanning electron microscope…

Materials Science · Physics 2013-09-02 M. A. Tschopp , B. B. Bartha , W. J. Porter , P. T. Murray , S. B. Fairchild

Four-dimensional scanning transmission electron microscopy (4D-STEM) of local atomic diffraction patterns is emerging as a powerful technique for probing intricate details of atomic structure and atomic electric fields. However, efficient…

Image and Video Processing · Electrical Eng. & Systems 2019-01-15 Xin Li , Ondrej E. Dyck , Mark P. Oxley , Andrew R. Lupini , Leland McInnes , John Healy , Stephen Jesse , Sergei V. Kalinin

We explore the possibility for the reconstruction of the generative physical models describing interactions between atomic units in solids from observational electron microscopy data. Here, scanning transmission electron microscopy (STEM)…

Materials Science · Physics 2021-02-02 M. Chakraborty , M. Ziatdinov , O. Dyck , S. Jesse , A. D. White , S. V. Kalinin